PATTERN FORMING METHOD AND ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION FOR USE IN THE METHOD
    4.
    发明申请
    PATTERN FORMING METHOD AND ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION FOR USE IN THE METHOD 有权
    图案形成方法和用于方法的丙酰敏感或辐射敏感性树脂组合物

    公开(公告)号:US20150111135A1

    公开(公告)日:2015-04-23

    申请号:US14580686

    申请日:2014-12-23

    Abstract: The pattern forming method of the present invention includes: (i) forming a film including an actinic ray-sensitive or radiation-sensitive resin composition containing a compound (A) represented by General Formula (I) shown below; a resin (P) capable of decreasing solubility with respect to a developer including organic solvent by the action of an acid; and a compound (B) capable of generating an acid by irradiation of actinic rays or radiation; (ii) irradiating the film with actinic rays or radiation; (iii) developing the film irradiated with the actinic rays or radiation using a developer including an organic solvent. [Chem. 1] RN-A−X+  (I)

    Abstract translation: 本发明的图案形成方法包括:(i)形成含有由下述通式(I)表示的化合物(A)的光化射线敏感性或辐射敏感性树脂组合物的膜; 能够通过酸的作用降低对包含有机溶剂的显影剂的溶解度的树脂(P); 和能够通过光化射线或辐射的照射产生酸的化合物(B); (ii)用光化射线或辐射照射薄膜; (iii)使用包含有机溶剂的显影剂显影用光化射线或辐射照射的薄膜。 [Chem。 1] RN-A-X +(I)

    METHOD OF FORMING PATTERN AND ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION FOR USE IN THE METHOD
    6.
    发明申请
    METHOD OF FORMING PATTERN AND ACTINIC-RAY- OR RADIATION-SENSITIVE RESIN COMPOSITION FOR USE IN THE METHOD 审中-公开
    形成图案的方法和用于方法的丙烯酸或辐射敏感性树脂组合物

    公开(公告)号:US20150111157A1

    公开(公告)日:2015-04-23

    申请号:US14581416

    申请日:2014-12-23

    Abstract: Provided is a method of forming a pattern, including forming a film comprising an actinic-ray- or radiation-sensitive resin composition comprising, resin (A) comprising any of repeating units of general formula (I) below, which resin when acted on by an acid, decreases its solubility in a developer comprising an organic solvent, and a compound (B) expressed by any of general formulae (B-1) to (B-3) below, which compound when exposed to actinic rays or radiation, generates an acid, exposing the film to actinic rays or radiation, and developing the exposed film with a developer comprising an organic solvent to thereby obtain a negative pattern.

    Abstract translation: 提供了形成图案的方法,包括形成包含光化射线或辐射敏感性树脂组合物的膜,所述树脂组合物包含下列通式(I)的任何重复单元的树脂(A) 降低其在包含有机溶剂的显影剂中的溶解度,以及当暴露于光化射线或辐射时该化合物暴露于光化射线或辐射时由下述通式(B-1)至(B-3)表示的化合物(B) 酸,将膜暴露于光化射线或辐射,以及用包含有机溶剂的显影剂显影曝光的膜,从而获得负图案。

Patent Agency Ranking