Abstract:
A system and method of operating a twin-transistor, multi-time programmable memory (MTPM) memory cell that ensures accurate reproducibility of bit values read after each of write cycle. Each multi-time programmable memory cell includes a series connection of a first transistor and a second transistor. The method includes writing, using a write circuit at select memory cell locations, initial bit values to one or more select memory cells. Then, using the write circuit, a rebalancing of a state of a parameter associated with one or more the first transistor or second transistor, at each the select memory cell, is performed. Then, an erasing cycle is performed, at each the rebalanced select memory cell, the written initial bit value. In one embodiment, the erasing cycle may first be performed prior to rebalancing. The rebalancing and erasing are to be performed prior to each bit value write cycle.
Abstract:
A bitline circuit for embedded Multi-Time-Read-Only-Memory including a plurality of NMOS memory cells coupled to a plurality of wordlines in each row, bitlines in each column, and a source-line. More specifically, the bitline circuit controls a charge trap behavior of the target NMOS memory array by mode-dependent bitline pull-down circuit, thereby discharging the bitline strongly to GND to trap the charge effectively in a Programming mode, and discharge the bitline weakly to GND to develop a bitline voltage to detect the charge trap state. The mode dependent circuit is realized by using at least two NMOS to switch the device strength, using a pulsed gate control in a Read mode, or using analog voltage to limit the bitline current. The proposed method further includes a protection device, allowing all bitline control circuit using thin oxide devices. The bitline circuits having mode and bank access dependent bitline circuit further enables a single device memory array, by using two arrays, wherein said one of the array is used for reference to the other array using an open bitline architecture.
Abstract:
Wordline decoder circuits for an embedded Multi-Time-Read-Only-Memory that includes a plurality of NMOS memory cells coupled to a plurality of wordlines in each row. The wordline decoder circuits control the charge trap behavior of the target NMOS memory array by the mode-dependent wordline high voltage (VWLH) and wordline low voltage (VWLL) trapping the charge in a programming mode by applying an elevated wordline voltage (EWLH) to one of the plurality of WLs, while de-trapping the charge in a reset mode by applying a negative wordline voltage (NWLL) to the entire array. The mode dependent voltage control is realized by switching to couple EWLH to VWLH in a programming mode, otherwise VDD to VWLH, while coupling NWLL to VWLL in a reset mode, otherwise, GND to VWLL. The switch includes plural gated diodes from VWLH with the wordline high protection voltage of VWLH_PR generated by lowering VWLH determined by gated diodes times threshold voltage. The switch includes a series of gated diodes from VWLL with a wordline low protection voltage of VWLL_PR generated by raising VWLL determined by the gated diodes by the threshold voltage, resulting in controlling the WL swing using thin-oxide devices.
Abstract:
Described are a hardware encryption engine, and secret key registration and authentication system recoverable binary bit using knowing an initial secret key stored in the master system. The secret key is overwritten in each authentication, updating it to the master and encryption engine independently. The secret key over write command can be preferably given to the chip as a CHG, and the non recoverable binary bit from the sense amplifier is used for response.