摘要:
A liquid crystal display device of low power consumption is disclosed, which is suitable for use with a portable data processing apparatus, in particular. The liquid crystal display device, comprises: a switch element array substrate (301) having a plurality of data lines (1) and a plurality of scanning lines (2) both arranged being intersected to each other in a matrix form so as to form matrix intersection points; a plurality of pixel electrodes (3) each arranged for each matrix intersection point; and a plurality of first switching elements (6, 7) each arranged for each matrix intersection point and each turned on or off by the scanning line, for applying write voltage supplied from the data line to the pixel electrode, respectively when turned on; a counter substrate (314) having a plurality of counter electrodes (12) each arranged being opposed to each pixel electrode with a gap between the two; a liquid crystal layer (13) sandwiched between the switching element array substrate and the counter substrate; a plurality of memory elements (100) each interposed between the corresponding first switching element and the corresponding pixel electrode, for holding the write voltage supplied through the data line as data, when the first switching element is turned on; a plurality of display control lines (8, 10) each arranged in correspondence to each scanning line; and a plurality of second switching elements (9, 11) each arranged for each matrix intersection point, for controlling connection between the pixel electrode and the display control line on the basis of output of the memory element.
摘要:
SRAM comprises a word line driving circuit selecting a predetermined number of word lines in accordance with an input address at the time of a normal operation, and simultaneously selecting all word lines or word lines, which are more than the number of word lines to be selected at the time of the normal operation, at the time of a voltage stress applying test, and a bit line load circuit applying a predetermined bias voltage to said pair of bit lines at the time of the normal operation, and controlling the bias voltage not to be applied to at least one of said pair of bit lines or applying the bias voltage, which is lower than the bias voltage at the time of the normal operation, at the time of the voltage stress test.
摘要:
A plurality of static memory cells 10 each comprising a thin film transistor acting as a load are connected to a power source wiring 12 positioned within a memory cell array. The power source wiring 12 positioned within the memory cell array is connected via a resistor circuit 14 to a power source wiring 13 of a low resistivity, which is positioned outside the memory cell array.
摘要:
First and second N-channel MOS transistors, each serving as a transfer gate, have their current paths connected, at their first ends, to bit lines, respectively, and their gates connected to a word line. Third and fourth N-channel MOS transistors, forming a flip-flop circuit, have their current paths connected, at their first ends, to the second ends of the current paths of the first and second transistors, respectively, and at their second ends, to a first power supply. The first ends of the current paths of the third and fourth transistors are connected to first ends of first and second thin-film transistors, respectively. The second ends of the current paths of the first and second thin-film transistors are connected to a second power supply. Each of the first and second thin-film transistors has first and second gates on both sides of its channel region. The first and second gates of the first thin-film transistor are connected to the gate of the fourth transistor, while the first and second gates of the second thin-film transistor are connected to the gate of the third transistor. Thus, the first and second thin-film transistors are supplied with a potential to render them nonconductive.
摘要:
The gate of a selection transistor is connected to a word line and the source thereof is connected to a bit line. The drain of the selection transistor is connected to a storage node constituting a capacitor of thin film transistor structure. The capacitor has a plate electrode insulated from the storage node, that portion of the plate electrode which is disposed in opposition to the storage node is formed to have an impurity concentration lower than the remaining portion thereof and an inverted layer is formed in the corresponding portion according to data stored in the storage node. The plate electrode is connected to pulse generation means, a pulse signal is output from the pulse generation means in the data readout operation and the potential of the plate electrode is raised by the pulse signal.
摘要:
The gate of a transistor Q1 serving as a selection transistor is connected to a word line and the source thereof is connected to a bit line BL. The gate of a transistor Q2 serving as a cell capacitor is connected to the drain of the transistor Q1 and the drain thereof is connected to a pulse generation circuit. Whether an inverted layer is formed in the channel region of the transistor Q2 or not is determined according to the stored data. An inverted layer is formed in the channel region of the transistor Q2 having data "1" stored as storage data. The source of the transistor Q2 is connected to the gate of a transistor Q3. The drain of the transistor Q3 is connected to a pulse generation circuit 11 and the source thereof is connected to the drain of the transistor Q1. The transistor Q2 having an inverted layer formed therein is turned on when a preset voltage is supplied from the pulse generation circuit 11 in the stored data reading operation, and in this case, the transistor Q3 is turned on. Therefore, a current can be supplied to the bit line BL from the pulse generation circuit 11 via the transistor Q3 and the selected transistor Q1.
摘要:
A static random access memory has a plurality of memory cells. Each memory cell is made up of two high-resistance resistors functioning as load elements, and a flip-flop circuit. The flip-flop circuit is made up of two inverters including MOS transistors which are formed in a substrate and used as drive elements. The sources of the two MOS transistors are coupled to each other and electrically isolated from the substrate. Another MOS transistor is connected between the common source of the flip-flop MOS transistors and the source of a power-supply voltage. A MOS transistor is coupled between the common source of the MOS transistors and the source of a ground voltage. A plurality of bit lines supplies data to, and receives data from, the memory cells. A resistance element is connected between each bit line and the source of the power-supply voltage, and an output terminal outputs the voltage at one end of this resistance element. Two different voltages are applied to the sources of the two MOS transistors. One voltage is applied during normal operation of the memory and the other voltage is applied during leakage current detection testing.
摘要:
The gate electrode of a first CMOS inverter is connected to the drains of each transistor of a second CMOS inverter via an interconnection, and the gate electrode of the second CMOS inverter is connected to the drains of the first CMOS inverter via an interconnection, to form a flip-flop circuit. A pair of transfer transistors are connected to the nodes of this flip-flop circuit. A plurality of memory cells each constructed by the flip-flop circuit and the pair of transfer transistors are integrated in a matrix form to form a semiconductor memory device. The pair of gate electrodes are formed of a first polycrystalline silicon layer which includes an impurity of the first conductivity type. The pair of interconnections are formed of an impurity-doped second polycrystalline silicon layer and a high-melting point metal layer, and formed on a first interlayer insulation film. The high-melting point metal layer is provided to prevent an increase in the resistance value due to the formation of a pn junction formed by the interconnections.
摘要:
A voltage sensing circuit of differential input type includes at least one differential amplifier circuit connected between two complementary data lines of a semiconductor memory. The differential amplifier circuit detects data in response to a minute potential difference between the data lines and amplifies the same by a substantial change in conductance g.sub.m of metal oxide semiconductor field effect transistors (MOSFET) used in the circuit. When data is read from a semiconductor memory onto the data lines, the differential amplifier sensing circuit detects the data quickly by detecting potential changes of the data lines.
摘要:
In a static memory, a memory cell is constituted by only the same-channel MOSFETs. With the MOSFETs of the same channel, no well isolation region is required, and a cell size can be decreased. Moreover, the high potential side power source of a flip-flop can be used as a read word line. Thus the read word line can be driven by an ECL logic circuit.