摘要:
An image recording apparatus has an array light source having a plurality of light-emitting elements arrayed in a predetermined density; a photosensitive member exposed to light beams emitted from the plural light-emitting elements so that images are recorded by fixing a traveling path of the light beams from the plural light-emitting elements to the photosensitive member and by moving the photosensitive member relative to the array light source; a beam-converging unit which intercrosses a bundle of the light beams emitted from the light-emitting elements onto a beam-conversion point; and an focusing unit disposed between the beam-converging unit and the photosensitive member, which images the light beams emitted from the plural of light-emitting elements and intercrossed by the beam-converging unit onto the photosensitive member.
摘要:
An apparatus for correcting positional deviation of the light source emitting light beams in an image recording apparatus is disclosed which corrects change of the image size (dimensions of the image) on the photosensitive member due to positional deviations of beam spots on the photosensitive member on account of physical distortions caused by external vibration, temperature change, and the like. Changes in the diameter of detective light beams are measured by photodetecting portions 5.sub.R and 5.sub.L and piezoelectric devices 6a and 6b are driven based on the results of the detection, whereby the semiconductor laser array 1 is moved so that the multiplication b/a for the image size may be kept constant.
摘要翻译:公开了一种用于校正图像记录装置中的光源发射光束的位置偏差的装置,其用于校正由于光敏部件上光束部件上的光束点的位置偏差导致的感光部件上的图像尺寸(尺寸)的变化 由外部振动,温度变化等引起的物理失真。 通过光检测部5R和5L测量检测光束的直径变化,并且基于检测结果来驱动压电器件6a和6b,由此使半导体激光器阵列1移动,使得图像的乘法b / a 尺寸可能保持不变。
摘要:
A semiconductor laser array driving method for driving a semiconductor laser array having a plurality of light-emitting points arranged on a base member. The semiconductor laser array driving method has a step of driving the plurality of light-emitting points by a driving pulse current of a pulse width and a duty factor meeting an inequality: .DELTA.T.sub.1 /.DELTA.T.sub.0
摘要:
Described is an optical equipment using a semiconductor light emitting device array which has light emitting points formed thereon at a high density and has highly reliability. The optical equipment according to the present invention features that it is equipped with a light emitting device array on which light emitting points LP have been arranged two-dimensionally, focusing means for focusing the light from the light emitting points, photo-detecting means which is disposed at the position where the light focused through the focusing means forms image formation points, and transferring means for transferring the image formation points relative to the photo-detecting means; said light-emitting device array being composed of a plurality of semiconductor chips and adjacent end surfaces of two semiconductor chips being bonded each other so as to have an inclination against the transferring direction.
摘要:
A semiconductor laser device in which semiconductor layers of an n-type cladding layer, a quantum well active layer 106, a p-type cladding layer, and an intermediate layer are formed on an n-type GaAs substrate in successive order, and a mixed-crystal is formed in a region except the semiconductor layers of the contact layer and the lower part of the contact layer by diffusing Si into the structure from above the intermediate layer, characterized in that the contact layer and the intermediate layer are made of n-type or nonconductive semiconductor material, and a p-type low-resistance region, formed by diffusing Zn into the structure from above the contact layer, is profiled so as not to overlap with the mixed-crystal region formed by Si diffusion.
摘要:
A semiconductor laser device in which semiconductor layers of an n-type cladding layer, a quantum well active layer 106, a p-type cladding layer, and an intermediate layer are formed on an n-type GaAs substrate in successive order, and a mixed-crystal is formed in a region except the semiconductor layers of the contact layer and the lower part of the contact layer by diffusing Si into the structure from above the intermediate layer, characterized in that the contact layer and the intermediate layer are made of n-type or nonconductive semiconductor material, and a p-type low-resistance region, formed by diffusing Zn into the structure from above the contact layer, is profiled so as not to overlap with the mixed-crystal region formed by Si diffusion.
摘要:
In a semiconductor laser device according to the invention, a clad layer includes first clad layers, each of which has a greater band gap than an active layer and has a thickness of 0.003 to 0.3 .mu.m, and second clad layers each of which has a lower refractive index than the active layer, and the first clad layers are disposed nearer to the active layer than the second clad layers, respectively. In this structure, the first clad layers confine carriers in the active layer while the second clad layers confine the light in the active layer. Since each of the first clad layers is formed of a thin film, the carriers are hard to move outwardly from the active layer due to the tunnel phenomenon thereof and, even if the lattice constant thereof is slightly different, the first clad layer can be lattice matched to a substrate. For this reason, the materials of the second clad layers can be selected without taking into consideration the size of the band gap thereof. This makes it possible to reduce the oscillation threshold value current density of the laser as well as to improve the temperature characteristic of the laser.
摘要:
A semiconductor laser device having an active layer which is comprised of a quantum well layer formed of a mixed crystal material, and barrier layers provided on both sides of the quantum well layer in such a manner as to sandwich the same, is characterized in that Ge is thermally diffused in a portion of the active layer to disorder the quantum well layer and the barrier layers at that portion so as to form a non-light-emitting area with a low refractive index, while the quantum well layer and the barrier layers at a portion where Ge is not diffused is formed as a refractive index waveguide which is a light-emitting area.
摘要:
Laser elements are arranged in two dimensions in an elongated region which is longer in the horizontal direction than in the vertical direction, wherein n laser elements are arranged in the horizontal direction, while m laser elements in the vertical direction, where n>m. The anode wiring extends to a direction which is inclined to the horizontal direction and the cathode wiring extends to another direction inclined to the horizontal direction, thereby the anode wiring and the cathode wiring crossing with each other. The anodes of m laser elements in maximum arranged in the direction of the anode wiring are connected to an anode wire, while the cathodes of m laser elements in maximum arranged in the cathode wiring are connected to a cathode wire. Accordingly, even if the array is longer in the horizontal direction and a large number of laser elements are aligned in the horizontal direction, the wiring resistance and electrostatic capacitance of each wire forming the oblique matrix wiring can be small and the operation delay of the laser element can also be small.
摘要:
A position measuring system includes: an image capturing unit that captures reference points provided on an object, the reference points composed of at least four first reference points provided respectively at vertices of a polygon or at vertices and a barycenter of a polygon and at least one second reference point provided so as to have a specific positional relationship with respect to the first reference points; an identification unit that identifies images of the first reference points and the second reference point captured by the image capturing unit, on the basis of positional relationships between the images of the first reference points and the second reference point; and a calculation unit that calculates a three-dimensional position and three-axial angles of the object on the basis of positional relationships of the images of the first reference points identified by the identification unit.