摘要:
A wafer having chips for determining the position of the wafer, at least one of the chips comprising a plurality of first-direction line groups formed on one side portion of the chip and a plurality of second-direction line groups formed on the other region of the chip, the first-direction line groups and the second-direction line groups being orthogonal to each other, each of the first-direction line groups comprising one first-direction main mark and one first-direction code mark expressing the position of the one first-direction main mark, each of the second-direction line groups comprising one second-direction main mark and one second-direction code mark, whereby, by scanning only one of the first-direction line groups and only one of the second-direction line groups by means of an electron beam, the position of the wafer is determined.
摘要:
In an electron beam exposure system controlled by a computer, the system includes: an electron optical device for generating electron beams and irradiating the beams to a sample on a stage through a plurality of electron lens, a main deflection coil, and sub deflection electrodes, to form predetermined circuit patterns on the sample. The system also includes a position control device controlling the driving of the stage based on a stage position coordinate designated by the computer, detecting an actual stage position coordinate, and calculating an error value between the designated stage position coordinate and the actual stage position coordinate, the error value being divided into two components of an upper bits portion having an relatively large error value and a lower bits portion having a relatively small error value, and a deflection control device controlling the direction of the electron beams based on the main pattern data corrected by the upper bits portion and the sub pattern data corrected by the lower bits portion, and based on selected main and sub wait times determined by exposure and non-exposure timings.
摘要:
Electron beam exposure system provides a basic pattern data memory for storing data corresponding to the dimensions and the positions of patterns of a basic unit pattern which frequently appears as a unit in a pattern to be exposed on a wafer, and a central processing unit provided with an additional memory system which stores data corresponding to the position at which the basic unit pattern is to be exposed. This system determines the position of the basic unit pattern by adding data from the basic pattern data memory and data from the additional memory system through the central processing unit in accordance with a command of the central processing unit. Thereafter, data corresponding to the dimensions of the patterns in the basic unit patterns from the basic pattern data memory are sent as an input to a deflection system. As a result, the system according to the present invention applies electron beam deflection signals, which are produced by using the obtained data corresponding to the positions and the dimensions of the basic unit patterns, to the deflecting means of the electron beam exposure apparatus.
摘要:
A charged particle beam exposure system is directed to an exposure process of an electron beam for sequentially scanning an electron beam employing a blanking aperture array including a plurality of blanking apertures. The system facilitates re-focusing for compensation of focus error due to Coulumb effect and makes wiring the blanking aperture array easier. The system further allows exposure without an irradiation gap. The blanking aperture array 6 is formed with a plurality of said blanking apertures 62 arranged in a two-dimensional configuration. A control system 24 controls the blanking aperture array 62 to set the blanking aperture to the ON state where the charged particle beams pass through the blanking aperture and reach the object 19 to be exposed or the OFF state where the charged particle beams cannot reach the object 19 to be exposed. The other control system of the control means performs a control so that a plurality of said charged particle beams that have passed through different blanking apertures of said blanking aperture array overlaps and is irradiated a plurality of times onto the specified position or the peripheral position in the vicinity of the specified position of the object to be exposed to the charged particle beams.
摘要:
A negative photoresist emulsion, wherein after a film of negative photoresist emulsion on a substrate has been exposed for pattern writing in vacuum to charged particle beams or soft X-ray beams, the film-coated substrate is transferred to, and kept in, a chamber filled with non-oxidizing gas, and then the substrate is removed to the outside atmosphere. By this method, a curing effect of the photoresist film is prevented, enabling formation of fine patterns with precision. An apparatus for carrying out the above method, has a gas chamber filled with non-oxidizing gas connected to an exposure chamber, and the substrate, after such exposure, is kept in an atmosphere of non-oxidizing gas in the gas chamber before being removed to the outside atmosphere. In either the above-method or apparatus, the concentration of oxygen in the non-oxidizing gas must be less than 5%, preferably less than 1%.
摘要:
A negative photoresist emulsion, wherein after a film of negative photoresist emulsion on a substrate has been exposed for pattern writing in vacuum to charged particle beams or soft X-ray beams, the film-coated substrate is transferred to, and kept in, a chamber filled with non-oxidizing gas, and then the substrate is removed to the outside atmosphere. By this method, a curing effect of the photoresist film is prevented, enabling formation of fine patterns with precision. An apparatus for carrying out the above method has a gas chamber filled with non-oxidizing gas connected to an exposure chamber, and the substrate, after such exposure, is kept in an atmosphere of non-oxidizing gas in the gas chamber before being removed to the outside atmosphere. In either the above-method or apparatus, the concentration of oxygen in the non-oxidizing gas must be less than 5%, preferably less than 1%.
摘要:
A variable displacement compressor comprises a housing forming a crank chamber, a shaft, expansible chambers including pistons, a swash plate connected to the shaft so as to be smoothly changeable in inclination against the shaft and driven to rotate, a wobble plate rotatable on the swash plate, a rotation preventing mechanism including a shoe member slidable in an axial direction, and a pressure control valve which is provided in a refrigerant passage from a suction port of the compressor to the expansible chamber to control the pressure of refrigerant to be sucked responsive to the suction pressure and both to the suction pressure and to the discharge pressure when the discharge pressure is high. The refrigerant passage has a sharply bent portion for separating lubrication oil from a refrigerant flowing therein and communicates with the crank chamber to discharge blow-by gas therefrom.
摘要:
A vane type compressor includes a plurality of working chambers defined by the cooperation of a rotor, a plurality of vanes and a cam ring. A valve assembly is disposed in a low pressure passage communicated with the working chambers and operative to bring a portion of the low pressure passage communicated with at least one of the working chambers to a full-closed or full-open position, to thereby effect control of the volume of gas discharged from the compressor.
摘要:
A vane pump comprising a cylindrical pump chamber, vanes adapted to rotate within the pump chamber, and a drive rotor arranged eccentrically with respect to the center of rotation of the vanes, such vane pump being formed with through holes in portions of opposite end walls of the drive rotor which are in spaced juxtaposed relationship with side end faces of each vane, such through holes being connected to a line for supplying therethrough a portion of the fluid discharged by the vane pump. During operation of the vane pump, the portion of the fluid discharged by the pump and supplied through the line is ejected through the through openings against the side end faces of the vanes so as to avoid collision between the end walls of the drive rotor and the side end faces of the vanes whereby the service life of the vane pump can be increased.
摘要:
A printing system is provided which ensures easy formation of a plate and regeneration of the plate for continued use. The press plate used in a the printing system to form an image using a water-based ink is characterized in that, (I) prior to formation of a latent image, the surface forming the latent image exhibits extra ink-repellency to the ink to be used; (2) the press plate allows a water soluble material forming the latent image to be deposited thereon; (3) the latent image can be formed by allowing the water soluble material to be deposited on the press plate surface; and (4) the press plate can be regenerated as a plate which allows a new latent image to be formed by washing the press plate with water and drying it, upon completion of ensuing processes of development and transfer.