摘要:
The present invention provides a power unit of an underwater vehicle, which allows reduction in size and weight of a transformer for stepping down a power voltage of a power supply to increase a loading amount of a variety of devices with respect to the underwater vehicle, so as to obtain a favorable operating environment. The power unit is connected to the power supply through a cable and receives power through the cable. Further, the power unit comprises an electronic transformer having: a rectifier for rectifying a high-voltage alternate current power of the power supply into a direct current; a high-frequency converter for converting an output of the rectifier into a high-frequency alternate current; a transformer for stepping down an output voltage of the high-frequency converter; a rectifier for rectifying an output of the transformer into a direct current; and a control circuit for controlling the high-frequency converter.
摘要:
The present invention provides a power unit of an underwater vehicle, which allows reduction in size and weight of a transformer for stepping down a power voltage of a power supply to increase a loading amount of a variety of devices with respect to the underwater vehicle, so as to obtain a favorable operating environment. The power unit is connected to the power supply through a cable and receives power through the cable. Further, the power unit comprises an electronic transformer having: a rectifier for rectifying a high-voltage alternate current power of the power supply into a direct current; a high-frequency converter for converting an output of the rectifier into a high-frequency alternate current; a transformer for stepping down an output voltage of the high-frequency converter; a rectifier for rectifying an output of the transformer into a direct current; and a control circuit for controlling the high-frequency converter.
摘要:
A connection device and test system is capable of stable, low load damage-free probing of devices under test, which have many pins with a narrow pitch. Furthermore in order to achieve high speed exchange of electrical signals or so-called high frequency electrical signals, a support member is provided for supporting the connection device, a plurality of pointed contact terminals are arrayed in an area on the probing side, a multilayer film is provided having a plurality of lead out wires electrically connected to the contact terminals and a ground layer enclosing an insulation layer, and a frame is clamped on the rear side of the multilayer film. A clamping member is provided on the frame to make the multilayer film project out to eliminate slack in the multilayer film, a contact pressure means is provided for making the tips of the contact terminals contact each of the electrodes with predetermined contact pressure from the support member to the clamping member, and a compliance mechanism is provided so that the contact terminal group of the tip surface is arrayed in parallel with the electrode group terminal surface, so that the tips of the contact terminals contact the surface of the electrodes with an equal pressure.
摘要:
A semiconductor device capable of facilitating high density mounting at low cost without causing any defective conduction at the time of connection to a substrate, a mounting structure thereof and a method of fabrication thereof, characterized in that pyramidal bump electrodes are bonded onto pad electrodes arranged on a semiconductor chip to form the semiconductor device.
摘要:
To achieve high speed exchange of electrical signals between a connection device and a tester, a support member is provided for supporting the connection device, a plurality of pointed contact terminals are arrayed in an area on the probing side, a multiplayer film is provided having a plurality of lead out wires electrically connected to the contact terminals and a ground layer enclosing an insulation layer, and a frame is clamped on the rear side of the multiplayer film. A clamping member is provided on the frame to make the multiplayer film project out to eliminate slack in the multiplayer film. A contact pressure means is provided for making the tips of the contact terminals contact each of the electrodes with predetermined contact pressure from the support member to the clamping member. A compliance mechanism is provided so that the contact terminal group of the tip surface is arrayed in parallel with the electrode group terminal surface, so that the tips of the contact terminals contact the surface of the electrodes with an equal pressure.
摘要:
Disclosed is a topical therapeutic agent for ophthalmic diseases, which comprises a compound capable of binding specifically to a DNA sequence. More preferably disclosed is a topical therapeutic agent for ophthalmic diseases, which comprise a pyrrole-imidazole polyamide having a specific structure. The topical therapeutic agent for ophthalmic diseases comprises a pyrrole-imidazole polyamide which can inhibit transforming growth factor-β gene and matrix metalloproteinase 9 gene.
摘要:
To achieve high speed exchange of electrical signals between a connection device and a tester, a support member is provided for supporting the connection device, a plurality of pointed contact terminals are arrayed in an area on the probing side, a multilayer film is provided having a plurality of lead out wires electrically connected to the contact terminals and a ground layer enclosing an insulation layer, and a frame is clamped on the rear side of the multilayer film. A clamping member is provided on the frame to make the multilayer film project out to eliminate slack in the multilayer film. A contact pressure means is provided for making the tips of the contact terminals contact each of the electrodes with predetermined contact pressure from the support member to the clamping member. A compliance mechanism is provided so that the contact terminal group of the tip surface is arrayed in parallel with the electrode group terminal surface, so that the tips of the contact terminals contact the surface of the electrodes with an equal pressure.
摘要:
Dispersion of load may be kept within an allowance even when a plurality of probes in a large area are pressed in batch by pressing the probes provided in a membrane to a wafer by applying a pressure load to a plurality of places of a plane of pressure members on the side opposite from the wafer in a probe test step/burn-in test step which is one of semiconductor device manufacturing steps. It is then possible to provide semiconductor devices and a manufacturing method thereof which enhance the reliability and productivity of the semiconductor devices by probing a large number of integrated circuits or a large size integrated circuit in the same time.
摘要:
To achieve high speed exchange of electrical signals between a connection device and a tester, a support member is provided for supporting the connection device, a plurality of pointed contact terminals are arrayed in an area on the probing side, a multiplayer film is provided having a plurality of lead out wires electrically connected to the contact terminals and a ground layer enclosing an insulation layer, and a frame is clamped on the rear side of the multiplayer film. A clamping member is provided on the frame to make the multiplayer film project out to eliminate slack in the multiplayer film. A contact pressure means is provided for making the tips of the contact terminals contact each of the electrodes with predetermined contact pressure from the support member to the clamping member. A compliance mechanism is provided so that the contact terminal group of the tip surface is arrayed in parallel with the electrode group terminal surface, so that the tips of the contact terminals contact the surface of the electrodes with an equal pressure.
摘要:
Dispersion of load may be kept within an allowance even when a plurality of probes in a large area are pressed in batch by pressing the probes provided in a membrane to a wafer by applying a pressure load to a plurality of places of a plane of pressure members on the side opposite from the wafer in a probe test step/burn-in test step which is one of semiconductor device manufacturing steps. It is then possible to provide semiconductor devices and a manufacturing method thereof which enhance the reliability and productivity of the semiconductor devices by probing a large number of integrated circuits or a large size integrated circuit in the same time.