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公开(公告)号：US07328596B2
公开(公告)日：2008-02-12
申请号：US11188944
申请日：2005-07-25
CPC分类号： B60R25/02153 , Y10T70/5531 , Y10T70/5664 , Y10T70/5956
摘要： A steering lock that is easy to assemble but difficult for an automobile thief to dismantle. The steering lock includes a cover on which a support structure for supporting a lock mechanism is integrally formed. The lock mechanism is attached to the cover to assemble a first subunit. A steering lock ECU is attached to an ECU case to assemble a second subunit. The first subunit is attached to the second subunit to assemble a lock unit. The lock unit is attached to the housing. A bolt fastens the lock unit and the housing to each other. A second connector is then attached to the housing.
摘要翻译： 一种易于组装但难以将汽车小偷拆卸的转向锁。 转向锁包括盖，其上一体地形成有用于支撑锁定机构的支撑结构。 锁定机构附接到盖子以组装第一子单元。 转向锁定ECU附接到ECU壳体以组装第二子单元。 第一子单元附接到第二子单元以组装锁单元。 锁定单元连接到外壳。 螺栓将锁定单元和壳体彼此紧固。 然后将第二连接器附接到壳体。
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公开(公告)号：US20060021398A1
公开(公告)日：2006-02-02
申请号：US11188944
申请日：2005-07-25
IPC分类号： B60R25/02
CPC分类号： B60R25/02153 , Y10T70/5531 , Y10T70/5664 , Y10T70/5956
摘要： A steering lock that is easy to assemble but difficult for an automobile thief to dismantle. The steering lock includes a cover on which a support structure for supporting a lock mechanism is integrally formed. The lock mechanism is attached to the cover to assemble a first subunit. A steering lock ECU is attached to an ECU case to assemble a second subunit. The first subunit is attached to the second subunit to assemble a lock unit. The lock unit is attached to the housing. A bolt fastens the lock unit and the housing to each other. A second connector is then attached to the housing.
摘要翻译： 一种易于组装但难以将汽车小偷拆卸的转向锁。 转向锁包括盖，其上一体地形成有用于支撑锁定机构的支撑结构。 锁定机构附接到盖子以组装第一子单元。 转向锁定ECU附接到ECU壳体以组装第二子单元。 第一子单元附接到第二子单元以组装锁单元。 锁定单元连接到外壳。 螺栓将锁定单元和壳体彼此紧固。 然后将第二连接器附接到壳体。
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公开(公告)号：US20050223761A1
公开(公告)日：2005-10-13
申请号：US11096879
申请日：2005-04-01
IPC分类号： B60R25/021 , B60R25/0215 , B62D1/18 , B62D1/19 , B60R25/02
CPC分类号： B60R25/0211 , Y10T70/5664
摘要： A steering lock device including a sleeve assembly, a rear shaft rotated when a steering wheel is operated, and a lock bar for locking the steering shaft when engaged with a seat member fixed to the rear shaft. A sleeve assembly including an outer sleeve and an inner sleeve is shortened when the outer sleeve moves along the inner sleeve. The distal portion of the lock bar includes a slope that is abut against an open end of the inner sleeve. When the open end pushes the slope, the lock bar smoothly moves away from the steering shaft.
摘要翻译： 一种转向锁定装置，包括套筒组件，当操作方向盘时旋转的后轴;以及锁定杆，用于当与固定到后轴的座椅构件接合时锁定转向轴。 当外套筒沿着内套筒移动时，包括外套筒和内套筒的套筒组件被缩短。 锁杆的远侧部分包括抵靠内套筒的开口端的斜面。 当开口端推动斜坡时，锁杆平稳地离开转向轴。
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公开(公告)号：US07234328B2
公开(公告)日：2007-06-26
申请号：US11096879
申请日：2005-04-01
IPC分类号： B60R25/02
CPC分类号： B60R25/0211 , Y10T70/5664
摘要： A steering lock device including a sleeve assembly, a rear shaft rotated when a steering wheel is operated, and a lock bar for locking the steering shaft when engaged with a seat member fixed to the rear shaft. A sleeve assembly including an outer sleeve and an inner sleeve is shortened when the outer sleeve moves along the inner sleeve. The distal portion of the lock bar includes a slope that is abut against an open end of the inner sleeve. When the open end pushes the slope, the lock bar smoothly moves away from the steering shaft.
摘要翻译： 一种转向锁定装置，包括套筒组件，当操作方向盘时旋转的后轴;以及锁定杆，用于当与固定到后轴的座椅构件接合时锁定转向轴。 当外套筒沿着内套筒移动时，包括外套筒和内套筒的套筒组件被缩短。 锁杆的远侧部分包括抵靠内套筒的开口端的斜面。 当开口端推动斜坡时，锁杆平稳地离开转向轴。
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5.发明授权Apparatus for inspection with electron beam, method for operating same, and method for manufacturing semiconductor device using former 有权用于电子束检查的装置，其操作方法以及使用前者制造半导体器件的方法公开(公告)号：US08822919B2
公开(公告)日：2014-09-02
申请号：US12985827
申请日：2011-01-06
申请人： Toshifumi Kimba , Tohru Satake , Tsutomu Karimata , Kenji Watanabe , Nobuharu Noji , Takeshi Murakami , Masahiro Hatakeyama , Mamoru Nakasuji , Hirosi Sobukawa , Shoji Yoshikawa , Shin Oowada , Mutsumi Saito
发明人： Toshifumi Kimba , Tohru Satake , Tsutomu Karimata , Kenji Watanabe , Nobuharu Noji , Takeshi Murakami , Masahiro Hatakeyama , Mamoru Nakasuji , Hirosi Sobukawa , Shoji Yoshikawa , Shin Oowada , Mutsumi Saito
IPC分类号： G01N23/00
CPC分类号： H01J37/222 , G01N23/225 , G01N23/2251 , H01J37/06 , H01J37/073 , H01J37/185 , H01J37/20 , H01J37/244 , H01J37/28 , H01J2237/0216 , H01J2237/082 , H01J2237/2002 , H01J2237/2007 , H01J2237/202 , H01J2237/20228 , H01J2237/204 , H01J2237/22 , H01J2237/24564 , H01J2237/2806 , H01J2237/2813 , H01J2237/2816 , H01J2237/2817 , H01L2224/48227 , H01L2924/01019 , H01L2924/01025 , H01L2924/01057 , H01L2924/01067 , H01L2924/01078 , H01L2924/10253 , H01L2924/12032 , H01L2924/3025 , H01L2924/00
摘要： A substrate inspection apparatus 1-1 (FIG. 1) of the present invention performs the following steps of: carrying a substrate “S” to be inspected into an inspection chamber 23-1; maintaining a vacuum in said inspection chamber; isolating said inspection chamber from a vibration; moving successively said substrate by means of a stage 26-1 with at least one degree of freedom; irradiating an electron beam having a specified width; helping said electron beam reach to a surface of said substrate via a primary electron optical system 10-1; trapping secondary electrons emitted from said substrate via a secondary electron optical system 20-1 and guiding it to a detecting system 35-1; forming a secondary electron image in an image processing system based on a detection signal of a secondary electron beam obtained by said detecting system; detecting a defective location in said substrate based on the secondary electron image formed by said image processing system; indicating and/or storing said defective location in said substrate by CPU 37-1; and taking said completely inspected substrate out of the inspection chamber. Thereby, the defect inspection on the substrate can be performed successively with high level of accuracy and efficiency as well as with higher throughput.
摘要翻译： 本发明的基板检查装置1-1（图1）执行以下步骤：将要检查的基板“S”运送到检查室23-1中; 在所述检查室中保持真空; 将所述检查室与振动隔离; 通过具有至少一个自由度的平台26-1连续移动所述衬底; 照射具有指定宽度的电子束; 帮助所述电子束经由一次电子光学系统10-1到达所述衬底的表面; 通过二次电子光学系统20-1捕获从所述衬底发射的二次电子并将其引导到检测系统35-1; 基于由所述检测系统获得的二次电子束的检测信号，在图像处理系统中形成二次电子图像; 基于由所述图像处理系统形成的二次电子图像检测所述基板中的缺陷位置; 通过CPU37-1指示和/或存储所述衬底中的所述缺陷位置; 并将完全检查的基板从检查室中取出。 因此，可以以高水平的精度和效率以及更高的生产量连续地执行基板上的缺陷检查。
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公开(公告)号：US20130225618A1
公开(公告)日：2013-08-29
申请号：US13824782
申请日：2011-10-03
IPC分类号： A61K31/505
CPC分类号： A61K31/505 , C07D239/47
摘要： The present invention is intended to provide a pharmaceutical product for inhibiting expression of at least one lipid metabolism related mRNA selected from the group consisting of Angptl4 mRNA, SCD-1 mRNA, and SREBP1c mRNA, the present invention is also intended to provide a preventive and/or therapeutic agent for various diseases based on inhibition of expression of at least one lipid metabolism related mRNA selected from the group consisting of Angptl4 mRNA, SCD-1 mRNA, and SREBP1c mRNA, and the present invention relates to an agent for inhibiting expression of at least one lipid metabolism related mRNA selected from the group consisting of Angptl4 mRNA, SCD-1 mRNA, and SREBP1c mRNA, and relates also to a preventive and/or therapeutic agent for various diseases based on the inhibition of the expression of at least one lipid metabolism related mRNA selected from the group consisting of Angptl4 mRNA, SCD-1 mRNA, and SREBP1c mRNA, the agent comprising a compound represented by Formula (I), its salt, or a solvate of any of them as an active ingredient: wherein the symbols are the same as those given in the description.
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公开(公告)号：US08390121B2
公开(公告)日：2013-03-05
申请号：US13025633
申请日：2011-02-11
申请人： Mika Okumura , Yasuo Yamaguchi , Takeshi Murakami
发明人： Mika Okumura , Yasuo Yamaguchi , Takeshi Murakami
IPC分类号： H01L23/482
CPC分类号： B81B7/0051 , B81B2201/0235 , B81C2203/0154 , G01P1/023 , G01P15/0802 , G01P15/125 , H01L21/56 , H01L23/3107 , H01L23/562 , H01L24/05 , H01L24/06 , H01L2924/01019
摘要： A semiconductor device includes a substrate, an element formed on the substrate, a nitride film formed on the substrate, a anti-peel film formed on the nitride film, and a molded resin covering the anti-peel film and the element. The anti-peel film has residual compressive stress.
摘要翻译： 半导体器件包括基板，形成在基板上的元件，在基板上形成的氮化物膜，形成在氮化物膜上的抗剥离膜，以及覆盖抗剥离膜和元件的模制树脂。 抗剥离膜具有残余压应力。
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8.发明授权公开(公告)号：US08218646B2
公开(公告)日：2012-07-10
申请号：US12192275
申请日：2008-08-15
申请人： Takeshi Murakami , Ryuichi Kanda
发明人： Takeshi Murakami , Ryuichi Kanda
IPC分类号： H04N11/02
CPC分类号： H04N19/124 , H04N19/149 , H04N19/15 , H04N19/159 , H04N19/172 , H04N19/194 , H04N19/61
摘要： A moving image encoding apparatus includes a first-step encoding section for executing a plurality of times first-step encoding by use of different quantization control variables; a code-amount estimation section for estimating, for all the quantization control variables, an amount of codes generated for each frame by making use of a plurality of results of the encoding; a code-amount allocation section for allocating an amount of codes for each frame on the basis of results of the estimation; and a second-step encoding section for executing second-step encoding on the basis of the amount of codes allocated to each frame. The first-step encoding section changes the number of times of execution of the encoding in accordance with the attribute of each frame, and omits a portion of processes contained in the coding process in the second and subsequent executions of the encoding process.
摘要翻译： 运动图像编码装置包括：第一步编码部分，用于通过使用不同的量化控制变量执行多次第一步编码; 码量估计部分，用于通过利用所述编码的多个结果，针对所有的量化控制变量来估计针对每一帧产生的代码量; 码量分配部分，用于根据估计结果分配每帧的码量; 以及第二步编码部分，用于基于分配给每个帧的代码量来执行第二步编码。 第一步编码单元根据每帧的属性改变编码的执行次数，并且在编码处理的第二次和随后的执行中省略包含在编码处理中的处理的一部分。
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公开(公告)号：US20110234090A1
公开(公告)日：2011-09-29
申请号：US13153687
申请日：2011-06-06
CPC分类号： H01L51/0087 , C07D401/14 , C07D403/14 , C07F15/0086 , C09K11/06 , C09K2211/1022 , C09K2211/1029 , C09K2211/1044 , C09K2211/1059 , C09K2211/185 , C09K2211/186 , C09K2211/188 , H01L51/0054 , H01L51/0058 , H01L51/006 , H01L51/0071 , H01L51/0078 , H01L51/0081 , H01L51/0085 , H01L51/5016 , H05B33/14 , Y10S428/917
摘要： An organic electroluminescent device is provided and has at least one organic layer between a pair of electrodes. The organic compound contains a compound represented by the following formula (I): Z1 and Z2 each represents a nitrogen-containing aromatic 6-membered ring coordinating to platinum atom at the nitrogen atom, Q represents a nitrogen-containing aromatic 5-membered ring having one or two nitrogen atoms, L1 and L2 each represents a single bond or a divalent group, and n represents 0 or 1.
摘要翻译： 提供有机电致发光器件，并且在一对电极之间具有至少一个有机层。 有机化合物含有下式（I）表示的化合物：Z1和Z2各自表示与氮原子上的铂原子配位的含氮芳香族6元环，Q表示含氮芳香族五元环， 一个或两个氮原子，L1和L2各自表示单键或二价基团，n表示0或1。
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公开(公告)号：US07952071B2
公开(公告)日：2011-05-31
申请号：US12162071
申请日：2007-01-24
申请人： Nobuharu Noji , Yoshihiko Naito , Hirosi Sobukawa , Masahiro Hatakeyama , Kenji Terao , Takeshi Murakami , Katsuya Okumura , Tatsuhiko Higashiki
发明人： Nobuharu Noji , Yoshihiko Naito , Hirosi Sobukawa , Masahiro Hatakeyama , Kenji Terao , Takeshi Murakami , Katsuya Okumura , Tatsuhiko Higashiki
IPC分类号： G01N23/00
CPC分类号： H01J37/29 , H01J37/045 , H01J2237/2446
摘要： Provided is a defect inspection apparatus and an inspection (or evaluation) method with highly improved accuracy, which would not be provided by the prior art, in the defect inspection apparatus used in a manufacturing process of a semiconductor device.Provided is a method for inspecting a sample surface with a projection type electron beam inspection apparatus, comprising the steps of: forming such an irradiation area on the sample surface by an electron beam generated from an electron gun 21 that has approximately a circular or elliptical shape of a size larger than a pattern on the sample surface; irradiating the electron beam substantially onto a center of the pattern on the sample surface; and forming an image on an electron detection plane of a detector from secondary electrons emanating from the sample surface in response to the irradiation of the electron beam for inspecting the sample surface.
摘要翻译： 提供了在半导体器件的制造工艺中使用的缺陷检查装置中，现有技术不能提供高精度的缺陷检查装置和检查（或评价）方法。 提供一种用投影型电子束检查装置检查样品表面的方法，包括以下步骤：通过由具有大致圆形或椭圆形的电子枪21产生的电子束在样品表面上形成这样的照射区域 尺寸大于样品表面上的图案; 将电子束基本上照射到样品表面上的图案的中心; 以及响应于用于检查样品表面的电子束的照射，从从样品表面发射的二次电子在检测器的电子检测平面上形成图像。
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