摘要:
A biaxial hinge having a rotating mechanism that realizes durability, a good tactile feedback, smaller size and more lightweight is provided for use in a notebook computer or a portable telephone that needs to be smaller and more lightweight. The biaxial hinge is constituted such that a rotating shaft member 9 is fixed to a rotation support member 10, a rotation-side member 7 is inserted and attached to the outer periphery of the rotating shaft member 9, and an opening/closing torque unit mechanism 12 for opening and closing operations is disposed at the rotation-side member 7, wherein sliding friction torque and click torque are generated by the load produced by a coil spring 6 between pressing members 4 and the rotating shaft support member 10 or a sliding member 3 attached to the rotating shaft member 9. The rotating mechanism of the biaxial hinge of the present invention affords good durability, a good tactile feedback, and a reduction in size and weight. And, this rotating mechanism is applied to a portable telephone.
摘要:
A biaxial hinge having a rotating mechanism that realizes durability, a good tactile feedback, smaller size and more lightweight is provided for use in a notebook computer or a portable telephone that needs to be smaller and more lightweight. The biaxial hinge is constituted such that a rotating shaft support member is fixed to a rotational shaft support member, a rotation-side member is inserted and attached to the outer periphery of the rotating shaft member, and an opening/closing torque unit mechanism for opening and closing operations is disposed at the rotation-side member, wherein sliding friction torque and click torque are generated by the load produced by a coil spring between pressing members and the rotating shaft support member or a sliding member attached to the rotating shaft member. The rotating mechanism of the biaxial hinge of the present invention affords good durability, a good tactile feedback, and a reduction in size and weight. And, this rotating mechanism is applied to a portable telephone.
摘要:
A hinge mechanism that generates a stress at the start and end points of arbitrary opening and closing range can be constructed by causing one cam set of two cam sets in which a rotating cam and a fixed cam engage only once in 360° rotation to generate a stress at the start point of the rotating range or opening and closing range of the hinge mechanism, and causing the other cam set to generate a stress at the end point of the rotating or opening and closing range. The hinge mechanism of the present invention achieves durability, good feeling, and size and weight reduction.
摘要:
To provide a hinge which achieve durability, good feeling, size and weight reduction, for portable phones or laptop computers which require to be smaller and lighter. A hinge mechanism that generates a stress at the start and end points of arbitrary opening and closing range can be constructed by causing one cam set of two cam sets in which a rotating cam 4 and a fixed cam 5 engage only one time in 360° to generate a stress at the start point of the rotating range or opening and closing range of the hinge mechanism, and causing the other cam set to generate a stress at the end point of the rotating or opening and closing range. The hinge mechanism of the present invention achieves durability, good feeling, and size and weight reduction.
摘要:
An opening/closing device includes a fixed plate, a moving plate movable relative to the fixed plate, a slide plate formed having a groove, a hinge including a first shaft connected to the fixed plate, a third shaft connected to the moving plate, and a second shaft between the first and third shafts, and moves the moving plate between closed and open positions relative to the fixed plate, a slide arm including a fourth shaft connected to the moving plate and a fifth shaft connected slidably along the groove, and moves the moving plate between the closed and open positions, a link arm having one end connected to the second shaft and the other to the fifth shaft. The fifth shaft slides inside the groove as the link arm moves along with the moving of the hinge when the moving plate is moved between the closed and open positions.
摘要:
An object of the invention is to realize a method and an apparatus for processing and observing a minute sample which can observe a section of a wafer in horizontal to vertical directions with high resolution, high accuracy and high throughput without splitting any wafer which is a sample. In an apparatus of the invention, there are included a focused ion beam optical system and an electron optical system in one vacuum container, and a minute sample containing a desired area of the sample is separated by forming processing with a charged particle beam, and there are included a manipulator for extracting the separated minute sample, and a manipulator controller for driving the manipulator independently of a wafer sample stage.
摘要:
A sliding device for an electronic apparatus includes a contact piece projecting outward in a widthwise direction from a sliding plate and a contacted part with which the contact piece is caused to come into contact when the sliding plate is caused to slide with a maximum displacement in a rear direction relative to a base plate. The contact piece includes a partially cylindrical surface and a connecting surface. The contacted part includes a contacted shape part configured to be contacted by a boundary part of the partially cylindrical surface and the connecting surface to provide the sliding plate with a rotational force to cause a front direction end portion of the sliding plate to move in the bottom direction relative to a rear direction end portion of the sliding plate, and an engaged shape part with which the partially cylindrical surface and the connecting surface are caused to engage.
摘要:
An object of the present invention is to obtain a clear absorbed current image without involving the difference in gain of amplifier between inputs, from absorbed currents detected by using a plurality of probes and to improve measurement efficiency.In the present invention, a plurality of probes are brought in contact with a specimen. While irradiating the specimen with an electron beam, currents flowing in the probes are measured. Signals from at least two probes are input to a differential amplifier. An output of the differential amplifier is amplified. On the basis of the amplified output and scanning information of the electron beam, an absorbed current image is generated. According to the invention, a clear absorbed current image can be obtained without involving the difference in gain of amplifier between inputs. Thus, measurement efficiency in a failure analysis of a semiconductor device can be improved.
摘要:
An X-ray analyzing method for inspecting opening states of fine holes comprises the steps of: irradiating a finely converged electron beam into a first fine hole, observing an X-ray emitted from the inside of said first fine hole in order to obtain an first X-ray analysis data about the residue substance existing at the bottom of said first fine hole; irradiating a finely converged electron beam into a second fine hole, observing an X-ray emitted from the inside of said second fine hole in order to obtain an second X-ray analysis data about the residue substance existing at the bottom of said second fine hole; and comparing said first X-ray analysis data with said second X-ray analysis data, forming a judgment as to whether or not a difference between said first and second analysis data is smaller than a predetermined threshold value and using an outcome of said judgment to determine the opening states of said first and second fine holes. The X-ray observations are carried out by detecting only the X-rays emitted within the angular range -.theta. to +.theta. where notation .theta. is an angle formed with a center axis of the irradiated electron beam and so defined that tan .theta. is equal to a/d whereas notations a and d are the radius and the depth of the fine holes.
摘要翻译:用于检查细孔的打开状态的X射线分析方法包括以下步骤:将精细会聚的电子束照射到第一细孔中,观察从所述第一细孔的内部发射的X射线,以获得第一细孔 关于存在于所述第一细孔底部的残留物质的X射线分析数据; 将精细会聚的电子束照射到第二细孔中,观察从所述第二细孔的内部发射的X射线,以获得关于存在于所述第二细孔底部的残留物质的第二X射线分析数据 ; 以及将所述第一X射线分析数据与所述第二X射线分析数据进行比较,形成关于所述第一和第二分析数据之间的差是否小于预定阈值的判断,并且使用所述判断结果 确定所述第一和第二细孔的打开状态。 通过仅检测在角度范围θ至+θ内发射的X射线来进行X射线观察,其中符号θ是与照射的电子束的中心轴形成的角度,并且如此定义,tanθ等于 a / d,而符号a和d是细孔的半径和深度。
摘要:
A scanning transmission electron microscope including an electron detection system having a scattering angle limiting aperture (for the inner angle) and a scattering angle limiting aperture (for the outer angle) between a specimen and an electron detector (comprising a scintillator and a light guide) and only one electron detector is installed.