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公开(公告)号：US3557444A
公开(公告)日：1971-01-26
申请号：US3557444D
申请日：1968-10-11
Applicant: IBM
Inventor： RUOFF CARL E
CPC classification number: H01L27/0658 , H01L27/00 , Y10S148/037 , Y10S148/049 , Y10S148/085 , Y10S148/151
Abstract: AN INTEGRATED BIPOLAR TRANSISTOR CIRCUIT OF THE RESISTORTRANSISTOR LOGIC TYPE IS FORMED ON A SINGLE SEMICONDUCTOR CHIP, AND INTERCONNECTIONS FROM TRANSISTOR OUTPUT ELECTRODES AND I/O (INPUT/OUTPUT) CHIP TERMINALS TO TRANSISTOR INPUT ELECTRODES ARE PROVIDED BY MEANS OF HIGH AND LOW RESISTIVITY REGIONS WITHIN THE CHIP AND BY A SELECTED METALLIZATION PATTERN FORMED IN A SINGLE PLANE ABOVE AND ISOLATED FROM THE CHIP.
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公开(公告)号：US3431490A
公开(公告)日：1969-03-04
申请号：US3431490D
申请日：1966-01-14
Applicant: IBM
Inventor： KWAP THEODORE W , RUOFF CARL E
CPC classification number: G01R27/28
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公开(公告)号：US3177468A
公开(公告)日：1965-04-06
申请号：US7734160
申请日：1960-12-21
Applicant: IBM
Inventor： RUOFF CARL E
IPC: G06F11/08
CPC classification number: G06F11/085
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公开(公告)号：US3551761A
公开(公告)日：1970-12-29
申请号：US3551761D
申请日：1968-08-13
Applicant: IBM
Inventor： RUOFF CARL E , WINTER EDWARD F
IPC: H01L27/00 , H01L27/146 , H01L15/00 , H01L19/00
CPC classification number: H01L27/14643 , H01L27/00 , Y10S148/037 , Y10S148/049 , Y10S148/085 , Y10S148/151
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5.发明授权Inflatable probe apparatus for uniformly contacting and testing microcircuits 失效用于均匀接触和测试微型计算机的可充电探头设备
公开(公告)号：US3493858A
公开(公告)日：1970-02-03
申请号：US3493858D
申请日：1966-01-14
Applicant: IBM
Inventor： BARON DAVID G , RUOFF CARL E
CPC classification number: H05K1/029 , G01R1/0735 , H05K1/147 , H05K3/365 , H05K2201/10212 , H05K2203/074 , Y10T29/49124
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Patent Agency Ranking6.发明授权Signal storage circuit utilizing charge storage characteristics of field-effect transistor 失效信号存储电路利用现场效应晶体管的电荷存储特性
公开(公告)号：US3461312A
公开(公告)日：1969-08-12
申请号：US3461312D
申请日：1964-10-13
Applicant: IBM
Inventor： FARBER ARNOLD S , RUOFF CARL E
CPC classification number: G11C19/28 , G11C19/184 , H03K3/35606
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7.发明授权
公开(公告)号：US3577036A
公开(公告)日：1971-05-04
申请号：US3577036D
申请日：1969-05-05
Applicant: IBM
Inventor： CURTIS JOHN J , RUOFF CARL E
IPC: H01L21/74 , H01L21/768 , H01L23/535 , H01L27/00 , H01L29/41 , H01L19/00
CPC classification number: H01L23/535 , H01L21/743 , H01L21/768 , H01L27/00 , H01L2924/0002 , H01L2924/3011 , H01L2924/00
Abstract: Minimum connection area and maximum reliability over long periods of use are achieved with the improved technique for interconnecting two-level metalization patterns overlying monolithic integrated circuit chips. A pair of metal conductors from each of two levels are joined to each other and are further separately joined to contiguous portions of an isolated low resistivity region in the chip. It has been found that each connection between metalization patterns of two different levels can be effected in an area as small as approximately two-tenths mil by five-tenths mil.
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9.发明授权Transistor switch with noise rejection provided by variable capacitance feedback diode 失效具有由可变电容反馈二极管提供的噪声抑制的晶体管开关
公开(公告)号：US3218472A
公开(公告)日：1965-11-16
申请号：US19637762
申请日：1962-05-21
Applicant: IBM
Inventor： RUOFF CARL E
IPC: H03K19/084
CPC classification number: H03K19/084
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公开(公告)号：US3174102A
公开(公告)日：1965-03-16
申请号：US19897962
申请日：1962-05-31
Applicant: IBM
Inventor： BERZINSKI JR LEO C , BYMERS RONALD J , RUOFF CARL E
IPC: H04M3/50
CPC classification number: H04M3/50
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