Abstract:
A cathode layer and a membrane electrode assembly of a solid oxide fuel cell are provided. The cathode layer consists of a plurality of perovskite crystal films, and the average change rate of linear thermal expansion coefficients of these perovskite crystal films is about 5% to 40% along the thickness direction. The membrane electrode assembly includes the above-mentioned cathode layer, and the linear thermal expansion coefficients of these perovskite crystal films are reduced towards the solid electrolyte layer of the membrane electrode assembly.
Abstract:
A lithium ion battery and an electrode structure thereof are provided. The electrode structure at least includes a current collecting substrate, an electrode active material layer on the current collecting substrate, and a complex thermo-sensitive coating layer sandwiched in between the current collecting substrate and the electrode active material layer. The complex thermo-sensitive coating layer at least contains two or more of PTC (positive temperature coefficient) materials so as to have adjustable stepped resistivity according to temperature rise.
Abstract:
A cathode layer and a membrane electrode assembly of a solid oxide fuel cell are provided. The cathode layer consists of a plurality of perovskite crystal films, and the average change rate of linear thermal expansion coefficients of these perovskite crystal films is about 5% to 40% along the thickness direction. The membrane electrode assembly includes the above-mentioned cathode layer, and the linear thermal expansion coefficients of these perovskite crystal films are reduced towards the solid electrolyte layer of the membrane electrode assembly.
Abstract:
A P-type metal oxide semiconductor material is provided. The P-type metal oxide semiconductor material has a formula of In(1−3)Ga(1−b)Zn(1+a+b)O4, wherein 0≦a≦0.1, 0≦b≦0.1, and 0
Abstract translation:提供了P型金属氧化物半导体材料。 P型金属氧化物半导体材料具有In(1-3)Ga(1-b)Zn(1 + a + b)O4的式,其中0&nlE; a&nlE; 0.1,0&amp; nlE; b&nlE; 0.1和0 < a + b&nlE; 0.16。 特别是,P型金属氧化物半导体材料的空穴载流子浓度为1×10 11 cm -3〜5×10 18 cm -3。
Abstract:
A method of forming low-k material is provided. The method includes providing a plurality of core-shell particles. The core of the core-shell particles has a first ceramic with a low melting point. The shell of the core-shell particles has a second ceramic with a low melting point and a low dielectric constant. The core-shell particles are sintered and molded to form a low-k material. The shell of the core-shell particles is connected to form a network structure of a microcrystal phase.
Abstract:
The disclosure provides a p-type metal oxide semiconductor material. The p-type metal oxide semiconductor material has the following formula: In1−xGa1−yMx+yZnO4+m, wherein M is Ca, Mg, or Cu, 0