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公开(公告)号:US09998125B2
公开(公告)日:2018-06-12
申请号:US15025226
申请日:2013-11-19
申请人: Intel Corporation
CPC分类号: H03L7/00 , G11C7/1066 , G11C7/1093 , G11C7/22 , G11C7/222 , H03K5/1565 , H03L7/08 , H04B1/04 , H04L25/03
摘要: Described is an apparatus which comprises: an asynchronous clock generator to generate an asynchronous clock signal; a digital sampler for sampling a signal using the asynchronous clock signal; a duty cycle corrector (DCC) to receive a differential input clock and to generate a differential output clock, wherein the digital sampler to sample at least one of an output clock from the differential output clock; and a counter to count output of the digital sampler and to provide a control to the DCC to adjust duty cycle of the differential output clock.
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公开(公告)号:US20160277219A1
公开(公告)日:2016-09-22
申请号:US14660799
申请日:2015-03-17
申请人: Intel Corporation
CPC分类号: H04L25/03057 , H04L7/0062 , H04L7/033 , H04L7/0334 , H04L25/03878
摘要: Described is an apparatus which comprises: an amplifier; a first set of samplers to sample data output from the amplifier according to a clock signal, the set of samplers to generate an output; and a converter to convert the output of the first set of samplers to 1 -hot encoded data.
摘要翻译: 描述了一种装置,包括:放大器; 第一组采样器,用于根据时钟信号对从放大器输出的数据进行采样,该采样器组用于产生输出; 以及将第一组采样器的输出转换为1 -hot编码数据的转换器。
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公开(公告)号:US09761585B2
公开(公告)日:2017-09-12
申请号:US15425393
申请日:2017-02-06
申请人: INTEL CORPORATION
发明人: Sami Hyvonen , Jad B. Rizk , Frank O'Mahony
IPC分类号: H01L27/088 , H01L27/12 , H01L29/423 , H01L29/78 , H01L29/93 , H03L7/099
CPC分类号: H01L27/0886 , H01L27/088 , H01L27/1211 , H01L29/42376 , H01L29/66181 , H01L29/785 , H01L29/93 , H01L29/94 , H03L7/099
摘要: Macro-transistor structures are disclosed. In some cases, the macro-transistor structures have the same number of terminals and properties similar to long-channel transistors, but are suitable for analog circuits in deep-submicron technologies at deep-submicron process nodes. The macro-transistor structures can be implemented, for instance, with a plurality of transistors constructed and arranged in series, and with their gates tied together, generally referred to herein as a transistor stack. One or more of the serial transistors within the stack can be implemented with a plurality of parallel transistors and/or can have a threshold voltage that is different from the threshold voltages of other transistors in the stack. Alternatively, or in addition, one or more of the serial transistors within the macro-transistor can be statically or dynamically controlled to tune the performance characteristics of the macro-transistor. The macro-transistors can be used in numerous circuits, such as varactors, VCOs, PLLs, and tunable circuits.
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公开(公告)号:US09537682B2
公开(公告)日:2017-01-03
申请号:US14660799
申请日:2015-03-17
申请人: Intel Corporation
CPC分类号: H04L25/03057 , H04L7/0062 , H04L7/033 , H04L7/0334 , H04L25/03878
摘要: Described is an apparatus which comprises: an amplifier; a first set of samplers to sample data output from the amplifier according to a clock signal, the set of samplers to generate an output; and a converter to convert the output of the first set of samplers to 1 -hot encoded data.
摘要翻译: 描述了一种装置,包括:放大器; 第一组采样器,用于根据时钟信号对从放大器输出的数据进行采样,该采样器组用于产生输出; 以及将第一组采样器的输出转换为1 -hot编码数据的转换器。
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公开(公告)号:US20230208437A1
公开(公告)日:2023-06-29
申请号:US17561246
申请日:2021-12-23
申请人: Intel Corporation
发明人: Sami Hyvonen , Fabrice Paillet , James Keith Hodgson , Anand Ramasundar , Cary Renzema , George Matthew , Sergio Carlo Rodriguez , Po-Cheng Chen , Sandeep Chilka , Bharadwaj Soundararajan
摘要: A digitally selectable power gate with thermometer-encoded upper bits may provide solutions for problems digital power gate-based regulators. These solutions may include the use of a fully binary power gate, either in structure or by local decoding of binary control signal to an addressable row-based power gate. This provides improved performance over a row-based code rotation, which is intended to avoid instantaneous overheating of power gate devices but may not mitigate aging effects. Another solution includes ganging a primary DLVR and one or more secondaries. The primary DLVR may include a voltage sense and active controller, which may forward its PG code to secondary instances. Therm and current sensor rotation may be performed locally at the secondaries and a current monitor data may be rolled up from all ganged DLVRs.
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