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公开(公告)号:US20240202415A1
公开(公告)日:2024-06-20
申请号:US18068601
申请日:2022-12-20
Applicant: Intel Corporation
Inventor: Quan Shi , Patrick Morrow , Charles Henry Wallace , Lars Liebmann , Thi Nguyen , Sivakumar Venkataraman , Nikolay Ryzhenko Vladimirovich , Xinning Wang , Douglas Stout
IPC: G06F30/392 , G06F30/394
CPC classification number: G06F30/392 , G06F30/394 , G06F2119/18
Abstract: Transistor cell architectures have three MO routing tracks within a single cell height. The cell architectures include at least one p-type transistor formed over a p-type diffusion region and at least one n-type transistor formed over an n-type diffusion region. Each diffusion region extends primarily in a particular direction, and the MO routing tracks extending in the same direction as the diffusion regions. One MO routing track may be formed over each of the diffusion regions, and a third MO routing track formed between the diffusion regions.
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公开(公告)号:US20250006591A1
公开(公告)日:2025-01-02
申请号:US18217022
申请日:2023-06-30
Applicant: Intel Corporation
Inventor: Nischal Arkali Radhakrishna , Chinhsuan Chen , Sivakumar Venkataraman , Somashekar Bangalore Prakash , Marni Nabors
IPC: H01L23/48 , H01L23/522 , H01L23/528 , H10B41/10 , H10B41/27 , H10B41/35 , H10B43/10 , H10B43/27 , H10B43/35
Abstract: An integrated circuit (IC) device may include standard cells with multiple parallel paths interconnecting transistors at a device level and over a transistor, in a higher layer of an interconnect structure. The parallel paths may include multiple power supply via contacts on a transistor source structure and multiple supply interconnect lines over the transistor and coupling the transistor to an associated power supply. The parallel paths may include multiple output via contacts on an integrated transistor drain structure and multiple output interconnect lines over a complementary transistor device. The parallel paths may include separate, rather than shared or integrated, adjacent source structures coupled to a same power supply.
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公开(公告)号:US20250006721A1
公开(公告)日:2025-01-02
申请号:US18215514
申请日:2023-06-28
Applicant: Intel Corporation
Inventor: Sukru Yemenicioglu , Douglas Stout , Tai-Hsuan Wu , Xinning Wang , Ruth Brain , Chin-Hsuan Chen , Sivakumar Venkataraman , Quan Shi , Nikolay Ryzhenko Vladimirovich
IPC: H01L27/02 , G06F30/392 , H01L29/06 , H01L29/423 , H01L29/775
Abstract: Techniques are described for designing and forming cells comprising transistor devices for an integrated circuit. In an example, an integrated circuit structure includes a plurality of cells arranged in rows where some rows have different cell heights compared to other rows. Additionally, the various rows of cells may contain semiconductor nanoribbons having different widths between different rows. For example, any number of first rows of cells can each have a first height and any number of second rows can each have a second height that is smaller than the first height. The first rows of cells may include transistors with semiconductor nanoribbons having a first width and the second rows of cells may include transistors with semiconductor nanoribbons having a second width smaller than the first width. In some cases, any of the first rows of cells may also include transistors with semiconductor nanoribbons having the second width.
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公开(公告)号:US12051692B2
公开(公告)日:2024-07-30
申请号:US17176412
申请日:2021-02-16
Applicant: Intel Corporation
Inventor: Quan Shi , Sukru Yemenicioglu , Marni Nabors , Nikolay Ryzhenko , Xinning Wang , Sivakumar Venkataraman
IPC: H01L27/088 , H01L23/50 , H01L29/06 , H01L29/78
CPC classification number: H01L27/0886 , H01L23/50 , H01L29/0669 , H01L29/785 , H01L2029/7858
Abstract: Integrated circuit structures having front side signal lines and backside power delivery are described. In an example, an integrated circuit structure includes a plurality of gate lines extending over a plurality of semiconductor nanowire stack or fin channel structures within a cell boundary. A plurality of trench contacts is extending over a plurality of source or drain structures within the cell boundary, individual ones of the plurality of trench contacts alternating with individual ones of the plurality of gate lines. A first signal line, a second signal line, a third signal line, and a fourth signal line are over the plurality of gate lines and the plurality of trench contacts within the cell boundary. A backside power delivery line is coupled to one of the plurality of trench contacts within the cell boundary.
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公开(公告)号:US20240113177A1
公开(公告)日:2024-04-04
申请号:US17957887
申请日:2022-09-30
Applicant: Intel Corporation
Inventor: Sukru Yemenicioglu , Quan Shi , Marni Nabors , Charles H. Wallace , Xinning Wang , Tahir Ghani , Andy Chih-Hung Wei , Mohit K. Haran , Leonard P. Guler , Sivakumar Venkataraman , Reken Patel , Richard Schenker
IPC: H01L29/417 , H01L21/8234 , H01L27/088 , H01L29/06 , H01L29/423 , H01L29/66 , H01L29/775 , H01L29/778 , H01L29/786
CPC classification number: H01L29/41733 , H01L21/823412 , H01L21/823475 , H01L27/088 , H01L29/0673 , H01L29/42392 , H01L29/66439 , H01L29/775 , H01L29/778 , H01L29/78696 , H01L21/823431 , H01L29/66795 , H01L29/7851
Abstract: An integrated circuit includes a first device having a first source or drain region, and a second device having a second source or drain region that is laterally adjacent to the first source or drain region. A conductive source or drain contact includes (i) a lower portion in contact with the first source or drain region, and extending above the first source or drain region, and (ii) an upper portion extending laterally from above the lower portion to above the second source or drain region. A dielectric material is between at least a section of the upper portion of the conductive source or drain contact and the second source or drain region. In an example, each of the first and second devices is a gate-all-around (GAA) device having one or more nanoribbons, nanowires, or nanosheets as channel regions, or is a finFet structure having a fin-based channel region.
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