摘要:
A method of producing a MEMS device removes the bottom side of a device wafer after its movable structure is formed. To that end, the method provides the device wafer, which has an initial bottom side. Next, the method forms the movable structure on the device wafer, and then removes substantially the entire initial bottom side of the device wafer. Removal of the entire initial bottom side effectively forms a final bottom side.
摘要:
A method of producing a MEMS device removes the bottom side of a device wafer after its movable structure is formed. To that end, the method provides the device wafer, which has an initial bottom side. Next, the method forms the movable structure on the device wafer, and then removes substantially the entire initial bottom side of the device wafer. Removal of the entire initial bottom side effectively forms a final bottom side.
摘要:
A flip-bonding technique is used to fabricate complex micro-electromechanical systems. Various micromachined structures are fabricated on the front side of each of two wafers. One of the wafers is flipped over and bonded to the other wafer so that the front sides of the two wafers are bonded together in a flip-stacked configuration.
摘要:
An intermediate electrode layer is used to fabricate an integrated micro-electromechanical system. An intermediate electrode layer is formed on an integrated circuit wafer. The intermediate electrode layer places drive electrodes a predetermined height above the surface of the integrated circuit wafer. A micro-electromechanical system wafer having micromachined optical mirrors is bonded to the integrated circuit wafer such that the drive electrodes are positioned a predetermined distance from the optical mirrors.
摘要:
A MEMS inertial sensor is secured within a premolded-type package formed, at least in part, from a low moisture permeable molding material. Consequently, such a motion detector should be capable of being produced more economically than those using ceramic packages. To those ends, the package has at least one wall (having a low moisture permeability) extending from a leadframe to form a cavity, and an isolator (with a top surface) within the cavity. The MEMS inertial sensor has a movable structure suspended above a substrate having a bottom surface. The substrate bottom surface is secured to the isolator top surface at a contact area. In illustrative embodiments, the contact area is less than the surface area of the bottom surface of the substrate. Accordingly, the isolator forms a space between at least a portion of the bottom substrate surface and the package. This space thus is free of the isolator. Moreover, due to the low moisture permeability of the package, further production steps can be avoided while ensuring that moisture does not adversely affect the MEMS inertial sensor within the cavity.
摘要:
A position sensor includes a receiver capable of receiving a position signal from an external source, and an inertial motion unit capable of sensing movement and producing a movement signal based upon the sensed movement. The position sensor also includes a processor operatively coupled with the receiver and the inertial motion unit. The processor is capable of calculating position information based on at least one of the position signal and the movement signal. Moreover, the receiver, inertial motion unit and processor are formed on a single chip.
摘要:
A probe card characterizes optical structures formed on a MEMS wafer. The probe includes a substrate having a circuit thereon. The substrate has an opening wherein a plurality of metal probes, electrically coupled to the circuit, pass through the opening. The probe card further includes an optical test device electrically coupled to the circuit. The optical test device includes a light source and a photosensitive area. The photosensitive area receives directly light reflected from the optical structures. The optical test device can be positioned directly over the opening, or the optical test device can be positioned on a periphery of the opening. Furthermore, the optical test device can be positioned so as to provide a test light beam that is parallel to the wafer to test pop-up optical MEMS components. The optical test device also may be positioned between the probe card and the MEMS wafer.
摘要:
Individual caps are provided for mutually spaced MEMS on a common wafer by establishing a fixed spatial array of caps in positions that correspond to the positions of the MEMS on the wafer, and simultaneously bonding the caps to corresponding MEMS. The caps are preferably held in place within recesses in a template, and include protective sealing rings that are bonded to the MEMS wafer. The wafer is diced into individual MEMS chips after the caps have been bonded. The caps can be provided with circuitry that faces away from MEMS wafer and is wire bonded to the wafer, or that faces towards the wafer with a flip-chip mounting.
摘要:
A miniature, full-color display includes two rows of light-emitting elements that are both selected to emit light in substantially non-overlapping wavelength ranges comprising a blue-green wavelength range and a red wavelength range. The light-emitting elements as well as a magnifying lens, and an oscillating mirror are placed in a light-tight box having an opening through which the mirror may be viewed. The light from the blue-green elements is filtered by a filter which transmits either blue or green light depending on the mirror movement. The light-emitting devices are selectively illuminated as the mirror moves to create a full-color, substantially planar, two-dimensional image. The light box may be sized to be hand-held, or may be capable of being mounted to a pair of glasses, a headband or similar device.
摘要:
A cover cap for semiconductor wafer devices is disclosed. According to the invention, a wafer of material that is at least one of photo-etchable or transparent is patterned and attached as a cover to a substrate including a number of semiconductor devices. Preferably, the cover wafer is made from a photo-etchable material so that portions of the cover wafer may be selectively sensitized and etched. In particular, one or more cover caps may be defined in the cover wafer such that each cover cap corresponds to a respective device on the device substrate. Once the cover wafer is attached to the device substrate to form an assembly, the assembly is diced into individual devices and the devices are packaged. The invention provides several advantages for a number of semiconductor device fabrication applications, including those relating to image sensors, and micro-machined devices such as MEMS. For example, a cover wafer attached to the device substrate prior to dicing and packaging of individual devices provides more robust devices by protecting the device substrate from any number of environmental hazards, such as particulate contamination, moisture, processing agents such as solvents, and inadvertent scratching of the device substrate surface.