Controlling impedance and thickness variations for multilayer electronic structures
    1.
    发明授权
    Controlling impedance and thickness variations for multilayer electronic structures 有权
    控制多层电子结构的阻抗和厚度变化

    公开(公告)号:US08863046B2

    公开(公告)日:2014-10-14

    申请号:US12101449

    申请日:2008-04-11

    摘要: Impedance control, and the uniformity of electrical and mechanical characteristics in electronic packaging are becoming more important as chip and bus speeds increase and manufacturing processes evolve. Current state of the art design and manufacture processes inherently introduce physical dielectric thickness variations into PCB cross sections. These thickness variations between the ground reference plane(s) and the signal layer(s) inject undesirable characteristic impedance variations and undesirable mechanical variations in thickness and surface topology. Therefore a multilayer electronic structure and a method of manufacture is presented.

    摘要翻译: 阻抗控制以及电子封装中电气和机械特性的均匀性越来越重要,因为芯片和总线速度的增加和制造过程的演变。 当前的现有技术设计和制造工艺本身将物理电介质厚度变化引入PCB横截面。 接地参考平面与信号层之间的这些厚度变化引起了不需要的特性阻抗变化和厚度和表面拓扑结构中不期望的机械变化。 因此,提出了一种多层电子结构和制造方法。

    Controlling Impedance and Thickness Variations for Multilayer Electronic Structures
    2.
    发明申请
    Controlling Impedance and Thickness Variations for Multilayer Electronic Structures 有权
    控制多层电子结构的阻抗和厚度变化

    公开(公告)号:US20090258194A1

    公开(公告)日:2009-10-15

    申请号:US12101449

    申请日:2008-04-11

    IPC分类号: B32B3/00 B29C65/00

    摘要: Impedance control, and the uniformity of electrical and mechanical characteristics in electronic packaging are becoming more important as chip and bus speeds increase and manufacturing processes evolve. Current state of the art design and manufacture processes inherently introduce physical dielectric thickness variations into PCB cross sections. These thickness variations between the ground reference plane(s) and the signal layer(s) inject undesirable characteristic impedance variations and undesirable mechanical variations in thickness and surface topology. Therefore a multilayer electronic structure and a method of manufacture is presented.

    摘要翻译: 阻抗控制以及电子封装中电气和机械特性的均匀性越来越重要,因为芯片和总线速度的增加和制造过程的演变。 当前的现有技术设计和制造工艺本身将物理电介质厚度变化引入PCB横截面。 接地参考平面与信号层之间的这些厚度变化引起了不需要的特性阻抗变化和厚度和表面拓扑结构中不期望的机械变化。 因此,提出了一种多层电子结构和制造方法。

    Controlling Impedance and Thickness Variations for Multilayer Electronic Structures
    3.
    发明申请
    Controlling Impedance and Thickness Variations for Multilayer Electronic Structures 失效
    控制多层电子结构的阻抗和厚度变化

    公开(公告)号:US20090255715A1

    公开(公告)日:2009-10-15

    申请号:US12101441

    申请日:2008-04-11

    IPC分类号: H05K1/02 H05K3/46

    摘要: Impedance control, and the uniformity of electrical and mechanical characteristics in electronic packaging are becoming more important as chip and bus speeds increase and manufacturing processes evolve. Current state of the art design and manufacture processes inherently introduce physical dielectric thickness variations into multilayer cross sections. These thickness variations between the ground reference plane(s) and the signal layer(s) inject undesirable characteristic impedance variations and undesirable mechanical variations in thickness and surface topology. Therefore a multilayer structure and a method of manufacture are presented.

    摘要翻译: 阻抗控制以及电子封装中电气和机械特性的均匀性越来越重要,因为芯片和总线速度的增加和制造过程的演变。 现有技术的设计和制造工艺现在将物理电介质厚度变化引入到多层横截面中。 接地参考平面与信号层之间的这些厚度变化引起了不需要的特性阻抗变化和厚度和表面拓扑结构中不期望的机械变化。 因此,提出了多层结构和制造方法。

    Controlling impedance and thickness variations for multilayer electronic structures
    6.
    发明授权
    Controlling impedance and thickness variations for multilayer electronic structures 失效
    控制多层电子结构的阻抗和厚度变化

    公开(公告)号:US08549444B2

    公开(公告)日:2013-10-01

    申请号:US12101441

    申请日:2008-04-11

    IPC分类号: G06F17/50 H05K1/00 H05K1/03

    摘要: Impedance control, and the uniformity of electrical and mechanical characteristics in electronic packaging are becoming more important as chip and bus speeds increase and manufacturing processes evolve. Current state of the art design and manufacture processes inherently introduce physical dielectric thickness variations into multilayer cross sections. These thickness variations between the ground reference plane(s) and the signal layer(s) inject undesirable characteristic impedance variations and undesirable mechanical variations in thickness and surface topology. Therefore a multilayer structure and a method of manufacture are presented.

    摘要翻译: 阻抗控制以及电子封装中电气和机械特性的均匀性越来越重要,因为芯片和总线速度的增加和制造过程的演变。 现有技术的设计和制造工艺现在将物理电介质厚度变化引入到多层横截面中。 接地参考平面与信号层之间的这些厚度变化引起了不需要的特性阻抗变化和厚度和表面拓扑结构中不期望的机械变化。 因此,提出了多层结构和制造方法。

    Controlling impedance and thickness variations for multilayer electronic structures
    10.
    发明授权
    Controlling impedance and thickness variations for multilayer electronic structures 有权
    控制多层电子结构的阻抗和厚度变化

    公开(公告)号:US07921403B2

    公开(公告)日:2011-04-05

    申请号:US12101455

    申请日:2008-04-11

    摘要: Impedance control, and the uniformity of electrical and mechanical characteristics in electronic packaging are becoming more important as chip and bus speeds increase and manufacturing processes evolve. Current state of the art design and manufacture processes inherently introduce physical dielectric thickness variations into PCB cross sections. These thickness variations between the ground reference plane(s) and the signal layer(s) inject undesirable characteristic impedance variations and undesirable mechanical variations in thickness and surface topology. Therefore a process of generating equalization data and a design structure for multilayer electronic structures is presented.

    摘要翻译: 阻抗控制以及电子封装中电气和机械特性的均匀性越来越重要,因为芯片和总线速度的增加和制造过程的演变。 当前的现有技术设计和制造工艺本身将物理电介质厚度变化引入PCB横截面。 接地参考平面与信号层之间的这些厚度变化引起了不需要的特性阻抗变化和厚度和表面拓扑结构中不期望的机械变化。 因此,提出了产生均衡数据的过程和用于多层电子结构的设计结构。