摘要:
Embodiments of the invention may provide for digital wavelet generators utilized in providing flexible spectrum-sensing resolutions for a Multi-Resolution Spectrum Sensing (MRSS) technique. Embodiments of the invention may provide for either multi-point or multi-rate digital wavelet generators. These digital wavelet generators may utilizing the same hardware resource optimally, and the various wavelet bases may be generated by changing the memory addressing schemes or clock speeds.
摘要:
Embodiments of the present invention may provide for a long delay generator for the spectrum sensing of cognitive radio systems. The long delay generator may comprise of an Analog-to-Digital Converter (ADC), memory element, and Digital-to-Analog Converter (DAC). The memory element may utilize shift register bank or Random-Access Memory (RAM) cells. The long delay generator may provide for a selectable delay by digitizing the received signal, delaying the received signal in the digital domain, and reconstructing the delayed signal as an analog. The analog delayed signal may then be compared or otherwise correlated with the original input signal using an analog auto-correlation technique to determine whether a meaningful signal type has been identified or otherwise detected.
摘要:
Embodiments of the invention may provide for digital wavelet generators utilized in providing flexible spectrum-sensing resolutions for a Multi-Resolution Spectrum Sensing (MRSS) technique. Embodiments of the invention may provide for either multi-point or multi-rate digital wavelet generators. These digital wavelet generators may utilizing the same hardware resource optimally, and the various wavelet bases may be generated by changing the memory addressing schemes or clock speeds.
摘要:
Embodiments of the invention may provide for a long delay generator for the spectrum sensing of cognitive radio systems. The long delay generator may include an Analog-to-Digital Converter (ADC), memory element, and Digital-to-Analog Converter (DAC). The memory element may utilize shift register bank or Random-Access Memory (RAM) cells. The long delay generator may provide for a selectable delay by digitizing the received signal, delaying the received signal in the digital domain, and reconstructing the delayed signal as an analog. The analog delayed signal may then be compared or otherwise correlated with the original input signal using an analog auto-correlation technique to determine whether a meaningful signal type has been identified or otherwise detected.
摘要:
Example driver circuits can utilize shared-charge recycling charge pump structures. In particular, an example shared-charge recycling process may be applied to a clock buffer and charge transfer cells of the charge pump in a driver circuit. An example recycling process may include recycling of shared charges between the capacitors/capacitances in the charge transfer cells. An example recycling process may use the charges in one or more capacitors to charge one or more other capacitors before the charges are wasted or otherwise discharged to ground. Such recycling may significantly reduce the power consumption of the charge pump while still providing a high output voltage level, according to an example embodiment of the invention.
摘要:
A method of generating a photo mask for use during fabrication of a semiconductor device includes; generating an initial layout design including critical circuit paths and non-critical circuit paths by shielding all gate line patterns used to implement transistors in the critical circuits and non-critical circuits, and thereafter generating a layout design from the initial layout design by selectively un-shielding a non-critical gate line pattern among the gate line patterns used to implement a gate of a non-critical transistor in a non-critical circuit, while retaining the shielding of all critical gate line patterns among the gate line patterns.
摘要:
A method of designing a semiconductor device includes preparing a standard cell layout including a layout out a preliminary pin pattern in at least one interconnection layout, performing a routing step to connect the preliminary pin pattern to a high-level interconnection layout, and generating a pin pattern in the interconnection layout, based on hitting information obtained at the completion of the routing step. The pin pattern is smaller than the preliminary pin pattern.
摘要:
A method of fabricating a semiconductor device having a first region, a second region, and a third region between the first and second regions includes forming first and second preliminary active patterns protruding from a substrate in the first and second regions, respectively, forming mask patterns exposing the third region on the substrate, performing a first etching process using the mask patterns an etch mask to form first and second active patterns, respectively, and forming gate structures on the substrate.
摘要:
A method of fabricating a semiconductor device having a first region, a second region, and a third region between the first and second regions includes forming first and second preliminary active patterns protruding from a substrate in the first and second regions, respectively, forming mask patterns exposing the third region on the substrate, performing a first etching process using the mask patterns an etch mask to form first and second active patterns, respectively, and forming gate structures on the substrate.