Nanometer-scale sharpening of conductor tips
    6.
    发明授权
    Nanometer-scale sharpening of conductor tips 有权
    导体尖端的纳米级锐化

    公开(公告)号:US08070920B2

    公开(公告)日:2011-12-06

    申请号:US11740678

    申请日:2007-04-26

    IPC分类号: C23C14/34

    CPC分类号: G01Q70/16 C23F4/00

    摘要: The invention provides methods for sharpening the tip of an electrical conductor. The methods of the invention are capable of producing tips with an apex radius of curvature less than 2 nm. The methods of the invention are based on simultaneous direction of ionized atoms towards the apex of a previously sharpened conducting tip and application of an electric potential difference to the tip. The sign of the charge on the ions is the same as the sign of the electric potential. The methods of the invention can be used to sharpen metal wires, metal wires tipped with conductive coatings, multi-walled carbon nanotubes, semiconducting nanowires, and semiconductors in other forms.

    摘要翻译: 本发明提供了用于磨削电导体尖端的方法。 本发明的方法能够产生顶点曲率小于2nm的尖端。 本发明的方法是基于离子化原子朝向先前锐化的导电尖端的顶点的同时方向,以及向尖端施加电势差。 离子上的电荷的符号与电位的符号相同。 本发明的方法可用于锐化金属线,金属导线尖端与导电涂层,多壁碳纳米管,半导体纳米线和其他形式的半导体。

    NANOMETER-SCALE SHARPENING OF CONDUCTOR TIPS
    7.
    发明申请
    NANOMETER-SCALE SHARPENING OF CONDUCTOR TIPS 有权
    导体提示的NANOMETER-SCALE SHARPENING

    公开(公告)号:US20080105539A1

    公开(公告)日:2008-05-08

    申请号:US11740678

    申请日:2007-04-26

    IPC分类号: C23C14/46

    CPC分类号: G01Q70/16 C23F4/00

    摘要: The invention provides methods for sharpening the tip of an electrical conductor. The methods of the invention are capable of producing tips with an apex radius of curvature less than 2 nm. The methods of the invention are based on simultaneous direction of ionized atoms towards the apex of a previously sharpened conducting tip and application of an electric potential difference to the tip. The sign of the charge on the ions is the same as the sign of the electric potential. The methods of the invention can be used to sharpen metal wires, metal wires tipped with conductive coatings, multi-walled carbon nanotubes, semiconducting nanowires, and semiconductors in other forms.

    摘要翻译: 本发明提供了用于磨削电导体尖端的方法。 本发明的方法能够产生顶点曲率小于2nm的尖端。 本发明的方法是基于离子化原子朝向先前锐化的导电尖端的顶点的同时方向,以及向尖端施加电势差。 离子上的电荷的符号与电位的符号相同。 本发明的方法可用于锐化金属线,金属导线尖端与导电涂层,多壁碳纳米管,半导体纳米线和其他形式的半导体。

    Nanometer-scale sharpening of conductor tips
    8.
    发明授权
    Nanometer-scale sharpening of conductor tips 有权
    导体尖端的纳米级锐化

    公开(公告)号:US08819861B2

    公开(公告)日:2014-08-26

    申请号:US13292714

    申请日:2011-11-09

    IPC分类号: G01Q70/16

    CPC分类号: G01Q70/16 C23F4/00

    摘要: The invention provides methods for sharpening the tip of an electrical conductor. The methods of the invention are capable of producing tips with an apex radius of curvature less than 2 nm. The methods of the invention are based on simultaneous direction of ionized atoms towards the apex of a previously sharpened conducting tip and application of an electric potential difference to the tip. The sign of the charge on the ions is the same as the sign of the electric potential. The methods of the invention can be used to sharpen metal wires, metal wires tipped with conductive coatings, multi-walled carbon nanotubes, semiconducting nanowires and semiconductors in other forms.

    摘要翻译: 本发明提供了用于磨削电导体尖端的方法。 本发明的方法能够产生顶点曲率小于2nm的尖端。 本发明的方法是基于离子化原子朝向先前锐化的导电尖端的顶点的同时方向,以及向尖端施加电势差。 离子上的电荷的符号与电位的符号相同。 本发明的方法可用于锐化金属丝,金属丝,其具有导电涂层,多壁碳纳米管,半导体纳米线和其他形式的半导体。