UNIFORM BACKGROUND RADIATION IN MASKLESS LITHOGRAPHY
    3.
    发明申请
    UNIFORM BACKGROUND RADIATION IN MASKLESS LITHOGRAPHY 有权
    均匀的背景辐射在MASKLESS LITHOGRAPHY

    公开(公告)号:US20080231826A1

    公开(公告)日:2008-09-25

    申请号:US11689926

    申请日:2007-03-22

    IPC分类号: G03F7/20

    摘要: A device manufacturing method comprising applying patterns to a plurality of arrays of individually controllable elements, such that they modulate a beam of radiation, and projecting the modulated beam of radiation onto a substrate. The patterns applied to the arrays of individually controllable elements are arranged such that pre-determined amounts of background radiation are included in the modulated beam of radiation. The pre-determined amounts of background radiation being different for different locations on the arrays.

    摘要翻译: 一种器件制造方法,包括将图案应用于独立可控元件的多个阵列,使得它们调制辐射束,并将经调制的辐射束投影到衬底上。 应用于独立可控元件的阵列的图案被布置成使得预定数量的背景辐射被包括在调制的辐射束中。 背景辐射的预定量对于阵列上的不同位置是不同的。

    DOSE CONTROL FOR OPTICAL MASKLESS LITHOGRAPHY
    6.
    发明申请
    DOSE CONTROL FOR OPTICAL MASKLESS LITHOGRAPHY 审中-公开
    用于光学平滑度测量的剂量控制

    公开(公告)号:US20080304034A1

    公开(公告)日:2008-12-11

    申请号:US11759587

    申请日:2007-06-07

    IPC分类号: G03B27/52 G03C5/04

    摘要: A lithographic apparatus comprises a patterning device, a projection system, and a controller. The patterning device is configured to pattern a beam of radiation. The radiation beam comprises a plurality of pulses of radiation. The projection system is configured to project the patterned beam of radiation onto a substrate coated with a layer of radiation sensitive material. The controller is arranged to control a total energy of a respective pulse of the plurality of pulses of the radiation beam. The controller is configured to take into account information indicative of properties of the layer of radiation sensitive material on a part of the substrate onto which the radiation beam is to be projected.

    摘要翻译: 光刻设备包括图案形成装置,投影系统和控制器。 图案形成装置被配置成对辐射束进行图案化。 辐射束包括多个辐射脉冲。 投影系统被配置为将图案化的辐射束投影到涂覆有一层辐射敏感材料的基底上。 控制器被布置成控制辐射束的多个脉冲中的相应脉冲的总能量。 控制器被配置为考虑在辐射束将被投影到的衬底的一部分上的辐射敏感材料层的特性的信息。