摘要:
A sensing circuit for sensing the logic state of a memory cell which minimizes read times is described which includes a first circuit branch corresponding to an array circuit path and a second circuit branch corresponding to a reference cell circuit path. In operation during the pre-decode interval, additional load and current generation circuitry are enabled in the first circuit path so that the voltage as seen by the sensing input of a sensing circuit comparator is driven to be essentially equivalent to that of the reference signal as established by the reference cell circuit path on the reference input of the sensing circuit comparator. Once the address has been decoded, the additional load circuitry is disabled so as to allow the sensing input of the comparator to transition to a voltage representative of the logic state stored in the memory cell.
摘要:
An on chip voltage generation circuit is provided suitable for use on integrated circuits such as flash memory devices with a low power supply voltage (e.g., 2.7 to 3.6 volts). A voltage boost circuit is coupled to the supply voltage input and to a boost signal, which boosts the on-chip voltage at a node on the integrated circuit in response to a transition of the boost signal. The voltage boost circuit has a first mode which in response to the transition boosts the on-chip voltage at a first rate of boosting until a first threshold, and a second mode which in response to the transition boosts the on-chip voltage at a second rate of boosting until a second threshold. The second rate of boosting in the preferred system is slower than the first rate of boosting. A detection circuit is coupled to the node on the integrated circuit which receives the on-chip voltage, and to the voltage boost circuit. The detection circuit signals the voltage boost circuit when the node reaches the first threshold, and signals the voltage boost circuit when the node reaches the second threshold. According to one aspect of the invention, the first threshold is reached within less than 5 nanoseconds, and more preferably about 2 nanoseconds, or less, of the transition in the boost signal.
摘要:
The present invention provides a new (ATD) address transition detection circuit for use on an address bus having any number of address lines. An ATD circuit is disclosed which comprises a first and second circuit and an interval timer. The first circuit has a first and second input and an output. The first circuit receives, at the first input, a change signal corresponding to transitions in one or more addresses of an address bus. In response, the output of the first circuit transitions from an initial first state to a second state. The first circuit is also responsive to a reset command at the second input to return the output to the first state. The interval timer has an output coupled to the second input of the first circuit and an input. The interval timer responsive to an initialize command at the input initiates a timed interval and after the timed interval generates the reset command at the output. The second circuit has an output coupled to the input of the interval timer and an input. The second circuit responsive to the change signal at the input generates an initialize command at the output. The circuit provides a second state at the output of the first circuit, for all including the last received in a series of change signals. This assures that all address transitions have been detected before a memory access is allowed.
摘要:
A circuit is provided for supplying a negative erasing voltage onto the wordlines of selected blocks in an array of floating gate memory cells. The circuit includes a voltage circuit, which has a plurality of local outputs, each of which connects to wordlines of an associated block of floating gate memory cells. A block selector circuit is coupled to the local outputs of the voltage circuit and selectively switches each of the local outputs to apply either an erasing voltage or a non-erasing voltage onto the wordlines of the associated block of floating gate memory cells. Negative wordline stress is thus reduced for wordlines of unselected blocks which receive a less negative, non-erasing voltage during block erase operations.
摘要:
An output driver for an integrated circuit performs a precharge function before internal data is available, minimizing the access time for such data. Also, the pull up and pull down circuitry used in the precharge function is separate from the output driver, and independent of the level of the data signal to be driven. A sense circuit senses an initial state of the output pad, before the output signal is supplied to the output pad, which indicates whether a voltage level on the output pad is above a threshold or below the threshold. A precharge circuit includes a pull up circuit and a pull down circuit. The pull up circuit is responsive to the initial state indicating that the voltage level on the output is below the threshold, and the pull down circuit is responsive to the initial state indicating that the voltage level on the output is above the threshold. A detector is coupled to the output, and produces a control signal indicating when output is near the threshold. Logic is responsive to the control signal from the detector to turn off the precharge circuit when the threshold is reached.
摘要:
A user-programmable write protection scheme provides flexibility and superior write protect features for an integrated circuit memory which comprises an array of non-volatile erasable and programmable memory cells, including a plurality of sectors. Command logic detects command sequences indicating operations for the array, including a program operation, a sector erase operation, a read operation, a sector lock operation, and a sector unlock operation. The sector protect logic includes sector lock memory, including non-volatile memory cells that store sector lock signals for at least one sector in the array. Among other functions, the sector protect logic: 1) inhibits sector erase and program operations to a particular sector in response to a set sector lock signal corresponding to the particular sector, and to a first state of control signals in the set of control signals; 2) enables sector erase and program operations in response to a reset sector lock signal corresponding to the particular sector, and to the first state of control signals in the set of control signals; 3) inhibits sector erase and program operations to the particular sector independent of the sector lock signal in response to a second state of control signals in the set of control signals; and 4) enables sector erase and program operations independent of the sector lock signal in response to a third state of control signals in the set of control signals.
摘要:
An embodiment of the invention provides a buffer circuit having reduced power consumption. The buffer circuit comprises a power saving switch coupled to a buffer at a bias node. The buffer has an input that is adapted to receive input voltages at TTL levels, for example, and has an output adapted to provide output voltages at CMOS levels, for example. The power saving switch includes a level shifter and a voltage control circuit both coupled to the bias node. The output voltage of the buffer is fed back to the power saving switch. When the output voltage is at a low CMOS level, the power saving switch uses the voltage control circuit to provide a first bias voltage to the bias node. When the output voltage is at a high CMOS level, the power saving switch uses the level shifter to provide a second bias voltage to the bias node. The second bias voltage is chosen such that it prevents current flow between the bias node and the buffer at a predetermined input cutoff voltage. The level shifter provides a relatively constant second bias voltage by providing a relatively constant voltage shift V.sub.LS between a level shifter reference voltage V.sub.ref and the bias node. In the present embodiment, this voltage shift V.sub.LS is the absolute value of the gate to source threshold voltage of a FET. Accordingly, the second bias voltage is V.sub.ref -V.sub.LS. In one embodiment, the voltage control circuit includes a second level shifter to provide the first bias voltage.
摘要:
A nonvolatile memory array is divided into multiple memory groups. The nonvolatile memory array receives an erase command to erase a first set of the memory groups, and not a second set of the memory groups. The control circuitry is responsive to the erase command to erase the first set of memory groups, by applying a recovery bias arrangement that adjusts threshold voltages of memory cells in at least one memory group of the second set of memory groups. By applying the recovery bias arrangement to memory cells in at least one memory group of the second set of memory groups, erase disturb is corrected during the recovery bias arrangement, at least in part.
摘要:
A nonvolatile memory array has a multiple erase procedures of different durations. A block of memory cells of the array can be erased by one of the different erase procedures.
摘要:
A memory apparatus includes a host device and a slave device. The host device stores verification data. The slave device includes a memory unit, a control unit, and a logic unit. The control unit drives the memory unit to provide storage data in a data transmission sub-period, and further provides a control signal, indicating the first verification data, in a dummy sub-period. The logic unit provides first preamble data, indicating substantially a same data value as the verification data, in the dummy sub-period in response to the first control signal. The preamble data and the storage data are transmitted according to an internal clock signal. The host device samples the first preamble data according to an external clock signal, and determines whether the external and the internal clock signals are synchronized by comparing the first preamble data and the first verification data.