摘要:
There is disclosed a test multiplexer having over voltage protection for use in integrated circuitry, along with methods of operating the same. An exemplary test multiplexer according to one embodiment of the present invention includes a plurality of MOSFET devices and over voltage protection circuitry. The plurality of MOSFET devices, including both p-type and n-type MOSFET devices, cooperate to pass an input signal to an output signal line of the test multiplexer while the test multiplexer is enabled. The over voltage protection circuitry is biased so that a difference between the input signal voltage and a bias voltage does not exceed breakdown when the test multiplexer is disabled. An important aspect hereof is that the test multiplexer is compliant to input voltages that exceed the positive supply rail, and is capable of sustaining a high or otherwise out of threshold single ended voltage at the input without latching up.
摘要:
A band-gap reference circuit with averaged current mirror offsets is provided that includes a differential amplifier circuit, a low current transistor circuit, a high current transistor circuit, and a configuration circuit. The differential amplifier circuit includes a first input node operable to receive a first input signal, a second input node operable to receive a second input signal, and an output node operable to generate an output signal based on the input signal difference. The low current transistor circuit is coupled to the differential amplifier circuit and is operable to receive the output signal and to generate the first input signal based on the output signal. The high current transistor circuit is coupled to the differential amplifier circuit and is operable to receive the output signal and to generate the second input signal based on the output signal. The configuration circuit is coupled to the low current transistor circuit and to the high current transistor circuit. The configuration circuit is operable to configure the band-gap reference circuit for a plurality of states by switching a plurality of components between the low current transistor circuit and the high current transistor circuit at specified intervals.
摘要:
A strobed comparator circuit with reduced signal propagation time has a regenerative latch in which, during the reset phase of operation, its output nodes are discharged to a common potential which is close to the regenerative voltage level of the cross-coupled transistors forming such regenerative latch rather than to circuit ground. Accordingly, overall signal propagation time is reduced by the amount of reduction in charging time necessary for one of the discharged nodes to recharge above the threshold voltage of one of the cross-coupled latch transistors. Also included is an output monitoring circuit which determines whether the regenerative latch has remained in a metastable state.
摘要:
A system and method is disclosed for providing a clock and data recovery circuit with a fast bit error rate self test capability. A bit error rate test control unit is provided that causes the clock and data recovery circuit to sample data adjacent to an edge of a bit period to create errors at a relatively high bit error rate. This is accomplished by intentionally introducing an interpolator offset in a phase position of a data clock signal. The test control unit generates a first bit error rate and then subsequently generates a second bit error rate. The test control unit then uses the values of the first and second bit error rates to extrapolate a value of bit error rate for the clock and data recovery circuit that corresponds to a zero value of interpolator offset.
摘要:
A system and method is disclosed for providing a clock and data recovery circuit with a self test capability. A test control unit is provided that causes the clock and data recovery circuit to continuously alter a phase of an interpolated clock signal. A user selects a preselected bit pattern that causes the digital control circuitry of the clock and data recovery circuit to advance or retard the phase of the interpolated clock signal. The test control unit compares the advanced or retarded phase of the interpolated clock signal with a reference clock signal to determine a frequency difference between the two clock signals. The test control unit uses the frequency difference to determine the test status of the clock and data recovery circuit.
摘要:
There is disclosed an amplifier for operating from a power supply having a first voltage level. The amplifier comprises: 1) a plurality of thick-oxide field effect transistors, each of the plurality of thick-oxide field effect transistors having a relatively thick oxide layer and fabricated using a first process such that the each thick-oxide field effect transistor can withstand a gate-to-source difference, a gate-to-drain difference, and a gate-to-bulk difference at least equal to a first maximum operating voltage, wherein the first. maximum operating voltage is at least equal to the first voltage level; and 2) a first thin-oxide field effect transistor coupled to a first input of the amplifier, the first thin-oxide field effect transistor having a relatively thin oxide layer and fabricated using a second process such that the first thin-oxide field effect transistor can withstand a gate-to-source difference, a gate-to-drain difference, and a gate-to-bulk difference at least equal to a second maximum operating voltage, wherein the second maximum operating voltage is less than the first voltage level.
摘要:
A sample and hold (S/H) circuit with common mode differential signal feedback for converting single-ended signals to differential signals includes a feedback loop for the input switched capacitor circuit to ensure that the input common mode voltage for the differential amplifier is maintained at a known value during the hold phase of operation. The feedback loop consists of a three-input error amplifier which monitors the two voltages at the differential input terminals of the differential amplifier in relation to the common mode reference voltage and generates a feedback voltage which is applied to the input terminals of the input switched capacitor circuit during the hold phase of operation. If both of the differential input terminal voltages are either more negative or more positive than the common mode reference voltage then the feedback voltage generated by the error amplifier is made more positive or negative, respectively.
摘要:
A high speed fully differential operational amplifier with fast settling time for switched capacitor applications includes a high gain active cascode applied to the operational amplifier's input stage transistors to improve the gain, provide a higher output impedance, and thus, reduce the Miller feedback gate drain capacitance of the input stage devices. This improves the speed of the amplifier. A biasing technique is used to keep the active cascodes biased during transient overload so that settling will not be adversely affected during the recovery of the cascodes. A pair of transistors are used to feed forward a fraction of the tail current to "keep-alive" the cascode transistors. In other words, the fraction of the tail current that is fed to the source of the cascode transistors via the keep-alive transistors effectively biases the active cascodes sufficiently so that they do not turn off completely during slewing.
摘要:
A system and method is disclosed for providing a fast turn on bias circuit that permits a fast transition from an idle “power down” state to an active “power up” state in current mode logic (CML) transmitter output circuits. The invention comprises a capacitor coupled to a bias transistor and a charge switch circuit for controlling the operation of the capacitor. The capacitor has a value of capacitance that is equal in magnitude and opposite in sign to the Miller coupling capacitance in the bias transistor. The capacitor compensates for the Miller coupling capacitance within the bias transistor in less than ten nanoseconds. This permits a CML transmitter to more quickly restart the transmission of data after an active state has been initiated.
摘要:
Three-state binary adders are disclosed for use in pipelined analog-to-digital converters. According to one advantageous embodiment, a three-state binary adder is provided for use in a digital signal processing system. The three-state binary adder is operable to generate binary codes consisting of three states, namely, “00”, “01” and “10.”