Illumination system for illuminating a mask in a microlithographic exposure apparatus
    1.
    发明授权
    Illumination system for illuminating a mask in a microlithographic exposure apparatus 有权
    用于在微光刻曝光设备中照射掩模的照明系统

    公开(公告)号:US08416390B2

    公开(公告)日:2013-04-09

    申请号:US12533756

    申请日:2009-07-31

    IPC分类号: G03B27/54 G03B27/42

    摘要: An illumination system for illuminating a mask in a microlithographic exposure apparatus has an optical axis and a pupil surface. The system can include an array of reflective or transparent beam deflection elements such as mirrors. Each deflection element can be adapted to deflect an impinging light ray by a deflection angle that is variable in response to a control signal. The beam deflection elements can be arranged in a first plane. The system can further include an optical raster element, which includes a plurality of microlenses and/or diffractive structures. The beam deflection elements), which can be arranged in a first plane, and the optical raster element, which can be arranged in a second plane, can commonly produce a two-dimensional far field intensity distribution. An optical imaging system can optically conjugate the first plane to the second plane.

    摘要翻译: 用于在微光刻曝光设备中照射掩模的照明系统具有光轴和光瞳表面。 该系统可以包括反射或透明的束偏转元件阵列,例如反射镜。 每个偏转元件可以适于使入射光线偏转响应于控制信号而变化的偏转角。 光束偏转元件可以布置在第一平面中。 该系统还可以包括光栅元件,其包括多个微透镜和/或衍射结构。 可以布置在第一平面中的光束偏转元件)和可以布置在第二平面中的光栅元件可以共同地产生二维远场强度分布。 光学成像系统可以将第一平面与第二平面光学共轭。

    ILLUMINATION SYSTEM FOR ILLUMINATING A MASK IN A MICROLITHOGRAPHIC EXPOSURE APPARATUS
    2.
    发明申请
    ILLUMINATION SYSTEM FOR ILLUMINATING A MASK IN A MICROLITHOGRAPHIC EXPOSURE APPARATUS 有权
    用于在微波曝光装置中照射掩模的照明系统

    公开(公告)号:US20100060873A1

    公开(公告)日:2010-03-11

    申请号:US12533756

    申请日:2009-07-31

    IPC分类号: G03B27/70

    摘要: An illumination system for illuminating a mask in a microlithographic exposure apparatus has an optical axis and a pupil surface. The system can include an array of reflective or transparent beam deflection elements such as mirrors. Each deflection element can be adapted to deflect an impinging light ray by a deflection angle that is variable in response to a control signal. The beam deflection elements can be arranged in a first plane. The system can further include an optical raster element, which includes a plurality of microlenses and/or diffractive structures. The beam deflection elements), which can be arranged in a first plane, and the optical raster element, which can be arranged in a second plane, can commonly produce a two-dimensional far field intensity distribution. An optical imaging system can optically conjugate the first plane to the second plane.

    摘要翻译: 用于在微光刻曝光设备中照射掩模的照明系统具有光轴和光瞳表面。 该系统可以包括反射或透明的束偏转元件阵列,例如反射镜。 每个偏转元件可以适于使入射光线偏转响应于控制信号而变化的偏转角。 光束偏转元件可以布置在第一平面中。 该系统还可以包括光栅元件,其包括多个微透镜和/或衍射结构。 可以布置在第一平面中的光束偏转元件)和可以布置在第二平面中的光栅元件可以共同地产生二维远场强度分布。 光学成像系统可以将第一平面与第二平面光学共轭。

    Gravitation compensation for optical elements in projection exposure apparatuses
    7.
    发明授权
    Gravitation compensation for optical elements in projection exposure apparatuses 有权
    投影曝光装置中的光学元件的重力补偿

    公开(公告)号:US08854603B2

    公开(公告)日:2014-10-07

    申请号:US13111492

    申请日:2011-05-19

    IPC分类号: G03B27/54 G03B27/42 G03F7/20

    摘要: A gravitation compensator for mounting optical elements in a projection exposure apparatus and a corresponding projection exposure apparatus are disclosed. The gravitation compensator at least partly compensates for the weight force of a mounted optical element and simultaneously enables a change in the position of the optical element without the compensated weight force being altered in an impermissible manner during the change in position. This applies, in particular, to high weight forces which are to be compensated. Furthermore, the gravitation compensator enables use in different atmospheres and the compensation of corresponding aging effects.

    摘要翻译: 公开了一种用于在投影曝光设备和相应的投影曝光设备中安装光学元件的引力补偿器。 重力补偿器至少部分地补偿安装的光学元件的重量,并且同时能够改变光学元件的位置,而不会在位置改变期间以不允许的方式改变补偿的重量。 这尤其适用于要补偿的高重量力。 此外,引力补偿器可以在不同的环境中使用,并补偿相应的老化效应。

    Implement for processing, particularly sealing, ground surfaces under water, particularly bottoms and embankments of waterways, particularly canals, a method for setting up the same, a method for moving the same, a method for sealing ground surfaces using the same, and the like
    8.
    发明授权
    Implement for processing, particularly sealing, ground surfaces under water, particularly bottoms and embankments of waterways, particularly canals, a method for setting up the same, a method for moving the same, a method for sealing ground surfaces using the same, and the like 有权
    用于加工,特别是在水下,特别是水路的底部和路堤,特别是运河处的地面的密封,其设置方法,使其移动的方法,使用其的密封地面的方法等

    公开(公告)号:US08632276B2

    公开(公告)日:2014-01-21

    申请号:US12988478

    申请日:2009-03-13

    申请人: Juergen Fischer

    发明人: Juergen Fischer

    IPC分类号: E02D13/00 E02D7/28

    摘要: A method and apparatus for processing underwater beds includes a plurality of polygonal hollow pipes arranged side by side, the upper ends of which form a horizontal, substantially flat working platform. Each hollow pipe has a horizontal projection with a flange extending vertically and a corresponding flange insertion aperture with a slot immediately above it running vertically and extending as far as the upper end of the hollow pipe, the aperture being further away from the upper end of the hollow pipe than the projection with the flange and having a greater horizontal dimension than the slot. Neighboring hollow pipes engage one another via a respective projection with a corresponding slot. The hollow pipes cannot be moved relative to one another horizontally. Individual pipes can only be pulled out individually in an upward direction at the platform outer edge.

    摘要翻译: 一种用于处理水下床的方法和装置包括多个并排布置的多边形中空管,其上端形成水平的,基本平坦的工作平台。 每个中空管具有水平突起,其具有垂直延伸的凸缘和相应的凸缘插入孔,其上方正好在其上垂直延伸并延伸至中空管的上端,该孔远离该中空管的上端 中空管比具有凸缘的突起具有比槽更大的水平尺寸。 相邻的中空管通过相应的突起与相应的槽相互接合。 中空管不能相对于水平移动。 单独的管道只能在平台外边缘沿向上方向单独拉出。

    PROJECTION OBJECTIVE OF A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS
    9.
    发明申请
    PROJECTION OBJECTIVE OF A MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS 审中-公开
    微波投影曝光装置的投影目标

    公开(公告)号:US20090225296A1

    公开(公告)日:2009-09-10

    申请号:US12467879

    申请日:2009-05-18

    申请人: Juergen Fischer

    发明人: Juergen Fischer

    IPC分类号: G03B27/54

    CPC分类号: G03F7/70825 G03F7/70266

    摘要: A projection objective of a microlithographic projection exposure apparatus has a plurality of optical elements, for example lenses or mirrors. The objective furthermore includes an actuator for exerting a mechanical force that deforms a selected optical element of the projection objective. A manipulator modifies the spatial position of one of the optical elements as a function of the force exerted by the actuator.

    摘要翻译: 微光刻投影曝光装置的投影物镜具有多个光学元件,例如透镜或反射镜。 此外,该目的还包括用于施加使所选投影物镜的所选择的光学元件变形的机械力的致动器。 操纵器根据由致动器施加的力的函数来修改光学元件中的一个的空间位置。