Silica-based film, method of forming the same, composition for forming insulating film for semiconductor device, interconnect structure, and semiconductor device
    7.
    发明申请
    Silica-based film, method of forming the same, composition for forming insulating film for semiconductor device, interconnect structure, and semiconductor device 有权
    二氧化硅膜,其形成方法,用于形成用于半导体器件的绝缘膜的组合物,互连结构和半导体器件

    公开(公告)号:US20060024980A1

    公开(公告)日:2006-02-02

    申请号:US11184964

    申请日:2005-07-20

    IPC分类号: H01L21/31

    摘要: A method of forming a silica-based film includes: applying a composition for forming an insulating film for a semiconductor device, which is cured by using heat and ultraviolet radiation, to a substrate to form a coating; heating the coating; and applying heat and ultraviolet radiation to the coating to effect a curing treatment. The composition includes: a hydrolysis-condensation product produced by hydrolysis and condensation of at least one silane compound selected from the group consisting of compounds shown by the following general formula (A), and at least one silane compound selected from the group consisting of compounds shown by the following general formula (B) and compounds shown by the following general formula (C); and an organic solvent,

    摘要翻译: 形成二氧化硅基膜的方法包括:将通过使用热和紫外线辐射固化的用于形成用于半导体器件的绝缘膜的组合物施加到基底以形成涂层; 加热涂层; 并向涂层施加热和紫外线辐射以进行固化处理。 该组合物包括:通过水解和缩合选自由以下通式(A)表示的化合物组成的组中的至少一种硅烷化合物和至少一种选自化合物的硅烷化合物产生的水解缩合产物 由以下通式(B)表示的化合物和由以下通式(C)表示的化合物: 和有机溶剂,

    Film forming composition, process for producing film forming composition, insulating film forming material, process for forming film, and silica-based film
    8.
    发明授权
    Film forming composition, process for producing film forming composition, insulating film forming material, process for forming film, and silica-based film 有权
    成膜组合物,成膜组合物的制造方法,绝缘膜形成材料,成膜方法和二氧化硅基膜

    公开(公告)号:US07462678B2

    公开(公告)日:2008-12-09

    申请号:US10947253

    申请日:2004-09-23

    IPC分类号: C08G77/08

    摘要: A process for producing a film forming composition, the process including hydrolyzing and condensing: (A) at least one silane compound selected from a compound (A-1) shown by the following general formula (1), a compound (A-2) shown by the following general formula (2), and a compound (A-3) shown by the following general formula (3), RaSi(OR1)4-a  (1) Si(OR2)4  (2) R3b(R4O)3-bSi—(R7)d—Si(OR5)3-cR6c  (3); and (B) a cyclic silane compound shown by the following general formula (4):

    摘要翻译: 一种制备成膜组合物的方法,该方法包括水解和缩合:(A)至少一种选自以下通式(1)所示的化合物(A-1)的硅烷化合物,化合物(A-2) 由下述通式(2)表示的化合物(A-3)和下述通式(3)所示的化合物(A-3),<?在线式说明=“在线式”末端=“铅” RaSi(OR1)4-a(1)<?in-line-formula description =“In-line Formulas”end =“tail”?> <?in-line-formula description =“In-line Formulas”end = 引线“→Si(OR2)4(2)<?in-line-formula description =”In-line Formulas“end =”tail“?> <?in-line-formula description =”In-line Formulas“end =“lead”→R3b(R4O)3-bSi-(R7)d-Si(OR5)3-cR6c(3); (B)由以下通式(4)表示的环状硅烷化合物:(A)

    Silica-based film, method of forming the same, composition for forming insulating film for semiconductor device, interconnect structure, and semiconductor device
    9.
    发明授权
    Silica-based film, method of forming the same, composition for forming insulating film for semiconductor device, interconnect structure, and semiconductor device 有权
    二氧化硅膜,其形成方法,用于形成用于半导体器件的绝缘膜的组合物,互连结构和半导体器件

    公开(公告)号:US07291567B2

    公开(公告)日:2007-11-06

    申请号:US11184964

    申请日:2005-07-20

    IPC分类号: H01L21/31

    摘要: A method of forming a silica-based film includes:applying a composition for forming an insulating film for a semiconductor device, which is cured by using heat and ultraviolet radiation, to a substrate to form a coating; heating the coating; and applying heat and ultraviolet radiation to the coating to effect a curing treatment. The composition includes: a hydrolysis-condensation product produced by hydrolysis and condensation of at least one silane compound selected from the group consisting of compounds shown by the following general formula (A), and at least one silane compound selected from the group consisting of compounds shown by the following general formula (B) and compounds shown by the following general formula (C); and an organic solvent,

    摘要翻译: 形成二氧化硅基膜的方法包括:将通过使用热和紫外线辐射固化的用于形成用于半导体器件的绝缘膜的组合物施加到基底以形成涂层; 加热涂层; 并向涂层施加热和紫外线辐射以进行固化处理。 该组合物包括:通过水解和缩合选自由以下通式(A)表示的化合物组成的组中的至少一种硅烷化合物和至少一种选自化合物的硅烷化合物产生的水解缩合产物 由以下通式(B)表示的化合物和由以下通式(C)表示的化合物: 和有机溶剂,