Lithographic apparatus, substrate table, and method for enhancing substrate release properties
    4.
    发明授权
    Lithographic apparatus, substrate table, and method for enhancing substrate release properties 有权
    平版印刷装置,基板台,以及增强基板剥离性能的方法

    公开(公告)号:US08792085B2

    公开(公告)日:2014-07-29

    申请号:US12856106

    申请日:2010-08-13

    IPC分类号: G03B27/58 G03F7/20 H01L21/687

    摘要: A lithographic apparatus includes an illumination system constructed and arranged to condition a radiation beam, and a support constructed and arranged to support a patterning device. The patterning device is capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam. The apparatus also includes a substrate table constructed and arranged to hold a substrate, and a projection system constructed and arranged to project the patterned radiation beam onto a target portion of the substrate. The substrate table includes a chuck having a plurality of protrusions constructed and arranged to support corresponding parts of a bottom surface of a wafer. The top surface of at least one of the protrusions includes a plurality of elements that define a reduced contact area between the substrate and the top surface of the protrusion.

    摘要翻译: 光刻设备包括构造和布置成调节辐射束的照明系统,以及构造和布置成支撑图案形成装置的支撑件。 图案形成装置能够在其横截面中赋予辐射束图案以形成图案化的辐射束。 所述装置还包括被构造和布置成保持基板的基板台,以及构造和布置成将图案化的辐射束投影到基板的目标部分上的投影系统。 衬底台包括具有多个突出部的卡盘,所述多个突起被构造和布置成支撑晶片底面的对应部分。 至少一个突起的顶表面包括多个元件,其限定了基板和突起的顶表面之间的减小的接触面积。

    Calibration method and lithographic apparatus for calibrating an optimum take over height of a substrate
    5.
    发明授权
    Calibration method and lithographic apparatus for calibrating an optimum take over height of a substrate 有权
    校准方法和光刻设备,用于校准基板的最佳接管高度

    公开(公告)号:US08384882B2

    公开(公告)日:2013-02-26

    申请号:US12580066

    申请日:2009-10-15

    IPC分类号: G03B27/32 G03B27/58

    摘要: A calibration method for calibrating an optimum take over height of a substrate in a lithographic apparatus between a substrate table and an ejector element moveable to load and unload the substrate from the substrate table, the method including clamping the substrate on one of the substrate table and ejector element; moving the ejector element between an unloaded state wherein the substrate is supported by the substrate table and a loaded state wherein the substrate is at least partly supported by the ejector element; determining a reference height of the ejector element at the moment that the weight of the substrate is at least partly taken over between the substrate table and the ejector element; and determining the optimum take over height for the ejector element from the determined reference height.

    摘要翻译: 一种校准方法,用于校准光刻设备中的基板的最佳接管高度,该基板在基板台和顶板元件之间移动,可移动以从基板台装载和卸载基板,该方法包括将基板夹在基板台之一和 喷射元件 在所述衬底被所述衬底台支撑的卸载状态和所述衬底至少部分地被所述顶出器元件支撑的负载状态之间移动所述顶出器元件; 在衬底的重量至少部分地覆盖在衬底台和顶出器元件之间的时刻,确定顶出器元件的基准高度; 以及从所确定的参考高度确定所述喷射器元件的最佳接管高度。

    Method of transferring a substrate, transfer system and lithographic projection apparatus
    6.
    发明授权
    Method of transferring a substrate, transfer system and lithographic projection apparatus 有权
    转印基板,转印系统和光刻投影装置的方法

    公开(公告)号:US08086348B2

    公开(公告)日:2011-12-27

    申请号:US12248290

    申请日:2008-10-09

    IPC分类号: G06F7/00

    摘要: A method is provided for transferring a substrate from a first substrate holder, e.g., a pre-alignment unit, to a second substrate holder, e.g., a substrate table in a lithographic apparatus, by means of a transfer unit on the basis of transfer data available thereto. First, the substrate is provided on the first substrate holder. Subsequently, a position error of the substrate is measured, and positioning adjustment data are calculated based on the position error as measured. Then, the second substrate holder is moved relative to a reference position thereof in accordance with the positioning adjustment data. Finally, the substrate is transferred by means of the transfer unit from the first substrate holder to the second substrate holder in accordance with the transfer data, and placed on the second substrate holder as moved.

    摘要翻译: 提供了一种用于将基板从第一基板保持器(例如,预对准单元)传送到第二基板保持器(例如光刻设备中的基板台)的方法,借助于基于转印数据的转印单元 可用。 首先,将基板设置在第一基板支架上。 随后,测量基板的位置误差,并根据所测量的位置误差来计算定位调整数据。 然后,第二基板支架根据定位调整数据相对于其基准位置移动。 最后,根据传送数据,将基板通过传送单元从第一基板保持器传送到第二基板保持器,并且移动时放置在第二基板保持器上。

    Method of adjusting a height of protrusions on a support surface of a support table, a lithographic projection apparatus, and a support table for supporting an article in a lithographic apparatus
    7.
    发明授权
    Method of adjusting a height of protrusions on a support surface of a support table, a lithographic projection apparatus, and a support table for supporting an article in a lithographic apparatus 有权
    调整支撑台的支撑表面上的突起的高度的方法,光刻投影装置和用于将物品支撑在光刻设备中的支撑台

    公开(公告)号:US07050147B2

    公开(公告)日:2006-05-23

    申请号:US10886050

    申请日:2004-07-08

    IPC分类号: H01J21/27

    摘要: A lithographic projection apparatus is disclosed. The apparatus includes a beam production system configured to provide a beam of radiation, pattern the beam, and project the patterned beam onto a target portion of a substrate, and a support table for supporting an article so that a planar surface of the article lies in a predetermined plane transverse to a propagation direction of the projection beam. The support table has a support surface and an array of protrusions disposed on the support surface that are constructed and arranged to support the article. A position selective material surface melting device is configured to act on individual protrusions when the support table is operable in the apparatus, such that localized areas of an upper surface of the protrusion are melted and subsequently allowed to cool, thereby causing the localized areas to be raised with respect to the upper surface of the protrusion.

    摘要翻译: 公开了一种光刻投影装置。 该装置包括:束生产系统,其被配置为提供辐射束,图案束,并将图案化束投影到基底的目标部分上;以及支撑台,用于支撑制品,使得制品的平坦表面位于 与投影光束的传播方向横切的预定平面。 支撑台具有支撑表面和布置在支撑表面上的突出物阵列,其构造和布置成支撑物品。 位置选择性材料表面熔化装置构造成当支撑台在装置中可操作时作用于单独的突起,使得突起的上表面的局部区域熔化并随后允许冷却,从而使局部区域成为 相对于突起的上表面凸起。