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公开(公告)号:US11894099B2
公开(公告)日:2024-02-06
申请号:US17562560
申请日:2021-12-27
Applicant: Micron Technology, Inc.
Inventor: Kang-Yong Kim , Hyun Yoo Lee , Timothy M. Hollis , Dong Soon Lim
CPC classification number: G11C7/1087 , G06F3/0679 , G06F13/1689 , G11C7/22 , G11C11/4093 , G11C29/022 , G11C29/028 , G11C29/10
Abstract: Described apparatuses and methods enable communication between a host device and a memory device to establish relative delays between different data lines. If data signals propagate along a bus with the same timing, simultaneous switching output (SSO) and crosstalk can adversely impact channel timing budget parameters. An example system includes an interconnect having multiple data lines that couple the host device to the memory device. In example operations, the host device can transmit to the memory device a command indicative of a phase offset between two or more data lines of the multiple data lines. The memory device can implement the command by transmitting or receiving signals via the interconnect with different relative phase offsets between data lines. The host device (e.g., a memory controller) can determine appropriate offsets for a given apparatus. Lengths of the offsets can vary. Further, a system can activate the phase offsets based on frequency.
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公开(公告)号:US11410973B2
公开(公告)日:2022-08-09
申请号:US16939756
申请日:2020-07-27
Applicant: Micron Technology, Inc.
Inventor: Owen R. Fay , Randon K. Richards , Aparna U. Limaye , Dong Soon Lim , Chan H. Yoo , Bret K. Street , Eiichi Nakano , Shijian Luo
IPC: H01L25/065 , H01L25/18 , H01L23/00 , H01L23/552 , H01L23/64 , H01L21/78 , H01L21/66 , H01L25/00 , H01L23/66 , H01Q1/22 , H01Q1/48
Abstract: Disclosed is a microelectronic device assembly comprising a substrate having conductors exposed on a surface thereof. Two or more microelectronic devices are stacked on the substrate, each microelectronic device comprising an active surface having bond pads operably coupled to conductive traces extending over a dielectric material to via locations beyond at least one side of the stack, and vias extending through the dielectric materials at the via locations and comprising conductive material in contact with at least some of the conductive traces of each of the two or more electronic devices and extending to exposed conductors of the substrate. Methods of fabrication and related electronic systems are also disclosed.
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公开(公告)号:US20220068837A1
公开(公告)日:2022-03-03
申请号:US17524473
申请日:2021-11-11
Applicant: Micron Technology, Inc.
Inventor: Owen R. Fay , Dong Soon Lim , Randon K. Richards , Aparna U. Limaye
IPC: H01L23/552 , H01L23/66 , H01L23/31 , H01L21/56 , H01Q1/22
Abstract: Semiconductor devices with antennas and electromagnetic interference (EMI) shielding, and associated systems and methods, are described herein. In one embodiment, a semiconductor device includes a semiconductor die coupled to a package substrate. An antenna structure is disposed over and/or adjacent the semiconductor die. An electromagnetic interference (EMI) shield is disposed between the semiconductor die and the antenna structure to shield at least the semiconductor die from electromagnetic radiation generated by the antenna structure and/or to shield the antenna structure from interference generated by the semiconductor die. A first dielectric material and/or a thermal interface material can be positioned between the semiconductor die and the EMI shield, and a second dielectric material can be positioned between the EMI shield and the antenna structure. In some embodiments, the semiconductor device includes a package molding over at least a portion of the antenna, the EMI shield, and/or the second dielectric material.
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公开(公告)号:US12176061B2
公开(公告)日:2024-12-24
申请号:US18420404
申请日:2024-01-23
Applicant: Micron Technology, Inc.
Inventor: Kang-Yong Kim , Hyun Yoo Lee , Timothy M. Hollis , Dong Soon Lim
Abstract: Described apparatuses and methods enable communication between a host device and a memory device to establish relative delays between different data lines. If data signals propagate along a bus with the same timing, simultaneous switching output (SSO) and crosstalk can adversely impact channel timing budget parameters. An example system includes an interconnect having multiple data lines that couple the host device to the memory device. In example operations, the host device can transmit to the memory device a command indicative of a phase offset between two or more data lines of the multiple data lines. The memory device can implement the command by transmitting or receiving signals via the interconnect with different relative phase offsets between data lines. The host device (e.g., a memory controller) can determine appropriate offsets for a given apparatus. Lengths of the offsets can vary. Further, a system can activate the phase offsets based on frequency.
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公开(公告)号:US20230008292A1
公开(公告)日:2023-01-12
申请号:US17932401
申请日:2022-09-15
Applicant: Micron Technology, Inc.
Inventor: Randon K. Richards , Aparna U. Limaye , Owen R. Fay , Dong Soon Lim
IPC: H01L25/065 , H01L25/18 , H01L23/00 , H01L23/552 , H01L23/64 , H01L21/78 , H01L21/66 , H01L25/00 , H01L23/66 , H01Q1/22 , H01Q1/48
Abstract: Disclosed is a microelectronic device assembly comprising a substrate having conductors exposed on a surface thereof. Two or more microelectronic devices are stacked on the substrate and the components are connected with conductive material in preformed holes in dielectric material in the bond lines aligned with TSVs of the devices and the exposed conductors of the substrate. Methods of fabrication are also disclosed.
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公开(公告)号:US20220375902A1
公开(公告)日:2022-11-24
申请号:US17817690
申请日:2022-08-05
Applicant: Micron Technology, Inc.
Inventor: Owen R. Fay , Randon K. Richards , Aparna U. Limaye , Dong Soon Lim , Chan H. Yoo , Bret K. Street , Eiichi Nakano , Shijian Luo
IPC: H01L25/065 , H01L25/18 , H01L23/00 , H01L23/552 , H01L23/64 , H01L21/78 , H01L21/66 , H01L25/00 , H01L23/66 , H01Q1/22 , H01Q1/48
Abstract: Disclosed is a microelectronic device assembly comprising a substrate having conductors exposed on a surface thereof. Two or more microelectronic devices are stacked on the substrate, each microelectronic device comprising an active surface having bond pads operably coupled to conductive traces extending over a dielectric material to via locations beyond at least one side of the stack, and vias extending through the dielectric materials at the via locations and comprising conductive material in contact with at least some of the conductive traces of each of the two or more electronic devices and extending to exposed conductors of the substrate. Methods of fabrication and related electronic systems are also disclosed.
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7.
公开(公告)号:US20220302090A1
公开(公告)日:2022-09-22
申请号:US17805818
申请日:2022-06-07
Applicant: Micron Technology, Inc
Inventor: Aparna U. Limaye , Dong Soon Lim , Randon K. Richards , Owen R. Fay
IPC: H01L25/065 , H01L25/18 , H01L23/00 , H01L23/552 , H01L23/64 , H01L21/78 , H01L21/66 , H01L25/00 , H01L23/66 , H01Q1/22 , H01Q1/48
Abstract: Disclosed is a microelectronic device assembly comprising a substrate having conductors exposed on a surface thereof. Two or more stacks of microelectronic devices are located on the substrate, and microelectronic devices of the stacks are connected to vertical conductive paths external to the stacks and extending to the substrate and to lateral conductive paths extending between the stacks. Methods of fabrication are also disclosed.
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公开(公告)号:US11177222B2
公开(公告)日:2021-11-16
申请号:US16524989
申请日:2019-07-29
Applicant: Micron Technology, Inc.
Inventor: Owen R. Fay , Dong Soon Lim , Randon K. Richards , Aparna U. Limaye
Abstract: Semiconductor devices with antennas and electromagnetic interference (EMI) shielding, and associated systems and methods, are described herein. In one embodiment, a semiconductor device includes a semiconductor die coupled to a package substrate. An antenna structure is disposed over and/or adjacent the semiconductor die. An electromagnetic interference (EMI) shield is disposed between the semiconductor die and the antenna structure to shield at least the semiconductor die from electromagnetic radiation generated by the antenna structure and/or to shield the antenna structure from interference generated by the semiconductor die. A first dielectric material and/or a thermal interface material can be positioned between the semiconductor die and the EMI shield, and a second dielectric material can be positioned between the EMI shield and the antenna structure. In some embodiments, the semiconductor device includes a package molding over at least a portion of the antenna, the EMI shield, and/or the second dielectric material.
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公开(公告)号:US20240161796A1
公开(公告)日:2024-05-16
申请号:US18420404
申请日:2024-01-23
Applicant: Micron Technology, Inc.
Inventor: Kang-Yong Kim , Hyun Yoo Lee , Timothy M. Hollis , Dong Soon Lim
CPC classification number: G11C7/1087 , G06F3/0679 , G06F13/1689 , G11C7/22 , G11C11/4093 , G11C29/022 , G11C29/028 , G11C29/10
Abstract: Described apparatuses and methods enable communication between a host device and a memory device to establish relative delays between different data lines. If data signals propagate along a bus with the same timing, simultaneous switching output (SSO) and crosstalk can adversely impact channel timing budget parameters. An example system includes an interconnect having multiple data lines that couple the host device to the memory device. In example operations, the host device can transmit to the memory device a command indicative of a phase offset between two or more data lines of the multiple data lines. The memory device can implement the command by transmitting or receiving signals via the interconnect with different relative phase offsets between data lines. The host device (e.g., a memory controller) can determine appropriate offsets for a given apparatus. Lengths of the offsets can vary. Further, a system can activate the phase offsets based on frequency.
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10.
公开(公告)号:US11961825B2
公开(公告)日:2024-04-16
申请号:US17805818
申请日:2022-06-07
Applicant: Micron Technology, Inc.
Inventor: Aparna U. Limaye , Dong Soon Lim , Randon K. Richards , Owen R. Fay
IPC: H01L23/552 , H01L21/66 , H01L21/78 , H01L23/00 , H01L23/64 , H01L23/66 , H01L25/00 , H01L25/065 , H01L25/18 , H01Q1/22 , H01Q1/48
CPC classification number: H01L25/0657 , H01L21/78 , H01L22/12 , H01L23/552 , H01L23/645 , H01L23/66 , H01L24/08 , H01L24/80 , H01L25/0652 , H01L25/18 , H01L25/50 , H01Q1/2283 , H01Q1/48 , H01L2223/6677 , H01L2224/08145 , H01L2224/80895 , H01L2224/80896 , H01L2225/06531 , H01L2225/06537 , H01L2225/06548 , H01L2225/06586 , H01L2225/06589 , H01L2924/1431 , H01L2924/1436 , H01L2924/1443 , H01L2924/14511 , H01L2924/19041 , H01L2924/19042 , H01L2924/19043 , H01L2924/19105 , H01L2924/3025
Abstract: Disclosed is a microelectronic device assembly comprising a substrate having conductors exposed on a surface thereof. Two or more stacks of microelectronic devices are located on the substrate, and microelectronic devices of the stacks are connected to vertical conductive paths external to the stacks and extending to the substrate and to lateral conductive paths extending between the stacks. Methods of fabrication are also disclosed.
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