公开(公告)号：US20220101938A1

公开(公告)日：2022-03-31

申请号：US17549377

申请日：2021-12-13

Applicant: Micron Technology, Inc.

Inventor： Andrea Vigilante ,  Gianluca Scalisi ,  Andrea Pozzato ,  Andrea Salvioni ,  Mauro Luigi Sali

IPC: G11C29/38 ,  G11C29/36 ,  G11C16/04

Abstract: A variety of applications can include systems and methods that include a memory system tester having an analyzer coupled to a test flow controller. The test flow controller can be arranged to generate test signals to a memory system with the analyzer arranged to couple to test pads of a package platform for the memory system. The analyzer can provide data to the test flow controller to conduct testing and/or debugging of the memory system, with the data based on real time monitoring of the test pads of the package platform. In various embodiments, the analyzer can provide data feedback to the test flow controller in real time such that the test flow controller can control the flow of test signals to the memory system in real time. Additional apparatus, systems, and methods are disclosed.

公开(公告)号：US20200211603A1

公开(公告)日：2020-07-02

申请号：US16555508

申请日：2019-08-29

Applicant: Micron Technology, Inc.

Inventor： Xiangang Luo ,  Jianmin Huang ,  Patroclo Fumagalli ,  Scott Anthony Stoller ,  Alessandro Magnavacca ,  Andrea Pozzato

IPC: G11C5/14 ,  G06F11/07 ,  G11C11/4099 ,  G11C29/38

Abstract: Systems and methods are disclosed, including determining whether to write dummy data to a first physical page of memory cells of a storage system, such as in response to a detected asynchronous power loss (APL) at the storage system, using a determined number of zeros in the first physical page.

公开(公告)号：US11670342B2

公开(公告)日：2023-06-06

申请号：US17561787

申请日：2021-12-24

Applicant: Micron Technology, Inc.

Inventor： Xiangang Luo ,  Jianmin Huang ,  Patroclo Fumagalli ,  Scott Anthony Stoller ,  Alessandro Magnavacca ,  Andrea Pozzato

IPC: G11C5/14 ,  G06F11/07 ,  G11C29/38 ,  G11C11/4099

CPC classification number: G11C5/144 ,  G06F11/076 ,  G06F11/079 ,  G11C11/4099 ,  G11C29/38

Abstract: Systems and methods are disclosed, including determining whether to write dummy data to a first physical page of memory cells of a storage system, such as in response to a detected asynchronous power loss (APL) at the storage system, using a determined number of ones stored in the first physical page.

公开(公告)号：US20210098030A1

公开(公告)日：2021-04-01

申请号：US17122531

申请日：2020-12-15

Applicant: Micron Technology, Inc

Inventor： Xiangang Luo ,  Jianmin Huang ,  Patroclo Fumagalli ,  Scott Anthony Stoller ,  Alessandro Magnavacca ,  Andrea Pozzato

IPC: G11C5/14 ,  G06F11/07 ,  G11C29/38 ,  G11C11/4099

Abstract: Systems and methods are disclosed, including determining whether to write dummy data to a first physical page of memory cells of a storage system, such as in response to a detected asynchronous power loss (APL) at the storage system, using a determined number of zeros in the first physical page.

公开(公告)号：US11763908B2

公开(公告)日：2023-09-19

申请号：US17549377

申请日：2021-12-13

Applicant: Micron Technology, Inc.

Inventor： Andrea Vigilante ,  Gianluca Scalisi ,  Andrea Pozzato ,  Andrea Salvioni ,  Mauro Luigi Sali

IPC: G11C29/38 ,  G11C29/36 ,  G11C16/04 ,  G11C16/10 ,  G11C16/14 ,  G11C16/26 ,  G01R31/319 ,  G11C29/12 ,  G01R31/70 ,  G06F11/22 ,  G01R31/27

CPC classification number: G11C29/38 ,  G11C16/0483 ,  G11C29/36 ,  G01R31/275 ,  G01R31/319 ,  G01R31/70 ,  G06F11/221 ,  G11C16/10 ,  G11C16/14 ,  G11C16/26 ,  G11C29/12005 ,  G11C2216/18

Abstract: A variety of applications can include systems and methods that include a memory system tester having an analyzer coupled to a test flow controller. The test flow controller can be arranged to generate test signals to a memory system with the analyzer arranged to couple to test pads of a package platform for the memory system. The analyzer can provide data to the test flow controller to conduct testing and/or debugging of the memory system, with the data based on real time monitoring of the test pads of the package platform. In various embodiments, the analyzer can provide data feedback to the test flow controller in real time such that the test flow controller can control the flow of test signals to the memory system in real time. Additional apparatus, systems, and methods are disclosed.

公开(公告)号：US20220189513A1

公开(公告)日：2022-06-16

申请号：US17561787

申请日：2021-12-24

Applicant: Micron Technology, Inc.

Inventor： Xiangang Luo ,  Jianmin Huang ,  Patroclo Fumagalli ,  Scott Anthony Stoller ,  Alessandro Magnavacca ,  Andrea Pozzato

IPC: G11C5/14 ,  G06F11/07 ,  G11C29/38 ,  G11C11/4099

Abstract: Systems and methods are disclosed, including determining whether to write dummy data to a first physical page of memory cells of a storage system, such as in response to a detected asynchronous power loss (APL) at the storage system, using a determined number of ones stored in the first physical page.

公开(公告)号：US11211136B2

公开(公告)日：2021-12-28

申请号：US16453745

申请日：2019-06-26

Applicant: Micron Technology, Inc.

Inventor： Andrea Vigilante ,  Gianluca Scalisi ,  Andrea Pozzato ,  Andrea Salvioni ,  Mauro Luigi Sali

IPC: G11C29/38 ,  G11C29/36 ,  G11C16/04 ,  G11C16/10 ,  G11C16/14 ,  G11C16/26 ,  G01R31/319 ,  G11C29/12 ,  G01R31/70 ,  G06F11/22 ,  G01R31/27

Abstract: A variety of applications can include systems and methods that include a memory system tester having an analyzer coupled to a test flow controller. The test flow controller can be arranged to generate test signals to a memory system with the analyzer arranged to couple to test pads of a package platform for the memory system. The analyzer can provide data to the test flow controller to conduct testing and/or debugging of the memory system, with the data based on real time monitoring of the test pads of the package platform. In various embodiments, the analyzer can provide data feedback to the test flow controller in real time such that the test flow controller can control the flow of test signals to the memory system in real time. Additional apparatus, systems, and methods are disclosed.

公开(公告)号：US11211100B2

公开(公告)日：2021-12-28

申请号：US17122531

申请日：2020-12-15

Applicant: Micron Technology, Inc.

Inventor： Xiangang Luo ,  Jianmin Huang ,  Patroclo Fumagalli ,  Scott Anthony Stoller ,  Alessandro Magnavacca ,  Andrea Pozzato

IPC: G11C5/14 ,  G11C29/38 ,  G11C11/4099 ,  G06F11/07

Abstract: Systems and methods are disclosed, including determining whether to write dummy data to a first physical page of memory cells of a storage system, such as in response to a detected asynchronous power loss (APL) at the storage system, using a determined number of zeros in the first physical page.