PIEZOELECTRIC CERAMIC AND METHOD OF MANUFACTURING THE SAME
    5.
    发明申请
    PIEZOELECTRIC CERAMIC AND METHOD OF MANUFACTURING THE SAME 审中-公开
    压电陶瓷及其制造方法

    公开(公告)号:US20130164533A1

    公开(公告)日:2013-06-27

    申请号:US13771895

    申请日:2013-02-20

    Abstract: A piezoelectric ceramic having excellent electrical characteristics, and in which all of three crystallographic axes are oriented is obtained by slip cast or sheet forming a ceramic slurry containing plate-shaped ceramic particles in magnetic field. The degree of orientation of a first axis (for example, a c axis) calculated with the Lotgering method based on an X-ray diffraction (XRD) pattern in a prescribed cross-section of this piezoelectric ceramic is not less than 0.30. With a cross-section where the degree of orientation of the first axis indicates a maximum value being defined as a reference plane, the degree of orientation of a second axis (for example, an a axis) calculated with the Lotgering method based on an X-ray diffraction pattern in a cross-section orthogonal to this reference plane is not less than 0.20. The degree of orientation of the second axis is represented by a value in such a cross-section that the degree of orientation of the second axis attains to a maximum value, among cross-sections orthogonal to the reference plane.

    Abstract translation: 通过在磁场中形成含有板状陶瓷颗粒的陶​​瓷浆料的滑移或片材获得具有优异电特性,并且其中所有三个结晶轴取向的压电陶瓷。 以该压电陶瓷的规定截面为基准的X射线衍射(XRD)图案,利用浮法法计算的第一轴(例如c轴)的取向度为0.30以上。 以第一轴的取向度表示被定义为基准面的最大值的横截面,使用基于X的Lotkering方法计算出的第二轴(例如a轴)的取向度 与该参考平面正交的横截面中的射线衍射图案不小于0.20。 在与参考平面正交的横截面中,第二轴的取向度由在第二轴的取向度达到最大值的横截面中的值表示。

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