MANUFACTURING METHOD OF HIGH REFLECTION MIRROR WITH POLYCRYSTALLINE ALUMINUM NITRIDE

    公开(公告)号:US20190172986A1

    公开(公告)日:2019-06-06

    申请号:US16034331

    申请日:2018-07-12

    Abstract: A manufacturing method of a high reflection mirror with polycrystalline aluminum nitride includes (A) providing a polycrystalline aluminum nitride substrate having a polished surface, and utilizing a magnetron sputtering apparatus to react an aluminum target and a plasma formed of nitrogen and argon for forming an aluminum nitride film on the surface of the polycrystalline aluminum nitride substrate, wherein the aluminum nitride film fills into a hole or a gap generated by a lattice defect of the surface of the polycrystalline aluminum nitride substrate; (B) thinning, grinding and polishing the aluminum nitride film for planarizing the polycrystalline aluminum nitride substrate; (C) forming an aluminum coating layer on the aluminum nitride film by a vacuum coating apparatus; (D) forming a sliver coating layer on the aluminum coating layer by another vacuum coating apparatus; and (E) forming a surface-protecting layer on the sliver coating layer.

    METHOD FOR PREPARING ALUMINUM NITRIDE-ZINC OXIDE ULTRAVIOLET DETECTING ELECTRODE

    公开(公告)号:US20210202782A1

    公开(公告)日:2021-07-01

    申请号:US16727846

    申请日:2019-12-26

    Abstract: The present invention adopts an aluminum nitride substrate with great heat dissipation, great thermal conductivity, high electrical insulation, long service life, corrosion resistance, high temperature resistance, and stable physical characteristics. A high-quality zinc oxide film with a wide energy gap is fabricated on the aluminum nitride substrate by magnetron radio frequency (RF) sputtering. Compared with general vapor deposition, chemical vapor deposition and hydrothermal, the magnetron RF sputtering grows the high-quality zinc oxide film with few defects. The zinc oxide film with few defects concentration is an important key technology for short-wavelength optoelectronic devices, which decrease leakage currents of the optoelectronic devices, reduces flicker noise, and further improves its UV-visible rejection ratio.

    Method for Preparing Large-area Catalyst Electrode

    公开(公告)号:US20210123152A1

    公开(公告)日:2021-04-29

    申请号:US17076815

    申请日:2020-10-22

    Abstract: A method for preparing a large-area catalyst electrode includes the following steps: (A) providing an iron compound, a cobalt compound and a nickel compound, and dissolving these metal compounds in a solvent to form a mixed metal compound solution, and (B) providing a cathode and an anode, and performing a cathodic electrochemical deposition to the cathode, the anode and the mixed metal compound solution in a condition of constant voltage or constant current through a two-electrode method, followed by obtaining a catalyst electrode from the cathode. In the method for preparing the large-area catalyst electrode of the present invention, the large-area catalyst electrode having good dual-function water electrolysis catalytic property can be prepared by the steps of preparing the electrolyte, the electrochemical deposition, and the like. The process is simple and energy-saving.

    Method for preparing aluminum nitride-zinc oxide ultraviolet detecting electrode

    公开(公告)号:US11049993B1

    公开(公告)日:2021-06-29

    申请号:US16727846

    申请日:2019-12-26

    Abstract: The present invention adopts an aluminum nitride substrate with great heat dissipation, great thermal conductivity, high electrical insulation, long service life, corrosion resistance, high temperature resistance, and stable physical characteristics. A high-quality zinc oxide film with a wide energy gap is fabricated on the aluminum nitride substrate by magnetron radio frequency (RF) sputtering. Compared with general vapor deposition, chemical vapor deposition and hydrothermal, the magnetron RF sputtering grows the high-quality zinc oxide film with few defects. The zinc oxide film with few defects concentration is an important key technology for short-wavelength optoelectronic devices, which decrease leakage currents of the optoelectronic devices, reduces flicker noise, and further improves its UV-visible rejection ratio.

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