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公开(公告)号:US20240038831A1
公开(公告)日:2024-02-01
申请号:US17878758
申请日:2022-08-01
Applicant: QUALCOMM Incorporated
Inventor: Ryan LANE , Charles David PAYNTER , Durodami LISK , Darko POPOVIC , Yue LI , Shree Krishna PANDEY
IPC: H01L49/02 , H01L23/522
CPC classification number: H01L28/91 , H01L23/5223 , H01L24/16
Abstract: A package comprising a substrate and an integrated device. The substrate includes a core layer comprising a first surface and a second surface; a plurality of core interconnects located in the core layer; at least one first dielectric layer coupled to the first surface of the core layer; a first plurality of interconnects located in the at least one first dielectric layer; at least one second dielectric layer coupled to the second surface of the core layer; a second plurality of interconnects located in the at least one second dielectric layer; and a capacitor structure located in the core layer. The capacitor structure includes a first trench capacitor device comprising a first front side and a first back side; and a second trench capacitor device coupled to the first trench capacitor device, where the second trench capacitor device comprises a second front side and a second back side.
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公开(公告)号:US20250069965A1
公开(公告)日:2025-02-27
申请号:US18456295
申请日:2023-08-25
Applicant: QUALCOMM Incorporated
Inventor: Ryan LANE , Charles David PAYNTER , William STONE , Ahmer SYED , Yue LI , Kuiwon KANG , Wei WANG , Durodami LISK
Abstract: A package comprising an integrated device and a substrate coupled to the integrated device through at least a plurality of solder interconnects. The substrate comprises at least one dielectric layer; a frame at least partially located in the at least one dielectric layer; and a plurality of interconnects located at least partially in the at least one dielectric layer. The frame may be an embedded frame.
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公开(公告)号:US20240072032A1
公开(公告)日:2024-02-29
申请号:US17894043
申请日:2022-08-23
Applicant: QUALCOMM Incorporated
Inventor: Yanmei SONG , William STONE , Jianwen XU , Senthil SIVASWAMY , John HOLMES , Ryan LANE
IPC: H01L25/00 , H01L21/48 , H01L23/00 , H01L23/538 , H01L25/065 , H01L25/18
CPC classification number: H01L25/50 , H01L21/4853 , H01L21/4857 , H01L23/5389 , H01L24/05 , H01L24/16 , H01L24/19 , H01L24/20 , H01L24/24 , H01L24/73 , H01L24/81 , H01L24/82 , H01L24/92 , H01L24/95 , H01L25/0652 , H01L25/0657 , H01L25/18 , H01L27/016 , H01L2224/0557 , H01L2224/16145 , H01L2224/19 , H01L2224/211 , H01L2224/214 , H01L2224/224 , H01L2224/24155 , H01L2224/73209 , H01L2224/81815 , H01L2224/821 , H01L2224/92124 , H01L2225/06513 , H01L2225/06524
Abstract: A package comprising a first metallization portion, a first integrated device coupled to the first metallization portion through a first plurality of pillar interconnects, and a first chiplet located between the first integrated device and the first metallization portion. The first chiplet is coupled to the first integrated device through a first plurality of inter pillar interconnects. The first chiplet may include an active chiplet. The first chiplet may include a passive chiplet.
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公开(公告)号:US20220392867A1
公开(公告)日:2022-12-08
申请号:US17339830
申请日:2021-06-04
Applicant: QUALCOMM Incorporated
Inventor: Li-Sheng WENG , Charles David PAYNTER , Ryan LANE , Jianwen XU , William STONE
IPC: H01L23/00 , H01L23/498 , H01L23/538 , H01L25/10 , H01L21/48 , H01L21/56 , H01L23/31
Abstract: A package comprising a first integrated device comprising a plurality of first pillar interconnects; an encapsulation layer at least partially encapsulating the first integrated device; a metallization portion located over the first integrated device and the encapsulation layer, wherein the metallization portion includes at least one passivation layer and a plurality of metallization layer interconnects, wherein the plurality of first pillar interconnects is coupled to the plurality of metallization layer interconnects; and a second integrated device comprising a plurality of second pillar interconnects, wherein the second integrated device is coupled to the plurality of metallization layer interconnects through a plurality of second pillar interconnects and a plurality of solder interconnects.
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公开(公告)号:US20210307218A1
公开(公告)日:2021-09-30
申请号:US17071408
申请日:2020-10-15
Applicant: QUALCOMM Incorporated
Inventor: Charles David PAYNTER , Ryan LANE , John EATON , Amit MANO
Abstract: A device that includes a board, a package and a patch substrate. The board includes a cavity. The package is coupled to a first side of the board. The package includes a substrate and an integrated device coupled to the substrate. The integrated device is located at least partially in the cavity of the board. The patch substrate is coupled to a second side of the board. The patch substrate is located over the cavity of the board. The patch substrate is configured as an electromagnetic interference (EMI) shield for the package.
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公开(公告)号:US20250062285A1
公开(公告)日:2025-02-20
申请号:US18451971
申请日:2023-08-18
Applicant: QUALCOMM Incorporated
Inventor: Yue LI , Ryan LANE , Yangyang SUN , Charles David PAYNTER , Durodami LISK
IPC: H01L25/065 , H01L23/00 , H01L23/498 , H01L23/538 , H01L25/00 , H01L25/16
Abstract: A stacked integrated circuit (IC) device includes a first die having a first face, a first active region adjacent to the first face, and first die-interconnect contacts disposed on the first face and connected to first circuitry. The stacked IC device includes a second die having a second face, a second active region adjacent to the second face, and second die-interconnect contacts disposed on the second face and connected to second circuitry. The first face is oriented toward the second face, and the first die-interconnect contacts are connected to the second die-interconnect contacts. The stacked IC device includes a set of redistribution layers electrically connected to redistribution contacts on the first face, the second face, or both. The stacked IC device also includes interconnect conductors connected to the redistribution layers to provide signal paths from the first die, the second die, or both, to a set of external contacts.
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公开(公告)号:US20210375845A1
公开(公告)日:2021-12-02
申请号:US16885171
申请日:2020-05-27
Applicant: QUALCOMM Incorporated
Inventor: William Michael STONE , Ryan LANE , Ahmer Raza SYED
IPC: H01L25/18 , H01L23/498 , H01L23/00 , H01L21/56
Abstract: An integrated circuit (IC) package is described. The IC package includes a package die and die interconnects on an active surface of the package die. The IC package also includes an integrated passive device (IPD) coupled to the active surface of the package die, between the plurality of die interconnects. A portion of the IPD extends beyond a Z-height of the die interconnects. The IC package further includes a package substrate coupled to the die interconnects, the package substrate having a cavity to receive the portion of the IPD.
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公开(公告)号:US20210296246A1
公开(公告)日:2021-09-23
申请号:US17017361
申请日:2020-09-10
Applicant: QUALCOMM Incorporated
Inventor: Ryan LANE , Li-Sheng WENG , Charles David PAYNTER , Eric David FORONDA
IPC: H01L23/538 , H01L25/065 , H01L25/00
Abstract: A package comprising a substrate, an integrated device, and an interconnect integrated device. The substrate includes a first surface and a second surface. The substrate further includes a plurality of interconnects. The integrated device is coupled to the substrate. The interconnect integrated device is coupled to a surface of the substrate. The integrated device, the interconnect integrated device and the substrate are configured to provide an electrical path for an electrical signal of the integrated device, that travels through at least the substrate, then through the interconnect integrated device and back through the substrate.
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公开(公告)号:US20250096207A1
公开(公告)日:2025-03-20
申请号:US18470344
申请日:2023-09-19
Applicant: QUALCOMM Incorporated
Inventor: Yue LI , Durodami LISK , Ryan LANE , Darko POPOVIC
IPC: H01L25/10 , H01L23/00 , H01L23/31 , H01L23/498 , H01L23/538
Abstract: A package comprising a first metallization portion; a first integrated device coupled to the first metallization portion; a bridge coupled to the first metallization portion; an encapsulation layer coupled to the first metallization portion; a second metallization portion coupled to the bridge and the encapsulation layer, such that the first integrated device, the bridge and the encapsulation layer are located between the first metallization portion and the second metallization portion, and a second integrated device coupled to the second metallization portion, wherein the second integrated device and the bridge at least partially vertically overlap.
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公开(公告)号:US20240421128A1
公开(公告)日:2024-12-19
申请号:US18335532
申请日:2023-06-15
Applicant: QUALCOMM Incorporated
Inventor: Yangyang SUN , Yi-Hang LIN , Dongming HE , Lily ZHAO , Ryan LANE
IPC: H01L25/065 , H01L21/56 , H01L23/00 , H01L23/31 , H01L23/48 , H01L23/498 , H01L27/02
Abstract: Disclosed is a semiconductor device. In an aspect, a semiconductor device includes: a first-tier passive device including a substrate portion, a passive device portion, and a metallization portion disposed in a stacked configuration; and one or more second-tier passive devices disposed over the first-tier passive device. Each one of the one or more second-tier passive devices includes: a substrate portion, a passive device portion, and a metallization portion disposed in a stacked configuration; and a set of through substrate vias (TSVs) passing through a corresponding substrate portion and electrically coupled to a corresponding metallization portion. The semiconductor device comprises a passive component including the passive device portion of the first-tier passive device electrically coupled to one or more passive device portions of the one or more second-tier passive devices through the metallization portions of the first-tier passive device and the one or more second-tier passive devices.
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