Trench device structure and fabrication
    6.
    发明授权
    Trench device structure and fabrication 有权
    沟槽装置结构和制造

    公开(公告)号:US08575688B2

    公开(公告)日:2013-11-05

    申请号:US13197168

    申请日:2011-08-03

    IPC分类号: H01L29/78

    摘要: A vertical-current-flow device includes a trench which includes an insulated gate and which extends down into first-conductivity-type semiconductor material. A phosphosilicate glass layer is positioned above the insulated gate and a polysilicon layer is positioned above the polysilicate glass layer. Source and body diffusions of opposite conductivity types are positioned adjacent to a sidewall of the trench. A drift region is positioned to receive majority carriers which have been injected by the source, and which have passed through the body diffusion. A drain region is positioned to receive majority carriers which have passed through the drift region. The gate is capacitively coupled to control inversion of a portion of the body region. As an alternative, a dielectric layer may be used in place of the doped glass where permanent charge is positioned in the dielectric layer.

    摘要翻译: 垂直电流装置包括沟槽,该沟槽包括绝缘栅极并向下延伸到第一导电型半导体材料中。 磷硅酸盐玻璃层位于绝缘栅极之上,多晶硅层位于聚硅酸盐玻璃层之上。 相反导电类型的源极和体扩散定位成与沟槽的侧壁相邻。 漂移区域被定位成接收已经被源注入并已经通过身体扩散的多数载体。 漏极区域被定位成接收已经通过漂移区域的多数载流子。 栅极电容耦合以控制身体区域的一部分的反转。 作为替代,可以使用电介质层代替在电介质层中定位永久电荷的掺杂玻璃。

    TRENCH DEVICE STRUCTURE AND FABRICATION
    7.
    发明申请
    TRENCH DEVICE STRUCTURE AND FABRICATION 有权
    TRENCH设备结构和制造

    公开(公告)号:US20120098056A1

    公开(公告)日:2012-04-26

    申请号:US13197168

    申请日:2011-08-03

    IPC分类号: H01L29/78 H01L21/28

    摘要: A vertical-current-flow device includes a trench which includes an insulated gate and which extends down into first-conductivity-type semiconductor material. A phosphosilicate glass layer is positioned above the insulated gate and a polysilicon layer is positioned above the polysilicate glass layer. Source and body diffusions of opposite conductivity types are positioned adjacent to a sidewall of the trench. A drift region is positioned to receive majority carriers which have been injected by the source, and which have passed through the body diffusion. A drain region is positioned to receive majority carriers which have passed through the drift region. The gate is capacitively coupled to control inversion of a portion of the body region. As an alternative, a dielectric layer may be used in place of the doped glass where permanent charge is positioned in the dielectric layer.

    摘要翻译: 垂直电流装置包括沟槽,该沟槽包括绝缘栅极并向下延伸到第一导电型半导体材料中。 磷硅酸盐玻璃层位于绝缘栅极之上,多晶硅层位于聚硅酸盐玻璃层之上。 相反导电类型的源极和体扩散定位成与沟槽的侧壁相邻。 漂移区域被定位成接收已经被源注入并已经通过身体扩散的多数载体。 漏极区域被定位成接收已经通过漂移区域的多数载流子。 栅极电容耦合以控制身体区域的一部分的反转。 作为替代,可以使用电介质层代替在电介质层中定位永久电荷的掺杂玻璃。