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公开(公告)号:US11495467B2
公开(公告)日:2022-11-08
申请号:US17115313
申请日:2020-12-08
Applicant: SEMES CO., LTD.
Inventor: Jung Suk Goh , Jae Seong Lee , Do Youn Lim , Kuk Saeng Kim , Young Dae Chung , Tae Shin Kim , Jee Young Lee , Won Geun Kim , Ji Hoon Jeong , Kwang Sup Kim , Pil Kyun Heo , Yoon Ki Sa , Ye Rim Yeon , Hyun Yoon , Do Yeon Kim , Yong Jun Seo , Byeong Geun Kim , Young Je Um
IPC: H01L21/26 , H01L21/311 , H01L21/67 , H01L21/66
Abstract: Method and apparatus for etching a thin layer including silicon nitride formed on a substrate are disclosed. Etchant including phosphoric acid and water is supplied on the substrate so that a liquid layer is formed on the substrate. The thin layer is etched by reaction between the thin layer and the etchant. Thickness of the liquid layer is measured to detect variation in the thickness of the liquid layer while etching the thin layer. Variation in the concentration of the phosphoric acid and the water is calculated based on the variation in the thickness of the liquid layer. Water is supplied on the substrate based on the variation in the concentration of the phosphoric acid and the water so that the concentration of the phosphoric acid and the water becomes a predetermined value.
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公开(公告)号:US11887866B2
公开(公告)日:2024-01-30
申请号:US16657983
申请日:2019-10-18
Applicant: SEMES CO., LTD.
Inventor: Jae Seong Lee , Hae Won Choi , Ki Hoon Choi , Anton Koriakin , Chan Young Heo , Do Heon Kim , Ji Soo Jeon
CPC classification number: H01L21/67028 , B08B3/04 , H01L21/67126
Abstract: A supercritical processing apparatus includes an upper vessel including a first fluid hole formed in a center thereof, and a lower vessel including a second fluid hole formed in a center thereof. A space is defined between the upper and lower vessels and configured to allow a substrate to be placed therein. The upper vessel further includes a first guide portion provided at a lower portion thereof to be gradually inclined downward toward a periphery thereof from the first fluid hole.
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