摘要:
An electronic device configured to generate a verification vector for verifying a semiconductor circuit including a first circuit block and a second circuit block includes a duplicate command eliminator configured to receive a first input vector including a plurality of commands and to provide a first converted vector, in which ones of the plurality of commands that generate the same state transition are changed into idle commands, based on a state transition of the first circuit block obtained by performing a simulation operation on the first input vector, a reduced vector generator configured to provide a first reduced vector in which a number of repetitions of the idle commands included in the first converted vector is reduced, and a verification vector generator configured to output the first reduced vector having a coverage that coincides with a target coverage among a plurality of first reduced vectors as a first verification vector.
摘要:
A semiconductor memory device performs a modified read operation or a modified write operation. The semiconductor memory device includes a memory cell array, a read circuit, and a write circuit. The semiconductor memory device further includes an operation unit performing an operation on read data obtained by the read circuit according to operation assignment information applied through an address line to reduce memory access time when entering a modified read mode. In addition, the semiconductor memory device may optionally manage a normal read mode and the modified read mode and allow operation result data output from the operation unit to be written by the write circuit in the modified read mode.
摘要:
An electronic device configured to generate a verification vector for verifying a semiconductor circuit including a first circuit block and a second circuit block includes a duplicate command eliminator configured to receive a first input vector including a plurality of commands and to provide a first converted vector, in which ones of the plurality of commands that generate the same state transition are changed into idle commands, based on a state transition of the first circuit block obtained by performing a simulation operation on the first input vector, a reduced vector generator configured to provide a first reduced vector in which a number of repetitions of the idle commands included in the first converted vector is reduced, and a verification vector generator configured to output the first reduced vector having a coverage that coincides with a target coverage among a plurality of first reduced vectors as a first verification vector.
摘要:
A test method of the semiconductor memory device including a memory cell array and an anti-fuse array includes detecting failed cells included in the memory cell array; determining a fail address corresponding to the detected failed cells; storing the determined fail address in a first region of the memory cell array; and reading the fail address stored in the first region to program the read fail address in the anti-fuse array. According to the test method of a semiconductor memory device and the semiconductor memory system, since the test operation can be performed without an additional memory for storing an address, the semiconductor memory device and the test circuit can be embodied by a small area.
摘要:
A bad page management system is provided to guarantee a yield of a volatile semiconductor memory device such as a DRAM. A bad page list exists in a DRAM. A page remapper in a memory controller performs a page remapping operation in parallel with a normal operation of a scheduling unit to perform a latency overhead hidden function. A chip size of the DRAM is reduced or minimized. A DRAM controller performs a latency overhead hidden function to control a DRAM.
摘要:
A memory device including: a memory cell array including a plurality of memory cell rows; an address buffer configured to store addresses of target rows of the plurality of memory cell rows, wherein the addresses of the target rows have been repeatedly accessed; a minimum access output circuit configured to select, when there are a plurality of rows having a same minimum access count among the target rows, any one of the plurality of rows having the same minimum access count as a minimum access row based on a selection command value, and to output an index value of the minimum access row; and a control circuit configured to output a command instructing replacement of an address corresponding to the index value of the minimum access row with an address of an access row and storage of the address of the access row in the address buffer.
摘要:
A semiconductor memory cell array is provided which includes a first memory cell array area including first group memory cells arranged in a chip in a matrix of rows and columns and having a first operating speed; and a second memory cell array area including second group memory cells arranged in the chip in a matrix of rows and columns and having a second operating speed different from the first operating speed. The first and second memory cell array areas are accessed by addressing of a DRAM controller.