Organic semiconductor device and method of fabricating the same
    2.
    发明申请
    Organic semiconductor device and method of fabricating the same 审中-公开
    有机半导体器件及其制造方法

    公开(公告)号:US20070126001A1

    公开(公告)日:2007-06-07

    申请号:US11497057

    申请日:2006-08-01

    IPC分类号: H01L29/08

    摘要: An organic semiconductor device and a method of fabricating the same are provided. The device includes: a first electrode; an electron channel layer formed on the first electrode; and a second electrode formed on the electron channel layer, wherein the electron channel layer comprises: a lower organic layer formed on the first electrode; a nano-particle layer formed on the lower organic layer and including predetermined sizes of nano-particles that are spaced a predetermined distance apart from each other; and an upper organic layer formed over the nano-particle layer. Accordingly, a highly integrated organic semiconductor device can be fabricated by a simple fabrication process, and nonuniformity of devices due to threshold voltage characteristics and downsizing of the device can resolved, so that a semiconductor device having excellent performance can be implemented.

    摘要翻译: 提供一种有机半导体器件及其制造方法。 该装置包括:第一电极; 形成在第一电极上的电子通道层; 以及形成在所述电子通道层上的第二电极,其中所述电子通道层包括:形成在所述第一电极上的下部有机层; 形成在下部有机层上并且包括彼此间隔开预定距离的预定尺寸的纳米颗粒的纳米颗粒层; 和在纳米颗粒层上形成的上部有机层。 因此,可以通过简单的制造工艺制造高度集成的有机半导体器件,并且可以解决由于阈值电压特性而导致的器件的不均匀性和器件的小型化,从而可以实现具有优异性能的半导体器件。

    Method and apparatus for measuring isoelectric point using field effect transistor
    5.
    发明授权
    Method and apparatus for measuring isoelectric point using field effect transistor 失效
    使用场效应晶体管测量等电点的方法和装置

    公开(公告)号:US08628650B2

    公开(公告)日:2014-01-14

    申请号:US13058120

    申请日:2008-12-16

    IPC分类号: B03C5/02

    CPC分类号: G01N27/4145

    摘要: Provided are a method and apparatus for measuring an isoelectric point using a field effect transistor. The method includes providing a field effect transistor including a substrate, source and drain electrodes disposed on the substrate and spaced apart from each other, and a channel region between the source and drain electrodes, providing a first electrolyte solution having a first concentration to the channel region of the field effect transistor and measuring a first current value of the channel region between the source and drain electrodes, providing a second electrolyte solution having a second concentration greater than the first concentration and measuring a second current value of the channel region between the source and drain electrodes, and determining the isoelectric point of the field effect transistor or a material disposed on the field effect transistor using a difference between the first and second current values.

    摘要翻译: 提供了使用场效应晶体管测量等电点的方法和装置。 该方法包括提供场效应晶体管,该场效应晶体管包括衬底,设置在衬底上的源电极和漏极彼此间隔开的沟道区,以及在源电极和漏电极之间的沟道区域,提供具有第一浓度到沟道的第一电解质溶液 区域,并且测量源极和漏极之间的沟道区的第一电流值,提供具有大于第一浓度的第二浓度的第二电解质溶液,并测量源极之间的沟道区的第二电流值 和漏电极,并且使用第一和第二电流值之间的差来确定场效应晶体管的等电点或设置在场效应晶体管上的材料。

    METHOD AND APPARATUS FOR MEASURING ISOELECTRIC POINT USING FIELD EFFECT TRANSISTOR
    6.
    发明申请
    METHOD AND APPARATUS FOR MEASURING ISOELECTRIC POINT USING FIELD EFFECT TRANSISTOR 失效
    使用场效应晶体管测量电压点的方法和装置

    公开(公告)号:US20110139637A1

    公开(公告)日:2011-06-16

    申请号:US13058120

    申请日:2008-12-16

    IPC分类号: G01N27/403 G01N27/414

    CPC分类号: G01N27/4145

    摘要: Provided are a method and apparatus for measuring an isoelectric point using a field effect transistor. The method includes providing a field effect transistor including a substrate, source and drain electrodes disposed on the substrate and spaced apart from each other, and a channel region between the source and drain electrodes, providing a first electrolyte solution having a first concentration to the channel region of the field effect transistor and measuring a first current value of the channel region between the source and drain electrodes, providing a second electrolyte solution having a second concentration greater than the first concentration and measuring a second current value of the channel region between the source and drain electrodes, and determining as the isoelectric point of the field effect transistor or a material disposed on the field effect transistor using a difference between the first and second current values.

    摘要翻译: 提供了使用场效应晶体管测量等电点的方法和装置。 该方法包括提供场效应晶体管,该场效应晶体管包括衬底,设置在衬底上的源电极和漏极彼此间隔开的沟道区,以及在源电极和漏电极之间的沟道区域,提供具有第一浓度到沟道的第一电解质溶液 区域,并且测量源极和漏极之间的沟道区的第一电流值,提供具有大于第一浓度的第二浓度的第二电解质溶液,并测量源极之间的沟道区的第二电流值 和漏电极,并且使用第一和第二电流值之间的差来确定场效应晶体管的等电点或设置在场效应晶体管上的材料。

    Semiconductor nanowire sensor device and method for manufacturing the same
    10.
    发明授权
    Semiconductor nanowire sensor device and method for manufacturing the same 有权
    半导体纳米线传感器装置及其制造方法

    公开(公告)号:US08241939B2

    公开(公告)日:2012-08-14

    申请号:US12682571

    申请日:2008-07-24

    IPC分类号: H01L21/00 H01L29/06

    摘要: A method for manufacturing a biosensor includes forming a silicon nanowire channel, etching a first conductivity-type single crystalline silicon layer which is a top layer of a Silicon-On-Insulator (SOI) substrate to form a first conductivity-type single crystalline silicon line pattern, doping both sidewalls of the first conductivity-type single crystalline silicon line pattern with impurities of a second conductivity-type opposite to the first conductivity-type to form a second conductivity-type channel, forming second conductivity-type pads for forming electrodes at both ends of the first conductivity-type single crystalline silicon line pattern, forming, in an undoped region of the first conductivity-type single crystalline silicon line pattern, a first electrode for applying a reverse-bias voltage to insulate the first conductivity-type single crystalline silicon line pattern and the second conductivity-type channel from each other, and forming second electrodes for applying a bias voltage across the second conductivity-type channel on the second conductivity-type pad.

    摘要翻译: 制造生物传感器的方法包括形成硅纳米线通道,蚀刻作为绝缘体上硅(SOI)衬底的顶层的第一导电型单晶硅层,以形成第一导电型单晶硅线 以与第一导电类型相反的第二导电类型的杂质掺杂第一导电型单晶硅线图案的两个侧壁以形成第二导电型沟道,形成第二导电型垫,用于在 第一导电型单晶硅线图案的两端,在第一导电型单晶硅线图案的未掺杂区域中形成用于施加反向偏置电压以使第一导电型单晶硅线型图案绝缘的第一电极 晶体硅线图案和第二导电型沟道,并且形成用于施加双面的第二电极 在第二导电型垫上的第二导电类型沟道上的电压。