Method of Reducing Electromigration of Silver and Article Made Thereby
    8.
    发明申请
    Method of Reducing Electromigration of Silver and Article Made Thereby 审中-公开
    从而减少银和电镀的方法

    公开(公告)号:US20130220682A1

    公开(公告)日:2013-08-29

    申请号:US13881571

    申请日:2011-10-28

    IPC分类号: H05K1/03

    CPC分类号: H05K1/0306 C03C17/38

    摘要: A method includes: providing a silver-containing conductive member disposed on a portion of a surface of chemically-strengthened glass, wherein the conductive member comprises silver; disposing a layer comprising a curable polysilazane onto at least a portion of the conductive member and at least a portion of the surface of the chemically-strengthened glass adjacent to the conductive member; and curing the curable polysilazane. Electronic devices prepared according to the method are also disclosed.

    摘要翻译: 一种方法包括:提供设置在化学强化玻璃的表面的一部分上的含银导电构件,其中所述导电构件包括银; 将包含可固化聚硅氮烷的层设置在所述导电构件的至少一部分和所述化学强化玻璃的与所述导电构件相邻的表面的至少一部分; 并固化可固化聚硅氮烷。 还公开了根据该方法制备的电子器件。