LOW-DROPOUT (LDO) REGULATOR WITH A FEEDBACK CIRCUIT

    公开(公告)号:US20240036597A1

    公开(公告)日:2024-02-01

    申请号:US17877115

    申请日:2022-07-29

    IPC分类号: G05F1/575 G05F1/565

    CPC分类号: G05F1/575 G05F1/565

    摘要: A voltage regulator circuit is provided. The voltage regulator circuit includes a voltage regulator configured to provide an output voltage at an output terminal. A plurality of macros are connectable at a plurality of connection nodes of a connector connected to the output terminal of the voltage regulator. A feedback circuit having a plurality of feedback loops is connectable to the plurality of connection nodes. The feedback loop of the plurality of feedback loops, when connected to a connection node of the plurality of connection nodes, is configured to provide an instantaneous voltage of the connection node as a feedback to the voltage regulator. The voltage regulator is configured, in response to the instantaneous voltage, regulate the output voltage to maintain the instantaneous voltage of the connection node approximately equal to a reference voltage.

    Memory cell array circuit and method of forming the same

    公开(公告)号:US11735263B2

    公开(公告)日:2023-08-22

    申请号:US17871144

    申请日:2022-07-22

    IPC分类号: G11C13/00

    摘要: A method of operating a memory circuit includes generating a first voltage by a first amplifier circuit of a first driver circuit coupled to a first column of memory cells, and generating a first current in response to the first voltage. The first current includes a first set of leakage currents and a first write current. The method further includes generating, by a tracking circuit, a second set of leakage currents configured to track the first set of leakage currents of the first column of memory cells, and mirroring the first current in a first path with a second current in a second path by a first current mirror. The second current includes the second set of leakage currents and a second write current. The first write current corresponds to the second write current. The first set of leakage currents corresponds to the second set of leakage currents.

    Latch
    9.
    发明授权
    Latch 有权

    公开(公告)号:US11641193B2

    公开(公告)日:2023-05-02

    申请号:US17815322

    申请日:2022-07-27

    IPC分类号: H03K3/356

    摘要: A circuit includes cross coupled invertors including a first invertor and a second inventor. The first invertor and the second invertor are cross coupled at a first data node and a second data node. An input unit is coupled between the cross-coupled invertors and a power node. The input unit controls the cross-coupled invertors in response to a first input signal received at a first input terminal of the input unit and a second input signal received at a second input terminal of the input unit. A first transistor is connected between the power node and a supply node. The first transistor connects the power node to the supply node in response to an enable signal changing to a first value. A second transistor is connected between the power node and ground. The second transistor connects the power node to the ground in response to the enable signal changing to a second value.

    Back-up and restoration of register data

    公开(公告)号:US11636884B2

    公开(公告)日:2023-04-25

    申请号:US17587610

    申请日:2022-01-28

    发明人: Yu-Der Chih

    摘要: A system includes: a processor; a register configured to store a plurality of words, non-volatile memory having a plurality of cells, each cell corresponding to one of the words of the register, and wherein the each cell of the plurality of cells are set to an initial reset value; a first controller that in response to a loss in power: determines the word stored by the register; and changes the initial reset value of the cell of the non-volatile memory corresponding to the determined word stored by the register to a set value; a second controller that in response to detecting a restoration in power: identifies the cell having the set value; writes the word corresponding to the identified cell to the register; and resets the cells of the non-volatile memory to the initial reset value.