Positive photoresist compositions with o-quinone diazide, novolak and
propylene glycol alkyl ether acetate
    2.
    发明授权
    Positive photoresist compositions with o-quinone diazide, novolak and propylene glycol alkyl ether acetate 失效
    具有邻醌二叠氮基,酚醛清漆和丙二醇烷基醚乙酸酯的正性光致抗蚀剂组合物

    公开(公告)号:US5143814A

    公开(公告)日:1992-09-01

    申请号:US772976

    申请日:1991-10-08

    IPC分类号: G03F7/004 G03F7/022 G03F7/16

    摘要: The invention provides a method for producing a positive working photosensitive element with increased photospeed which comprises coating a formulation containing at least one novolak or polyvinyl phenol resin, at least one o-quinone diazide and a propylene glycol alkyl ether acetate on a substrate, drying, exposing to imaging energy and developing.

    摘要翻译: 本发明提供一种用于生产具有增加的感光速度的正性感光元件的方法,该方法包括在基材上涂布含有至少一种酚醛清漆或聚乙烯基苯酚树脂,至少一种邻醌二叠氮化物和丙二醇烷基醚乙酸酯的制剂, 暴露于成像能量和发展。

    Aqueous developable poly(olefin sulfone) terpolymers
    5.
    发明授权
    Aqueous developable poly(olefin sulfone) terpolymers 失效
    水性可显影聚(烯烃砜)三元共聚物

    公开(公告)号:US4341861A

    公开(公告)日:1982-07-27

    申请号:US219517

    申请日:1980-12-23

    IPC分类号: G03F7/039 G03F7/10

    CPC分类号: G03F7/039

    摘要: This invention relates to novel terpolymers of 3-methylcyclopentene, 2-cyclopentene-1-acetic acid and sulfur dioxide. Positive electron beam resist media prepared from the subject terpolymers possesses excellent sensitivity and development latitude and unexpectedly are developable with conventional aqueous alkaline developers.

    摘要翻译: 本发明涉及3-甲基环戊烯,2-环戊烯-1-乙酸和二氧化硫的新型三元共聚物。 从受试三元共聚物制备的正电子束抗蚀剂介质具有优异的灵敏度和开发自由度,并且意想不到地用常规水性碱性显影剂显影。

    Positive radiation sensitive resist terpolymer from omega alkynoic acid
    6.
    发明授权
    Positive radiation sensitive resist terpolymer from omega alkynoic acid 失效
    来自ω-炔酸的抗辐射敏感抗性三聚物

    公开(公告)号:US4405776A

    公开(公告)日:1983-09-20

    申请号:US396663

    申请日:1982-07-09

    IPC分类号: C08G75/22 G03F7/039

    CPC分类号: G03F7/039 C08G75/22

    摘要: This invention relates to novel terpolymers of 3-methylcyclopentene, an omega alkynoic acid and sulfur dioxide. Positive radiation sensitive films prepared from the subject terpolymers adhere well to the substrate, demonstrate resistance to cracking and erosion during development and possess excellent edge definition.

    摘要翻译: 本发明涉及3-甲基环戊烯,ω-炔酸和二氧化硫的新型三元共聚物。 从主题三聚体制备的正性辐射敏感膜很好地粘附到基材上,在显影过程中表现出抗裂纹和侵蚀性,并且具有优异的边界定义。

    Positive radiation sensitive resist terpolymers
    7.
    发明授权
    Positive radiation sensitive resist terpolymers 失效
    正辐射敏感抗蚀剂三元共聚物

    公开(公告)号:US4355094A

    公开(公告)日:1982-10-19

    申请号:US244104

    申请日:1981-03-16

    CPC分类号: C08G75/22 G03F7/039

    摘要: This invention relates to novel terpolymers of 3-methylcyclopentene, an omega alkynoic acid and sulfur dioxide. Positive radiation sensitive films prepared from the subject terpolymers adhere well to the substrate, demonstrate resistance to cracking and erosion during development and possess excellent edge definition.

    摘要翻译: 本发明涉及3-甲基环戊烯,ω-炔酸和二氧化硫的新型三元共聚物。 从主题三聚体制备的正性辐射敏感膜很好地粘附到基材上,在显影过程中表现出抗裂纹和侵蚀性,并且具有优异的边界定义。

    Photolithography over reflective substrates comprising a titanium
nitride layer
    8.
    发明授权
    Photolithography over reflective substrates comprising a titanium nitride layer 失效
    在包含氮化钛层的反射衬底上进行光刻

    公开(公告)号:US4810619A

    公开(公告)日:1989-03-07

    申请号:US84464

    申请日:1987-08-12

    IPC分类号: G03F7/09 G03C5/18

    CPC分类号: G03F7/091

    摘要: For fine line lithography of a reflective substrate, a layer of titanium nitride is applied between the reflective surface and the photoresist that is absorbant at the wavelength of light used to expose the photoresist. The resolution of the photoresist is improved, even when an absorbant dye is used in the photoresist. The titanium nitride can be readily removed at the same time as the reflective layer is patterned, thereby avoiding the need of a separate step to remove the absober layer during etching of the reflective substrate.

    摘要翻译: 对于反射基板的细线光刻,将氮化钛层施加在反射表面和在用于曝光光致抗蚀剂的光的波长处的吸收剂的光致抗蚀剂之间。 光致抗蚀剂的分辨率提高,即使在光致抗蚀剂中使用吸收性染料也是如此。 在反射层被图案化的同时可以容易地去除氮化钛,从而避免在蚀刻反射基板期间需要单独的步骤去除绝缘层。

    Absorptive planarizing layer for optical lithography
    9.
    发明授权
    Absorptive planarizing layer for optical lithography 失效
    用于光刻的吸收平面化层

    公开(公告)号:US4621042A

    公开(公告)日:1986-11-04

    申请号:US766285

    申请日:1985-08-16

    IPC分类号: G03F7/09 G03C1/76 B05D3/02

    CPC分类号: G03F7/094 Y10S438/95

    摘要: The use of o-cresol novolac resin for planarizing large topographic features on a semiconductor substrate is disclosed. In addition to being a superior planarizing material, o-cresol novolac resin oxidizes and darkens upon baking to provide excellent absorption capability for the light wavelengths which are conventionally utilized to irradiate photoresist compositions. O-cresol novolac resin additionally transmits light at higher wavelengths which are used to align pattern masks with alignment keys on a substrate. These properties further make a transparent substrate coated with a patterned layer of o-cresol novolac resin useful as a lithographic mask.

    摘要翻译: 公开了使用邻甲酚酚醛清漆树脂来平坦化半导体衬底上的大形貌特征。 除了作为优异的平面化材料外,邻甲酚酚醛清漆树脂在烘烤时氧化和变暗,以为通常用于照射光致抗蚀剂组合物的光波长提供优异的吸收能力。 O-甲酚酚醛​​清漆树脂另外透射较高波长的光,这些光用于将图案掩模与基板上的对准键对准。 这些性质进一步制成涂覆有用作光刻掩模的邻甲酚酚醛清漆树脂的图案化层的透明基材。