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    Semiconductor memory device having a column selector
    1.
    发明授权
    Semiconductor memory device having a column selector 失效
    具有列选择器的半导体存储器件

    公开(公告)号：US5590084A

    公开(公告)日：1996-12-31

    申请号：US419688

    申请日：1995-04-11

    申请人： Shinji Miyano ,  Katsuhiko Sato ,  Tomoaki Yabe

    发明人： Shinji Miyano ,  Katsuhiko Sato ,  Tomoaki Yabe

    IPC分类号： G11C11/407 ,  G11C8/10 ,  G11C11/401 ,  G11C7/00

    CPC分类号： G11C8/10

    摘要： A semiconductor memory device comprises column decoders of the number greater than the number of column addresses of a memory cell array and logical circuits of the same number as that of the column addresses. A column gate of a column is controlled by means of a logical OR between outputs from a plurality of column decoders for decoding different column addresses. As a result, even a column located at an end of the memory cell array can be accessed by means of a logical OR between outputs from a column decoder corresponding to the column and another column decoder.

    摘要翻译： 半导体存储器件包括数量大于存储器单元阵列的列地址数量的列解码器和与列地址相同数量的逻辑电路。 通过来自多个列解码器的输出之间的逻辑“或”来对列的列门进行控制，以解码不同的列地址。 结果，即使位于存储单元阵列的一端的列也可以通过来自对应于列的列解码器的列解码器的输出之间的逻辑或来访问。

    Memory circuit with built-in cache memory
    2.
    发明授权
    Memory circuit with built-in cache memory 失效
    具有内置缓存的内存电路

    公开(公告)号：US5890186A

    公开(公告)日：1999-03-30

    申请号：US895863

    申请日：1997-07-17

    申请人： Katsuhiko Sato ,  Shinji Miyano ,  Tomoaki Yabe ,  Tohru Furuyama

    发明人： Katsuhiko Sato ,  Shinji Miyano ,  Tomoaki Yabe ,  Tohru Furuyama

    IPC分类号： G11C11/409 ,  G06F12/08 ,  G11C7/10 ,  G11C11/00 ,  G11C11/401 ,  G11C11/407 ,  G11C11/34

    CPC分类号： G11C7/1051 ,  G11C11/005

    摘要： When data stored in a memory cell of a memory cell array is written into cache memory, a write signal LW is set at an "H" level. The write signal LW is input into a data-line pair initialization select circuit via an initialization control circuit, and a signal EQE is set at an "H" level in all columns. A data-line pair initialization circuit then sets the potential of the data-line pairs in all columns at the same level. When the write signal LW is input to a transfer gate via a transfer gate control circuit, the transfer gates in all columns are turned ON. The delay time of the transfer gate control circuit is the same as or greater than the delay time of the initialization control.

    摘要翻译： 当存储在存储单元阵列的存储单元中的数据被写入高速缓冲存储器时，写入信号LW被设置为“H”电平。 写入信号LW通过初始化控制电路输入到数据线对初始化选择电路，信号EQE在所有列中被设置为“H”电平。 然后，数据线对初始化电路将所有列中的数据线对的电位设置在相同的电平。 当写信号LW通过传输门控制电路输入到传输门时，所有列中的传输门被接通。 传输门控制电路的延迟时间与初始化控制的延迟时间相同或更大。

    Semiconductor memory circuit having data buses common to a plurality of memory cell arrays
    3.
    发明授权
    Semiconductor memory circuit having data buses common to a plurality of memory cell arrays 失效
    具有多个存储单元阵列共用的数据总线的半导体存储电路

    公开(公告)号：US5640351A

    公开(公告)日：1997-06-17

    申请号：US601859

    申请日：1996-02-15

    申请人： Tomoaki Yabe ,  Shinji Miyano ,  Katsuhiko Sato ,  Kenji Numata

    发明人： Tomoaki Yabe ,  Shinji Miyano ,  Katsuhiko Sato ,  Kenji Numata

    IPC分类号： G11C11/401 ,  G11C7/10 ,  G11C11/407 ,  G11C11/409 ,  G11C11/4096 ,  G11C8/00

    CPC分类号： G11C11/4096 ,  G11C7/10

    摘要： According to the present invention, a data bus common to a plurality of memory cell arrays is formed by selecting a column so as to prevent a data collision from occurring. Specifically, two memory cell arrays have each of data buses in common. A column decoder is supplied with a control signal to control a column selection logic circuit. The column selection logic circuit is so controlled that the data read out to the data buses in response to the control signal is prevented from colliding with each other during the simultaneous access to the two cell arrays.

    摘要翻译： 根据本发明，通过选择列来形成多个存储单元阵列共用的数据总线，以防止发生数据冲突。 具体地说，两个存储单元阵列共有数据总线。 列解码器被提供有控制信号以控制列选择逻辑电路。 列选择逻辑电路被如此控制，以便在同时访问两个单元阵列期间防止响应于控制信号读出到数据总线的数据彼此相冲突。

    Clock synchronous type DRAM with latch
    4.
    发明授权
    Clock synchronous type DRAM with latch 失效
    时钟同步型DRAM带锁存器

    公开(公告)号：US5754481A

    公开(公告)日：1998-05-19

    申请号：US857559

    申请日：1997-05-16

    申请人： Tomoaki Yabe ,  Kenji Numata ,  Katsuhiko Sato ,  Ryo Haga ,  Shinji Miyano ,  Tohru Furuyama

    发明人： Tomoaki Yabe ,  Kenji Numata ,  Katsuhiko Sato ,  Ryo Haga ,  Shinji Miyano ,  Tohru Furuyama

    IPC分类号： G11C7/10 ,  G11C11/407 ,  G11C7/00

    CPC分类号： G11C7/1006 ,  G11C7/1051 ,  G11C7/106 ,  G11C7/1072 ,  G11C7/1078

    摘要： A semiconductor memory device includes a memory cell array, row decoder, bit line pairs, sense amplifier, sense amplifier control circuit, data latch, transfer gate, transfer gate control circuit, and write circuit. The memory cell array has dynamic memory cells arranged in an array form. The row decoder decodes a row address signal to select a desired one of rows of the memory cell array. Each of the bit line pairs is connected to those of the memory cells which are arranged on a corresponding one of columns of the memory cell array. The sense amplifier amplifies data read out on the paired bit lines and positively feeding data back to the paired bit lines to hold the data. The sense amplifier control circuit controls the operation of the sense amplifier. The data latch latches readout data and write data. The transfer gate transfers data between the data latch and the sense amplifier. The transfer gate control circuit controls the transfer gate. The write circuit writes data into the data latch in synchronism with a clock signal. At the time of writing data into the memory cells, data is previously supplied to the data latch by the write circuit and latched in the data latch, and after the transfer gate control circuit controls the transfer gate to supply data to the bit line pairs from the data latch, the sense amplifier control circuit activates the sense amplifier.

    摘要翻译： 半导体存储器件包括存储单元阵列，行解码器，位线对，读出放大器，读出放大器控制电路，数据锁存器，传输门，传输门控制电路和写电路。 存储单元阵列具有以阵列形式排列的动态存储单元。 行解码器解码行地址信号以选择存储单元阵列的所需行中的一行。 每个位线对连接到布置在存储单元阵列的相应列上的存储单元的每一个。 读出放大器放大在配对位线上读出的数据，并将数据反馈给配对的位线以保存数据。 读出放大器控制电路控制读出放大器的工作。 数据锁存器锁存读出数据和写入数据。 传输门在数据锁存器和读出放大器之间传送数据。 传输门控制电路控制传输门。 写入电路与时钟信号同步地将数据写入数据锁存器。 在将数据写入存储器单元时，数据预先由写入电路提供给数据锁存器并锁存在数据锁存器中，并且在传输门控制电路控制传输门以向位线对提供数据之后 数据锁存器，读出放大器控制电路激活读出放大器。

    Memory standard cell macro for semiconductor device
    5.
    发明授权
    Memory standard cell macro for semiconductor device 失效
    用于半导体器件的内存标准单元宏

    公开(公告)号：US5698876A

    公开(公告)日：1997-12-16

    申请号：US576477

    申请日：1995-12-21

    申请人： Tomoaki Yabe ,  Shinji Miyano ,  Katsuhiko Sato ,  Kenji Numata

    发明人： Tomoaki Yabe ,  Shinji Miyano ,  Katsuhiko Sato ,  Kenji Numata

    IPC分类号： G11C11/401 ,  G11C11/00 ,  G11C11/4074 ,  G11C29/14 ,  H01L21/82 ,  H01L27/02 ,  H01L27/10 ,  H01L27/118 ,  H01L27/108

    CPC分类号： G11C29/14 ,  G11C11/005 ,  G11C11/4074 ,  H01L27/0207 ,  Y10S257/909

    摘要： A semiconductor device of a memory-macro type can be designed within a short time to have a desired storage capacity, which does not occupy a large area, so as to reduce the chip cost. The semiconductor device includes a memory macro having sub-memory macros, each sub-memory macro having a DRAM memory-cell array, and a row decoder and a column decoder for selecting any desired memory-cell from the memory cell of the array. The memory macro also includes a control-section macro having a DC potential generating circuit for generating various DC potentials required to drive the sub-memory macros. At least one of the sub-memory macros is combined with the control-section macro to form the memory macro as a one-chip memory capable of storing an integral multiple of N bits.

    摘要翻译： 可以在短时间内设计存储器 - 宏型半导体器件以具有不占用大面积的期望的存储容量，从而降低芯片成本。 半导体器件包括具有子存储器宏的存储器宏，每个子存储器宏具有DRAM存储单元阵列，以及用于从阵列的存储器单元中选择任何所需存储单元的行解码器和列解码器。 存储器宏还包括具有DC电位产生电路的控制部分宏，用于产生驱动子存储器宏所需的各种DC电位。 子存储器宏中的至少一个与控制部分宏组合以形成作为能够存储N位的整数倍的单片存储器的存储器宏。

    Semiconductor memory device with a decoding peripheral circuit for improving the operation frequency
    6.
    发明授权
    Semiconductor memory device with a decoding peripheral circuit for improving the operation frequency 失效
    具有用于提高操作频率的解码外围电路的半导体存储器件

    公开(公告)号：US5640365A

    公开(公告)日：1997-06-17

    申请号：US524630

    申请日：1995-09-07

    申请人： Keniti Imamiya ,  Shinji Miyano ,  Katsuhiko Sato ,  Tomoaki Yabe

    发明人： Keniti Imamiya ,  Shinji Miyano ,  Katsuhiko Sato ,  Tomoaki Yabe

    IPC分类号： G11C7/22 ,  G11C8/18 ,  G11C29/00 ,  G11C7/00

    CPC分类号： G11C29/842 ,  G11C29/844 ,  G11C7/22 ,  G11C8/18

    摘要： A data register that stores the data corresponding to the selected memory cell in a memory cell array is provided near the memory cell array. A decoder that selects the data from the data register starts decoding in response to an address signal accessing the memory cells in synchronization with a clock signal determining the operation period. In the first half of an operation period of the clock signal, the decoder outputs a signal in response to a signal corresponding to the address signal determined in the preceding operation period. According to the output of the decoder, the data register is selected. In the latter half of the operation period, a signal corresponding to a new address signal for the next operation period is transferred to the decoder. By doing this, the output control signal in the decoder is caused to synchronize with a signal driving an address signal, enabling the proper address to be selected without fail.

    摘要翻译： 在存储单元阵列附近提供将存储单元阵列中与所选存储单元对应的数据存储的数据寄存器。 从数据寄存器中选择数据的解码器响应于与确定操作周期的时钟信号同步地访问存储器单元的地址信号开始解码。 在时钟信号的运算周期的前半部分中，解码器响应于与前一操作周期中确定的地址信号对应的信号输出信号。 根据解码器的输出，选择数据寄存器。 在操作期间的后半部分，将与下一个操作期间的新的地址信号对应的信号传送到解码器。 通过这样做，使解码器中的输出控制信号与驱动地址信号的信号同步，使得能够选择合适的地址。

    Clock synchronous type DRAM with data latch
    7.
    发明授权
    Clock synchronous type DRAM with data latch 失效
    具有数据锁存器的时钟同步型DRAM

    公开(公告)号：US5659507A

    公开(公告)日：1997-08-19

    申请号：US753432

    申请日：1996-11-25

    申请人： Tomoaki Yabe ,  Kenji Numata ,  Katsuhiko Sato ,  Ryo Haga ,  Shinji Miyano ,  Tohru Furuyama

    发明人： Tomoaki Yabe ,  Kenji Numata ,  Katsuhiko Sato ,  Ryo Haga ,  Shinji Miyano ,  Tohru Furuyama

    IPC分类号： G11C7/10 ,  G11C11/407 ,  G11C7/00

    CPC分类号： G11C7/1006 ,  G11C7/1051 ,  G11C7/106 ,  G11C7/1072 ,  G11C7/1078

    摘要： A semiconductor memory device includes a memory cell array, row decoder, bit line pairs, sense amplifier, sense amplifier control circuit, data latch, transfer gate, transfer gate control circuit, and write circuit. The memory cell array has dynamic memory cells arranged in an array form. The row decoder decodes a row address signal to select a desired one of rows of the memory cell array. Each of the bit line pairs is connected to those of the memory cells which are arranged on a corresponding one of columns of the memory cell array. The sense amplifier amplifies data read out on the paired bit lines and positively feeding data back to the paired bit lines to hold the data. The sense amplifier control circuit controls the operation of the sense amplifier. The data latch latches readout data and write data. The transfer gate transfers data between the data latch and the sense amplifier. The transfer gate control circuit controls the transfer gate. The write circuit writes data into the data latch in synchronism with a clock signal. At the time of writing data into the memory cells, data is previously supplied to the data latch by the write circuit and latched in the data latch, and after the transfer gate control circuit controls the transfer gate to supply data to the bit line pairs from the data latch, the sense amplifier control circuit activates the sense amplifier.

    摘要翻译： 半导体存储器件包括存储单元阵列，行解码器，位线对，读出放大器，读出放大器控制电路，数据锁存器，传输门，传输门控制电路和写电路。 存储单元阵列具有以阵列形式排列的动态存储单元。 行解码器解码行地址信号以选择存储单元阵列的所需行中的一行。 每个位线对连接到布置在存储单元阵列的相应列上的存储单元的每一个。 读出放大器放大在配对位线上读出的数据，并将数据反馈给配对的位线以保存数据。 读出放大器控制电路控制读出放大器的工作。 数据锁存器锁存读出数据和写入数据。 传输门在数据锁存器和读出放大器之间传送数据。 传输门控制电路控制传输门。 写入电路与时钟信号同步地将数据写入数据锁存器。 在将数据写入存储器单元时，数据预先由写入电路提供给数据锁存器并锁存在数据锁存器中，并且在传输门控制电路控制传输门以向位线对提供数据之后 数据锁存器，读出放大器控制电路激活读出放大器。

    Semiconductor memory device
    8.
    发明授权
    Semiconductor memory device 失效
    半导体存储器件

    公开(公告)号：US5504709A

    公开(公告)日：1996-04-02

    申请号：US354831

    申请日：1994-12-08

    申请人： Tomoaki Yabe ,  Katsuhiko Sato ,  Shinji Miyano

    发明人： Tomoaki Yabe ,  Katsuhiko Sato ,  Shinji Miyano

    IPC分类号： G11C11/401 ,  G11C7/10 ,  G11C11/409 ,  H01L21/8242 ,  H01L27/108 ,  G11C11/34

    CPC分类号： G11C7/1006 ,  G11C7/1048

    摘要： A semiconductor memory device includes a sense amplifier which senses data read out from a memory cell, a transfer gate coupled to an output of the sense amplifier, and a data latch circuit coupled to the transfer gate. The data latch circuit includes two MOS transistors of a same conductivity type connected in series between a pair of I/O data lines. The gates of the two MOS transistors are cross-coupled to the data lines respectively, thereby enabling a rapid data transfer between the memory cell and a data bus.

    摘要翻译： 半导体存储器件包括读出放大器，其感测从存储单元读出的数据，耦合到读出放大器的输出的传输栅极和耦合到传输门的数据锁存电路。 数据锁存电路包括串联连接在一对I / O数据线之间的两个相同导电类型的MOS晶体管。 两个MOS晶体管的栅极分别交叉耦合到数据线，从而使得能够在存储器单元和数据总线之间进行快速的数据传输。

    One-chip LSI including a general memory and a logic
    9.
    发明授权
    One-chip LSI including a general memory and a logic 失效
    单片LSI包括一般存储器和逻辑

    公开(公告)号：US5930187A

    公开(公告)日：1999-07-27

    申请号：US962358

    申请日：1997-10-31

    申请人： Katsuhiko Sato ,  Shinji Miyano

    发明人： Katsuhiko Sato ,  Shinji Miyano

    IPC分类号： G06F15/78 ,  G01R31/3185 ,  G11C5/02 ,  G11C11/401 ,  G11C29/12 ,  H01L21/822 ,  H01L27/04 ,  H01L27/10 ,  G11C7/00

    CPC分类号： G11C29/12 ,  G01R31/318538 ,  G11C5/025 ,  Y10S257/909

    摘要： An LSI chip has a main surface occupied by a logic section, a data input/output section and a memory macro section. The memory macro section is a rectangular section arranged on the main surface of the LSI chip. A test control circuit is arranged along one side of the memory macro section. A data input/output circuit is arranged along another side of the memory macro section. The test control circuit may be arranged along one side of the LSI chip. Test data is supplied from the test control circuit to the data input/output circuit through a data bus. As a result, a load of designing a memory logic LSI can be lightened.

    摘要翻译： LSI芯片具有由逻辑部分占据的主表面，数据输入/输出部分和存储宏部分。 存储器宏部分是布置在LSI芯片的主表面上的矩形部分。 测试控制电路沿着存储宏部分的一侧布置。 数据输入/输出电路沿着存储器宏部分的另一侧布置。 测试控制电路可以沿着LSI芯片的一侧布置。 测试数据通过数据总线从测试控制电路提供给数据输入/输出电路。 结果，可以减轻设计存储器逻辑LSI的负担。