Method of forming a dual gated FinFET gain cell
    3.
    发明授权
    Method of forming a dual gated FinFET gain cell 有权
    形成双门控FinFET增益单元的方法

    公开(公告)号:US07566613B2

    公开(公告)日:2009-07-28

    申请号:US11221118

    申请日:2005-09-07

    IPC分类号: H01L21/8244

    摘要: A memory gain cell for a memory circuit, a memory circuit formed from multiple memory gain cells, and methods of fabricating such memory gain cells and memory circuits. The memory gain cell includes a storage device capable of holding a stored electrical charge, a write device, and a read device. The read device includes a fin of semiconducting material, electrically-isolated first and second gate electrodes flanking the fin, and a source and drain formed in the fin adjacent to the first and the second gate electrodes. The first gate electrode is electrically coupled with the storage device. The first and second gate electrodes are operative for gating a region of the fin defined between the source and the drain to thereby regulate a current flowing from the source to the drain. When gated, the magnitude of the current is dependent upon the electrical charge stored by the storage device.

    摘要翻译: 用于存储器电路的存储增益单元,由多个存储器增益单元形成的存储器电路,以及制造这种存储器增益单元和存储器电路的方法。 存储器增益单元包括能够保存存储的电荷的存储装置,写入装置和读取装置。 读取装置包括半导体材料的翅片,鳍片侧面的电隔离的第一和第二栅电极,以及形成在与第一和第二栅电极相邻的鳍片中的源极和漏极。 第一栅电极与存储装置电耦合。 第一和第二栅极电极用于选通限定在源极和漏极之间的鳍片的区域,从而调节从源极流到漏极的电流。 当门控时,电流的大小取决于存储设备存储的电量。

    Method of forming a dual gated FinFET gain cell
    4.
    发明授权
    Method of forming a dual gated FinFET gain cell 有权
    形成双门控FinFET增益单元的方法

    公开(公告)号:US07674674B2

    公开(公告)日:2010-03-09

    申请号:US12144139

    申请日:2008-06-23

    IPC分类号: H01L21/8244

    摘要: A memory gain cell for a memory circuit, a memory circuit formed from multiple memory gain cells, and methods of fabricating such memory gain cells and memory circuits. The memory gain cell includes a storage device capable of holding a stored electrical charge, a write device, and a read device. The read device includes a fin of semiconducting material, electrically-isolated first and second gate electrodes flanking the fin, and a source and drain formed in the fin adjacent to the first and the second gate electrodes. The first gate electrode is electrically coupled with the storage device. The first and second gate electrodes are operative for gating a region of the fin defined between the source and the drain to thereby regulate a current flowing from the source to the drain. When gated, the magnitude of the current is dependent upon the electrical charge stored by the storage device.

    摘要翻译: 用于存储器电路的存储增益单元,由多个存储器增益单元形成的存储器电路,以及制造这种存储器增益单元和存储器电路的方法。 存储器增益单元包括能够保存存储的电荷的存储装置,写入装置和读取装置。 读取装置包括半导体材料的翅片,鳍片侧面的电隔离的第一和第二栅电极,以及形成在与第一和第二栅电极相邻的鳍片中的源极和漏极。 第一栅电极与存储装置电耦合。 第一和第二栅极电极用于选通限定在源极和漏极之间的鳍片的区域,从而调节从源极流到漏极的电流。 当门控时,电流的大小取决于存储设备存储的电量。

    Horizontal memory gain cells
    5.
    发明授权
    Horizontal memory gain cells 失效
    水平记忆增益细胞

    公开(公告)号:US07109546B2

    公开(公告)日:2006-09-19

    申请号:US10879815

    申请日:2004-06-29

    IPC分类号: H01L31/119

    摘要: A gain cell for a memory circuit, a memory circuit formed from multiple gain cells, and methods of fabricating such gain cells and memory circuits. The memory gain cell includes a storage capacitor, a write device electrically coupled with the storage capacitor for charging and discharging the storage capacitor to define a stored electrical charge, and a read device. The read device includes one or more semiconducting carbon nanotubes each electrically coupled between a source and drain. A portion of each semiconducting carbon nanotube is gated by the read gate and the storage capacitor to thereby regulate a current flowing through each semiconducting carbon nanotube from the source to the drain. The current is proportional to the electrical charge stored by the storage capacitor. In certain embodiments, the memory gain cell may include multiple storage capacitors.

    摘要翻译: 用于存储器电路的增益单元,由多个增益单元形成的存储器电路,以及制造这种增益单元和存储器电路的方法。 存储增益单元包括存储电容器,与存储电容器电耦合以对存储电容器进行充电和放电以定义存储的电荷的写入装置和读取装置。 读取装置包括一个或多个半导体碳纳米管,每个碳纳米管电耦合在源极和漏极之间。 每个半导体碳纳米管的一部分由读取栅极和存储电容器选通,从而调节从源极到漏极流过每个半导体碳纳米管的电流。 电流与存储电容器存储的电荷成比例。 在某些实施例中,存储增益单元可以包括多个存储电容器。

    Dual gated finfet gain cell
    6.
    发明授权
    Dual gated finfet gain cell 有权
    双门控finfet增益单元

    公开(公告)号:US06970372B1

    公开(公告)日:2005-11-29

    申请号:US10879833

    申请日:2004-06-29

    IPC分类号: G11C7/00 H01L27/108

    摘要: A memory gain cell for a memory circuit, a memory circuit formed from multiple memory gain cells, and methods of fabricating such memory gain cells and memory circuits. The memory gain cell includes a storage device capable of holding a stored electrical charge, a write device, and a read device. The read device includes a fin of semiconducting material, electrically-isolated first and second gate electrodes flanking the fin, and a source and drain formed in the fin adjacent to the first and the second gate electrodes. The first gate electrode is electrically coupled with the storage device. The first and second gate electrodes are operative for gating a region of the fin defined between the source and the drain to thereby regulate a current flowing from the source to the drain. When gated, the magnitude of the current is dependent upon the electrical charge stored by the storage device.

    摘要翻译: 用于存储器电路的存储增益单元,由多个存储器增益单元形成的存储器电路,以及制造这种存储器增益单元和存储器电路的方法。 存储器增益单元包括能够保存存储的电荷的存储装置,写入装置和读取装置。 读取装置包括半导体材料的翅片,鳍片侧面的电隔离的第一和第二栅电极,以及形成在与第一和第二栅电极相邻的鳍片中的源极和漏极。 第一栅电极与存储装置电耦合。 第一和第二栅极电极用于选通限定在源极和漏极之间的鳍片的区域,从而调节从源极流到漏极的电流。 当门控时,电流的大小取决于存储设备存储的电量。

    Methods for forming a wrap-around gate field effect transistor
    7.
    发明授权
    Methods for forming a wrap-around gate field effect transistor 有权
    形成环绕栅场效应晶体管的方法

    公开(公告)号:US07435653B2

    公开(公告)日:2008-10-14

    申请号:US11735075

    申请日:2007-04-13

    IPC分类号: H01L21/336

    摘要: A field effect transistor is formed having wrap-around, vertically-aligned, dual gate electrodes. Starting with a silicon-on-insulator (SOI) structure having a buried silicon island, a vertical reference edge is defined, by creating a cavity within the SOI structure, and used during two etch-back steps that can be reliably performed. The first etch-back removes a portion of an oxide layer for a first distance over which a gate conductor material is then applied. The second etch-back removes a portion of the gate conductor material for a second distance. The difference between the first and second distances defines the gate length of the eventual device. After stripping away the oxide layers, a vertical gate electrode is revealed that surrounds the buried silicon island on all four side surfaces.

    摘要翻译: 形成具有环绕,垂直排列的双栅电极的场效应晶体管。 从具有掩埋硅岛的绝缘体上硅(SOI)结构开始,通过在SOI结构内产生空腔并在可以可靠地执行的两个回蚀步骤期间使用垂直参考边缘。 第一次回蚀将氧化物层的一部分去除第一距离,然后施加栅极导体材料。 第二次回蚀将栅极导体材料的一部分移除第二距离。 第一和第二距离之间的差异定义了最终设备的栅极长度。 剥离氧化物层后,显示出在所有四个侧表面上包围掩埋硅岛的垂直栅电极。

    Wrap-around gate field effect transistor
    8.
    发明授权
    Wrap-around gate field effect transistor 有权
    环绕栅场效应晶体管

    公开(公告)号:US07271444B2

    公开(公告)日:2007-09-18

    申请号:US10732958

    申请日:2003-12-11

    IPC分类号: H01L29/76

    摘要: A field effect transistor is formed having wrap-around, vertically-aligned, dual gate electrodes. Starting with an silicon-on-insulator (SOI) structure having a buried silicon island, a vertical reference edge is defined, by creating a cavity within the SOI structure, and used during two etch-back steps that can be reliably performed. The first etch-back removes a portion of an oxide layer for a first distance over which a gate conductor material is then applied. The second etch-back removes a portion of the gate conductor material for a second distance. The difference between the first and second distances defines the gate length of the eventual device. After stripping away the oxide layers, a vertical gate electrode is revealed that surrounds the buried silicon island on all four side surfaces.

    摘要翻译: 形成具有环绕,垂直排列的双栅电极的场效应晶体管。 从具有掩埋硅岛的绝缘体上硅(SOI)结构开始,通过在SOI结构内产生空腔并在可以可靠地执行的两个回蚀步骤期间使用垂直参考边。 第一次回蚀将氧化物层的一部分去除第一距离,然后施加栅极导体材料。 第二次回蚀将栅极导体材料的一部分移除第二距离。 第一和第二距离之间的差异定义了最终设备的栅极长度。 剥离氧化物层后,显示出在所有四个侧表面上包围掩埋硅岛的垂直栅电极。