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    CHANNEL COMMAND WORD PRE-FETCHING APPARATUS
    1.
    发明申请
    CHANNEL COMMAND WORD PRE-FETCHING APPARATUS 审中-公开
    通道命令字预设装置

    公开(公告)号：US20100082948A1

    公开(公告)日：2010-04-01

    申请号：US12493951

    申请日：2009-06-29

    申请人： Tsukasa Matsuda ,  Hideki Yamanaka

    发明人： Tsukasa Matsuda ,  Hideki Yamanaka

    IPC分类号： G06F9/30 ,  G06F3/00

    CPC分类号： G06F3/0237 ,  G06F9/3802 ,  G06F9/383 ,  G06F9/3832 ,  G06F9/3842 ,  G06F9/3853 ,  G06F9/3885 ,  G06F13/385 ,  G06F17/279

    摘要： In a CCW fetching section, for each input/output device being a control objective, a result prediction table in which prediction values of status values to be returned from an input/output device as execution results of CCW commands, is referred to. Then, based on the prediction values, commands being pre-fetching objectives are pre-fetched from a CCW program stored in a memory, and transmitted to a CCW executing section. On the other hand, in the CCW executing section, the pre-fetched commands are sequentially executed, and the actual status values as the execution results are received from the input/output device. Then, when the received actual status values are not same as the predicted status values, success or failure in prediction is notified to the CCW fetching section, and also, the result prediction table is updated in the CCW fetching section.

    摘要翻译： 在CCW提取部分中，对于作为控制目标的每个输入/输出设备，参考其中将作为CCW命令的执行结果从输入/输出设备返回的状态值的预测值的结果预测表。 然后，基于预测值，从存储在存储器中的CCW程序中取出预取目标的命令，并发送给CCW执行部。 另一方面，在CCW执行部中，依次执行预取命令，并且从输入/输出装置接收作为执行结果的实际状态值。 然后，当接收的实际状态值与预测状态值不相同时，将预测成功或失败通知给CCW取出部，并且在CCW取出部中更新结果预测表。

    Plasma enhanced atomic layer deposition system and method
    2.
    发明授权
    Plasma enhanced atomic layer deposition system and method 有权
    等离子体增强原子层沉积系统和方法

    公开(公告)号：US08486845B2

    公开(公告)日：2013-07-16

    申请号：US11084024

    申请日：2005-03-21

    申请人： Tsukasa Matsuda

    发明人： Tsukasa Matsuda

    IPC分类号： H01L21/31 ,  H01L21/469

    CPC分类号： C23C16/45544 ,  C23C16/4554 ,  C23C16/515 ,  H01J37/32009 ,  H01J37/32532 ,  H01L21/28562

    摘要： A method for depositing a film on a substrate using a plasma enhanced atomic layer deposition (PEALD) process includes disposing the substrate in a process chamber configured to facilitate the PEALD process, introducing a first process material within the process chamber and introducing a second process material within the process chamber. Also included is coupling electromagnetic power to the process chamber during introduction of the second process material in order to generate a plasma that facilitates a reduction reaction between the first and second process materials at a surface of the substrate. A reactive gas is introduced within the process chamber, the reactive gas chemically reacting with contaminants in the process chamber to release the contaminants from at least one of a process chamber component or the substrate.

    摘要翻译： 使用等离子体增强原子层沉积（PEALD）工艺在衬底上沉积膜的方法包括将衬底布置在处理室中，该处理室被配置为便于PEALD工艺，在处理室内引入第一工艺材料并引入第二工艺材料 在处理室内。 还包括在引入第二工艺材料期间将电磁功率耦合到处理室，以便产生促进第一和第二工艺材料在衬底表面处的还原反应的等离子体。 反应性气体被引入处理室内，反应气体与处理室中的污染物质化学反应以从处理室组件或衬底中的至少一个释放污染物。

    Particle-measuring system and particle-measuring method
    3.
    发明授权
    Particle-measuring system and particle-measuring method 有权
    粒子测量系统和粒子测量方法

    公开(公告)号：US08100147B2

    公开(公告)日：2012-01-24

    申请号：US11782090

    申请日：2007-07-24

    申请人： Hayashi Otsuki ,  Tsukasa Matsuda ,  Kyoko Ikeda

    发明人： Hayashi Otsuki ,  Tsukasa Matsuda ,  Kyoko Ikeda

    IPC分类号： B01F5/18

    CPC分类号： G01N1/24 ,  C23C16/4405 ,  C23C16/4412 ,  G01N15/06 ,  G01N2015/0693 ,  H01L21/67069 ,  H01L21/67115 ,  H01L21/67253 ,  H01L21/68742 ,  Y10T137/8593 ,  Y10T137/87652 ,  Y10T137/8766

    摘要： The present invention provides a particle measuring system which is provided in a processing system 40 which generates an atmosphere obtained by exhausting air or a gas in a processing chamber 48 by a vacuum pump 98 and applies a process concerning semiconductor manufacture to a wafer W in the atmosphere, attached to an exhaust pipe 90 which connects an exhaust opening 86 of the processing chamber 48 with the vacuum pump 98, and measures the number of the particles in the exhaust gas, and a measuring method thereof, the system and method providing a processing system and a cleaning method which terminate etching process by determining an end point based on the number of the particles in the exhaust gas and perform cleaning of unnecessary films.

    摘要翻译： 本发明提供一种粒子测量系统，其设置在处理系统40中，该处理系统40产生通过真空泵98排出处理室48中的空气或气体而获得的气氛，并将与半导体制造有关的工艺应用于晶片W 附着在排气管90上，排气管90将处理室48的排气口86与真空泵98连接，并测量废气中的颗粒数量及其测量方法，该系统和方法提供处理 系统和清洁方法，其通过基于废气中的颗粒数量确定终点并执行不需要的膜的清洁来终止蚀刻工艺。

    Baggage management gate
    4.
    发明授权
    Baggage management gate 有权
    行李管理门

    公开(公告)号：US07834739B2

    公开(公告)日：2010-11-16

    申请号：US12076337

    申请日：2008-03-17

    申请人： Shoji Yamaguchi ,  Mario Fuse ,  Yasunori Koda ,  Kunihiro Takahashi ,  Hiroyoshi Inoue ,  Tsukasa Matsuda

    发明人： Shoji Yamaguchi ,  Mario Fuse ,  Yasunori Koda ,  Kunihiro Takahashi ,  Hiroyoshi Inoue ,  Tsukasa Matsuda

    IPC分类号： B60R25/00 ,  G06F7/04 ,  G06F7/00

    CPC分类号： G01R33/02

    摘要： A baggage management gate includes a first reading device and a second reading device, a detecting device, a determining unit, a first opening and closing device and a second opening and closing device. The baggage management gate manages baggage that is restricted to be carried in or out from a predetermined region. And in order away from the region in which the baggage is managed, the first reading device, the second opening and closing device, the detecting device for both the first person and the second person, the first opening and closing device, and the second reading device are arranged in an entrance direction from the passage to the management region in which the baggage is managed.

    摘要翻译： 行李管理门包括第一读取装置和第二读取装置，检测装置，确定装置，第一打开和关闭装置以及第二打开和关闭装置。 行李管理门管理被限制在预定区域内进出的行李。 并且为了远离管理行李的区域，第一读取装置，第二打开和关闭装置，用于第一人和第二人的检测装置，第一打开和关闭装置以及第二读取 设备沿着通道行进管理区域的入口方向排列。

    Particle-measuring system and particle-measuring method
    5.
    发明授权
    Particle-measuring system and particle-measuring method 有权
    粒子测量系统和粒子测量方法

    公开(公告)号：US07667840B2

    公开(公告)日：2010-02-23

    申请号：US11965357

    申请日：2007-12-27

    申请人： Hayashi Otsuki ,  Tsukasa Matsuda ,  Kyoko Ikeda

    发明人： Hayashi Otsuki ,  Tsukasa Matsuda ,  Kyoko Ikeda

    IPC分类号： G01N21/00

    CPC分类号： G01N1/24 ,  C23C16/4405 ,  C23C16/4412 ,  G01N15/06 ,  G01N2015/0693 ,  H01L21/67069 ,  H01L21/67115 ,  H01L21/67253 ,  H01L21/68742 ,  Y10T137/8593 ,  Y10T137/87652 ,  Y10T137/8766

    摘要： The present invention provides a particle measuring system which is provided in a processing system that generates an atmosphere obtained by exhausting air or a gas in a processing chamber by a vacuum pump and applies a process concerning semiconductor manufacture to a wafer W in the atmosphere, attached to an exhaust pipe which connects an exhaust opening of the processing chamber with the vacuum pump, and measures the number of the particles in the exhaust gas, and a measuring method thereof, the system and method providing a processing system and a cleaning method which terminate etching process by determining an end point based on the number of the particles in the exhaust gas and perform cleaning of unnecessary films.

    摘要翻译： 本发明提供一种粒子测量系统，其设置在处理系统中，该处理系统产生通过真空泵排出处理室中的空气或气体而获得的气氛，并将关于半导体制造的处理应用于大气中的晶片W，附着 涉及将处理室的排气口与真空泵连接并测量排气中的颗粒数的排气管及其测量方法，提供处理系统的系统和方法以及终止的处理室的清洁方法 通过基于排气中的颗粒数确定终点并执行不需要的膜的清洁来进行蚀刻处理。

    Method and system for forming a variable thickness seed layer
    6.
    发明授权
    Method and system for forming a variable thickness seed layer 失效
    用于形成可变厚度种子层的方法和系统

    公开(公告)号：US07351285B2

    公开(公告)日：2008-04-01

    申请号：US11092266

    申请日：2005-03-29

    申请人： Tsukasa Matsuda

    发明人： Tsukasa Matsuda

    IPC分类号： C30B23/00 ,  C23C16/00 ,  B05D3/00

    CPC分类号： C23C16/18 ,  C23C16/16 ,  H01L21/28556 ,  H01L21/76868 ,  H01L21/76873

    摘要： A method and system for forming a variable thickness seed layer on a substrate for a subsequent metal electrochemical plating process, where the seed layer thickness profile improves uniformity of the electroplated metal layer compared to when using a constant thickness seed layer. The method includes providing a substrate in a process chamber containing a showerhead, with the center of the substrate generally aligned with an inner gas delivery zone of the showerhead and the edge of the substrate generally aligned with an outer gas delivery zone of the showerhead. The method further includes depositing a seed layer on the substrate by exposing the substrate to a first gas containing a metal-containing precursor flowed through the inner gas delivery zone, and exposing the substrate to a second gas flowed through the outer gas delivery zone, whereby the seed layer is deposited with a thickness at the edge of the substrate that is less than the thickness at the center of the substrate.

    摘要翻译： 一种用于在随后的金属电化学电镀工艺的衬底上形成可变厚度籽晶层的方法和系统，其中与使用恒定厚度的种子层相比，种子层厚度分布改善了电镀金属层的均匀性。 该方法包括在包含喷头的处理室中提供衬底，其中衬底的中心大致与喷头的内部气体输送区域对准，并且衬底的边缘与喷头的外部气体输送区域大致对准。 该方法还包括通过将衬底暴露于含有流过内部气体输送区的含金属前体的第一气体，并将衬底暴露于流过外部气体输送区的第二气体，从而将衬底层沉积在衬底上，由此 籽晶层在衬底的边缘处被沉积成小于衬底中心的厚度。

    Image forming method
    7.
    发明授权
    Image forming method 有权
    图像形成方法

    公开(公告)号：US07344816B2

    公开(公告)日：2008-03-18

    申请号：US10940926

    申请日：2004-09-15

    申请人： Yasuo Matsumura ,  Tsukasa Matsuda ,  Kazuhiko Arai ,  Tetsuo Yamada

    发明人： Yasuo Matsumura ,  Tsukasa Matsuda ,  Kazuhiko Arai ,  Tetsuo Yamada

    IPC分类号： G03G15/20

    CPC分类号： G03G15/2064 ,  G03G2215/208

    摘要： A method for forming an image contains steps of: transferring a toner having a volume average particle diameter of 5 μm or less to a recording medium as a toner image having a monochromatic maximum toner mass per area of 0.35 mg/cm2 or less; and fixing the toner image at a surface temperature of a fixing roll which is 130° C. or less. The toner preferably has 0.02 log(Pa)/° C. or less of a gradient of a storage, elasticity per temperature in a temperature range of from Tm+20° C. to Tm+50° C. Here, Tm represents a melting temperature of a crystalline resin contained in the crystalline toner.

    摘要翻译： 形成图像的方法包括以下步骤：将具有5μm或更小的体积平均粒径的调色剂转印到记录介质上，作为每单位面积的单色最大调色剂质量为0.35mg / cm 2的调色剂图像， / SUP>以下; 并将调色剂图像定影在130℃或更低的定影辊的表面温度。 调色剂优选在Tm + 20℃至Tm + 50℃的温度范围内具有0.02log（℃）/℃或更低的存储梯度，每温度的弹性。这里，Tm表示熔融 包含在结晶调色剂中的结晶树脂的温度。

    PARTICLE-MEASURING SYSTEM AND PARTICLE-MEASURING METHOD
    10.
    发明申请
    PARTICLE-MEASURING SYSTEM AND PARTICLE-MEASURING METHOD 有权
    粒子测量系统和粒子测量方法

    公开(公告)号：US20070263217A1

    公开(公告)日：2007-11-15

    申请号：US11782031

    申请日：2007-07-24

    申请人： Hayashi Otsuki ,  Tsukasa Matsuda ,  Kyoko Ikeda

    发明人： Hayashi Otsuki ,  Tsukasa Matsuda ,  Kyoko Ikeda

    IPC分类号： G01N21/00

    CPC分类号： G01N1/24 ,  C23C16/4405 ,  C23C16/4412 ,  G01N15/06 ,  G01N2015/0693 ,  H01L21/67069 ,  H01L21/67115 ,  H01L21/67253 ,  H01L21/68742 ,  Y10T137/8593 ,  Y10T137/87652 ,  Y10T137/8766

    摘要： The present invention provides a particle measuring system which is provided in a processing system 40 which generates an atmosphere obtained by exhausting air or a gas in a processing chamber 48 by a vacuum pump 98 and applies a process concerning semiconductor manufacture to a wafer W in the atmosphere, attached to an exhaust pipe 90 which connects an exhaust opening 86 of the processing chamber 48 with the vacuum pump 98, and measures the number of the particles in the exhaust gas, and a measuring method thereof, the system and method providing a processing system and a cleaning method which terminate etching process by determining an end point based on the number of the particles in the exhaust gas and perform cleaning of unnecessary films.

    摘要翻译： 本发明提供一种粒子测量系统，其设置在处理系统40中，该处理系统40产生通过真空泵98排出处理室48中的空气或气体而获得的气氛，并将与半导体制造有关的工艺应用于晶片W 附着在排气管90上，排气管90将处理室48的排气口86与真空泵98连接，并测量废气中的颗粒数量及其测量方法，该系统和方法提供处理 系统和清洁方法，其通过基于废气中的颗粒数量确定终点并执行不需要的膜的清洁来终止蚀刻工艺。