摘要:
There is provided a semiconductor memory device which comprises a plurality of memory cells, a plurality of bit lines connected with the plurality of memory cells, a plurality of word lines connected with the plurality of memory cells, a plurality of data line pairs, a plurality of transfer gates for effecting controlled connection of the plurality of bit lines with the plurality of data lines, a plurality of column select lines for controlling conductibility of the plurality of the transfer gates, and a column select line drive circuit for simultaneously selecting and driving at least two of the plurality of column select lines corresponding to one-time column address input from the outside of the chip.
摘要:
There is provided a semiconductor memory device which comprises a plurality of memory cells, a plurality of bit lines connected with the plurality of memory cells, a plurality of word lines connected with the plurality of memory cells, a plurality of data line pairs, a plurality of transfer gates for effecting controlled connection of the plurality of bit lines with the plurality of data lines, a plurality of column select lines for controlling conductibility of the plurality of the transfer gates, and a column select line drive circuit for simultaneously selecting and driving at least two of the plurality of column select lines corresponding to one-time column address input from the outside of the chip.
摘要:
A semiconductor memory device comprises a plurality of memory banks each having a plurality of memory cell arrays and a plurality of sense amplifiers such that the memory cell arrays and the sense amplifiers are alternately disposed in a first direction, the memory banks being disposed in a second direction perpendicular to the first direction, a plurality of row decoders respectively provided in the first direction for the plurality of memory banks, a column decoder provided in the second direction with respect to the plurality of memory banks, a plurality of first data lines respectively provided in the second direction for the plurality of memory banks, and connected with the plurality of sense amplifiers in accordance with a signal outputted from the column decoder, a plurality of second data lines provided in the second direction, penetrating through the plurality of memory banks, and shared by the plurality of first data lines disposed for the plurality of memory banks, and a plurality of switching elements each having a first end connected to one of the plurality of first data lines and a second end connected to one of the plurality of second data lines, and controlled by a bank activation signal of a memory bank corresponding to the first data line connected to the first ends.
摘要:
A semiconductor memory device with a semiconductor substrate and a plurality of element regions formed in the semiconductor is shown. The semiconductor memory device further includes at least one column gate and at least one equalizer in which they are formed as a set in at least one of the element regions.
摘要:
This invention discloses the layout of word line driving circuits for driving word lines. A semiconductor memory device includes a memory cell array having a bit line, n memory cells connected to the bit line, and n word lines respectively connected to the n memory cells. The semiconductor memory device further includes n/2 first word line driving circuits for driving n/2 word lines of the n word lines, and n/2 second word line driving circuits for driving the remaining n/2 word lines of the n word lines. The second word line driving circuits are arranged at the positions where the second word line driving circuits face the first word line driving circuits via the memory cell array.
摘要翻译:本发明公开了用于驱动字线的字线驱动电路的布局。 一种半导体存储器件包括具有位线的存储单元阵列,+ E,连接到位线的uns n + EE存储器单元,以及分别连接到+ E,uns n + EE的+ E,uns n + EE字线 记忆细胞 半导体存储器件还包括用于驱动+ E,n n + EE字线的n / 2个字线的n / 2个第一字线驱动电路和用于驱动剩余n / 2个字的n / 2个第二字线驱动电路 行+ E,uns n + EE字线。 第二字线驱动电路被布置在第二字线驱动电路经由存储单元阵列面对第一字线驱动电路的位置。
摘要:
A plurality of memory cells are arranged at crosspoints between a plurality of word lines and a plurality of bit lines. The memory cells include not only normal cells but also spare cells for saving defects. The saving of the defect is effected by replacing the word line or bit line connected to the normal cell with the word line or bit line connected to the spare cell. The replacement is effected by a corresponding pair of fuse circuit and deciding circuit, that is, the fuse circuit for storing the address of a word line or bit line to be replaced and the deciding circuit for, based on the address, deciding whether or not an accessed word line or bit line be replaced. As such a pair use is made of a plurality of pairs and a plurality of kinds are provided as the word lines or bit lines for replacement and can be used in accordance with the size of defects. It is, therefore, possible to effectively save the defective word line or bit line, while avoiding any uneffective replacement.
摘要:
A semiconductor memory device according to the present invention comprises a plurality of word lines constituted by gate wirings, a memory cell array having memory cells selectively arranged at nodes between the plurality of word lines and a plurality of bit lines, the memory cell array having a plurality of subarrays which are divided in a word line arrangement direction, a main row decoder arranged at least one end of the memory cell array in the word line arrangement direction, a plurality of sub-row decoders arranged at least one end of each of the plurality of subarrays, and a first wiring layer formed on a layer above the gate wirings and extending from the sub-row decoder, and the first wiring layer is wired to a position where the subarray is divided by two in the word line arrangement direction to be brought into contact with the gate wiring.
摘要:
A semiconductor memory device includes a semiconductor substrate and a plurality of element regions formed in the semiconductor, wherein at least one column gate and at least one equalizer are formed as a set in one element region of the plurality of element regions. In one embodiment, a set of a column gate and an equalizer share a diffusion layer with an adjacent set of a column gate and an equalizer. In a second embodiment, a gate electrode of the equalizer is disposed to divide a diffusion layer into six regions. In other embodiments, the equalizer is surrounded by at least a gate electrode of a column gate. In yet other embodiments, the sets of column gates and equalizers are disposed parallel to a bit line.
摘要:
A dynamic semiconductor memory device according to the present invention comprises at least first and second memory cell arrays having a plurality of memory cells selectively arranged at respective intersections of a plurality of word lines and a plurality of bit lines, a first sense amplifier section connected at an end of the first cell array to a plurality of bit line pairs formed by part of the plurality of bit lines of the first cell array, the plurality of bit line pairs having a folded bit line configuration, a second sense amplifier section connected to sets of bit line pairs, each formed by one of the remaining bit lines of the first cell array and one of part of the plurality of bit lines of the second cell array, the plurality of bit line pairs having an open bit line configuration, and a correction circuit for correcting the level of ease for reading data "0" and that of reading data "1".
摘要:
A data writing method for a magnetoresistive effect element of an aspect of the present invention including generating a write current in which a falling period from the start of a falling edge to the end of the falling edge is longer than a rising period from the start of a rising edge to the end of the rising edge, and flowing the write current through the magnetoresistive effect element which comprises a first magnetic layer having an invariable magnetizing direction, a second magnetic layer having a variable magnetizing direction, and a tunnel barrier layer provided between the first magnetic layer and the second magnetic layer, to change the magnetizing direction of the second magnetic layer.