Lateral power semiconductor device

    公开(公告)号:US12027577B2

    公开(公告)日:2024-07-02

    申请号:US17351267

    申请日:2021-06-18

    CPC classification number: H01L29/063 H01L29/0878 H01L29/66681 H01L29/7816

    Abstract: A lateral power semiconductor device includes a first type doping substrate at a bottom of the lateral power semiconductor device, a second type doping drift region, a second type heavy doping drain, a first type doping body; a first type heavy doping body contact and a second type heavy doping source, where dielectric layers are on a right side of the second type heavy doping source; the dielectric layers are arranged at intervals in a longitudinal direction in the first type doping body, and between adjacent dielectric layers in the longitudinal direction is the first type doping body; and a polysilicon is surrounded by the dielectric layer at least on a right side. Compared with conventional trench devices, the lateral power semiconductor device introduces a lateral channel, to increase a current density, thereby realizing a smaller channel on-resistance.

    GAAS MONOLITHIC INTEGRATED TERAHERTZ LOW-NOISE COMMUNICATION SYSTEM TRANSCEIVER FRONT-END

    公开(公告)号:US20230238997A1

    公开(公告)日:2023-07-27

    申请号:US17873134

    申请日:2022-07-25

    CPC classification number: H04B1/40 H03D7/165

    Abstract: The present disclosure provides a GaAs monolithic integrated terahertz low-noise communication system transceiver front-end, including an intermediate frequency circuit and a terahertz circuit. The terahertz circuit includes a local oscillator frequency tripler, a local oscillator unidirectional 3 dB filter coupler, a radio frequency 180° filter coupler, and two terahertz GaAs monolithic integrated subharmonic mixers. The local oscillator unidirectional 3 dB filter coupler and the radio frequency 180° filter coupler each include one ring-cylindrical resonant cavity and four rectangular waveguides. The ring-cylindrical resonant cavity is divided into four rectangular waveguides which are correspondingly connected to the four sector-annular resonant cavities, respectively. The present disclosure suppresses the local oscillator noise by adopting a local oscillator unidirectional 3 dB filter coupler and a radio frequency 180° filter coupler with both coupling and filtering functions, thereby achieving a low local oscillator noise transceiver front-end.

    Power semiconductor devices with low specific on-resistance

    公开(公告)号:US11227949B2

    公开(公告)日:2022-01-18

    申请号:US16877516

    申请日:2020-05-19

    Abstract: A low specific on-resistance (Ron,sp) power semiconductor device includes a power device and a transient voltage suppressor (TVS); wherein the power device comprises a gate electrode, a drain electrode, a bulk electrode, a source electrode and a parasitic body diode, the bulk electrode and the source electrode are shorted, the TVS comprises an anode electrode and a cathode electrode, the drain electrode of the power device and the anode electrode of the TVS are connected by a first metal to form a high-voltage terminal electrode, the source electrode of the power device and the cathode electrode of the TVS are connected by a second metal to form a low-voltage terminal electrode.

    IGBT device with MOS controllable hole path

    公开(公告)号:US10923583B2

    公开(公告)日:2021-02-16

    申请号:US16601609

    申请日:2019-10-15

    Abstract: The present invention relates to the technical field of power semiconductor devices, particularly to an insulated gate bipolar transistor with a MOS controllable hole path. According to the present invention, a MOS controllable gate structure formed by a gate dielectric layer, a MOS control gate electrode and a P-type MOS channel region are embedded in a P+ floating p-body region of the conventional IGBT structure. The MOS region is equivalent to a switch controlled by a gate voltage. When the device is turned on under a forward voltage, the potential of the p-body region is floated to store holes, reducing the saturation conduction voltage drop of the device. Under the condition of turn-off and short-circuit, the hole extracting path is provided and the Miller capacitance is lowered, thereby lowering the turn-off losses and enhancing the short-circuit withstand capability.

    Bipolar-CMOS-DMOS semiconductor device and manufacturing method

    公开(公告)号:US10607987B2

    公开(公告)日:2020-03-31

    申请号:US16255851

    申请日:2019-01-24

    Abstract: A BIPOLAR-CMOS-DMOS (BCD) semiconductor device and manufacturing method, which can integrate a Junction Field-Effect Transistor (JFET), two classes of Vertical Double-diffusion Metal Oxide Semiconductor (VDMOS), a Lateral Insulated-Gate Bipolar Transistor (LIGBT) and seven kinds of Laterally Diffused Metal Oxide Semiconductor (LDMOS), a low-voltage Negative channel Metal Oxide Semiconductor (NMOS), a low-voltage Positive channel Metal Oxide Semiconductor (PMOS), a low-voltage Negative-Positive-Negative (NPN) transistor and a low-voltage Positive-Negative-Positive (PNP) transistor, and a diode in the same chip. Bipolar devices in the analog circuit, power components in the switch circuit, Complementary Metal Oxide Semiconductor (CMOS) devices in the logic circuit and other kinds of lateral and vertical components are integrated. This present invention saves costs at the same time greatly improve chip integration. The manufacturing method of the present invention is simple, and the difficulty of process is relatively less.

    Lateral high-voltage device
    7.
    发明授权

    公开(公告)号:US10068965B1

    公开(公告)日:2018-09-04

    申请号:US15718001

    申请日:2017-09-28

    Abstract: The present invention relates to a lateral high-voltage device. The device includes a dielectric trench region. A doping-overlapping structure with different doping types alternating mode is provided at least below, on a left side of, or on a right side of the dielectric trench region. The device also includes a dielectric layer, a body field plate, a polysilicon gate, a gate oxide layer, a first N-type heavy doping region, a second N-type heavy doping region, a P-type heavy doping region, a P-well region, the first N-type doping pillar, the second N-type doping pillar, the third N-type doping pillar, the first P-type doping pillar, and the second P-type doping pillar. The invention adopts a dielectric trench region in the drift region to keep the breakdown voltage BV of the device while reducing the surface area of the device, and effectively reducing the device's specific On-Resistance RON,sp.

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