NON-VOLATILE MEMORY STRUCTURE AND MANUFACTURING METHOD THEREOF
    2.
    发明申请
    NON-VOLATILE MEMORY STRUCTURE AND MANUFACTURING METHOD THEREOF 审中-公开
    非易失性存储器结构及其制造方法

    公开(公告)号:US20150008504A1

    公开(公告)日:2015-01-08

    申请号:US13935570

    申请日:2013-07-05

    Abstract: A non-volatile memory structure includes a substrate, a gate electrode formed on the substrate, conductive spacers respectively formed on two sides of the gate electrode, and an oxide-nitride-oxide (ONO) structure having an inverted T shape formed on the substrate. The gate electrode includes a gate conductive layer and a gate dielectric layer. The ONO structure includes a base portion and a body portion. The base portion of the ONO structure is sandwiched between the gate electrode and the substrate, and between the conductive spacer and the substrate. The body portion of the T-shaped ONO structure is upwardly extended from the base portion and sandwiched between the gate electrode and the conductive spacer.

    Abstract translation: 非易失性存储器结构包括:衬底,形成在衬底上的栅极电极,分别形成在栅电极的两侧上的导电衬垫和在衬底上形成有倒T形的氧化物 - 氧化物(ONO)结构 。 栅电极包括栅极导电层和栅极电介质层。 ONO结构包括基部和主体部分。 ONO结构的基部被夹在栅电极和衬底之间以及导电间隔物和衬底之间。 T形ONO结构的主体部分从基部向上延伸并夹在栅电极和导电间隔件之间。

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