利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

21 条记录 (耗时 0.035 秒)

    Fluid supports for sensors
    2.
    发明申请
    Fluid supports for sensors 审中-公开
    用于传感器的流体支架

    公开(公告)号：US20050083050A1

    公开(公告)日：2005-04-21

    申请号：US10935037

    申请日：2004-09-07

    申请人： Vladimir Tsukernik ,  Neil Goldfine ,  Andrew Washabaugh ,  Darrell Schlicker ,  Karen Walrath ,  Eric Hill ,  Vladimir Zilberstein

    发明人： Vladimir Tsukernik ,  Neil Goldfine ,  Andrew Washabaugh ,  Darrell Schlicker ,  Karen Walrath ,  Eric Hill ,  Vladimir Zilberstein

    IPC分类号： G01N27/82 ,  G01M17/02

    CPC分类号： G01N27/82

    摘要： Pressurized elastic support structures or balloons are used to press flexible sensors against the surface a material under test. Rigid support elements can also be incorporated into the inspection devices to maintain the basic shape of the inspection structure and to facilitate positioning of the sensors near the test material surface. The rigid supports can have the approximate shape of the test material surface or the pressurization of one or more balloons can be used to conform the sensor to the shape of the test material surface.

    摘要翻译： 使用加压的弹性支撑结构或气球将柔性传感器压在表面上，以测试被测材料。 也可以将刚性支撑元件结合到检查装置中，以维持检查结构的基本形状并且便于传感器在测试材料表面附近的定位。 刚性支撑件可以具有测试材料表面的近似形状，或者可以使用一个或多个气囊的加压使传感器与测试材料表面的形状相一致。

    Load lock having secondary isolation chamber
    3.
    发明授权
    Load lock having secondary isolation chamber 有权

    公开(公告)号：US08440048B2

    公开(公告)日：2013-05-14

    申请号：US12695072

    申请日：2010-01-27

    申请人： Ravinder Aggarwal ,  Jeroen Stoutjesdijk ,  Eric Hill ,  Loring G. Davis ,  John T. DiSanto

    发明人： Ravinder Aggarwal ,  Jeroen Stoutjesdijk ,  Eric Hill ,  Loring G. Davis ,  John T. DiSanto

    IPC分类号： C23F1/00 ,  H01L21/306

    CPC分类号： C30B25/025 ,  C30B23/002 ,  C30B23/02 ,  C30B25/16 ,  H01L21/67201

    摘要： A load lock includes a chamber including an upper portion, a lower portion, and a partition between the upper portion and the lower portion, the partition including an opening therethrough. The load lock further includes a first port in communication with the upper portion of the chamber and a second port in communication with the lower portion of the chamber. The load lock includes a rack disposed within the chamber and a workpiece holder mounted on a first surface of the rack, wherein the rack and the workpiece holder are movable by an indexer that is capable of selectively moving wafer slots of the rack into communication with the second port. The indexer can also move the rack into an uppermost position, at which the first surface of the boat and the partition sealingly separate the upper portion and the lower portion to define an upper chamber and a lower chamber. Auxiliary processing, such as wafer pre-cleaning, or metrology can be conducted in the upper portion.

    SYSTEMS, DEVICES, AND METHODS FOR TWO-SIDED TESTING OF ELECTRONIC DEVICES
    4.
    发明申请
    SYSTEMS, DEVICES, AND METHODS FOR TWO-SIDED TESTING OF ELECTRONIC DEVICES 审中-公开
    用于电子设备的两面测试的系统，设备和方法

    公开(公告)号：US20130015871A1

    公开(公告)日：2013-01-17

    申请号：US13542337

    申请日：2012-07-05

    申请人： Tim Cleary ,  Peter Hanaway ,  Eric Strid ,  David Leslie ,  Eric Hill ,  Ken Smith ,  K. Reed Gleason

    发明人： Tim Cleary ,  Peter Hanaway ,  Eric Strid ,  David Leslie ,  Eric Hill ,  Ken Smith ,  K. Reed Gleason

    IPC分类号： G01R31/28

    CPC分类号： G01R31/2884 ,  G01R31/2887

    摘要： Systems, devices, and methods for two-sided testing of electronic devices. These systems, devices, and methods may include the use of a test fixture that is configured to electrically connect a back side electrical pad of a device under test with an auxiliary pad that faces in a different direction than the back side electrical pad. Additionally or alternatively, these systems, devices, and methods also may include the use of a probe head that is configured to form an electrical connection with both the auxiliary pad and a front side electrical pad of the device under test. The systems, devices, and methods also may include providing a test signal to the device under test, receiving a resultant signal from the device under test, and/or analyzing the resultant signal.

    摘要翻译： 用于电子设备双面测试的系统，设备和方法。 这些系统，装置和方法可以包括使用测试夹具，其被配置为将被测器件的背面电焊盘与面向不同于背面电焊盘的方向的辅助焊盘电连接。 附加地或替代地，这些系统，装置和方法还可以包括使用探针头，其被配置成与被测设备的辅助焊盘和前侧电焊盘形成电连接。 系统，设备和方法还可以包括向被测设备提供测试信号，从被测设备接收结果信号和/或分析所得到的信号。

    Seatback Pad Holder Apparatus
    6.
    发明申请
    Seatback Pad Holder Apparatus 有权

    公开(公告)号：US20220324364A1

    公开(公告)日：2022-10-13

    申请号：US17225181

    申请日：2021-04-08

    申请人： Eric Hill

    发明人： Eric Hill

    IPC分类号： B60N3/00 ,  B60R7/04

    摘要： A seatback pad holder apparatus for storing dashboard foot pads and other items includes a rear panel having a rear top side, a rear bottom side, a rear front side, a rear back side, a rear left side, and a rear right side. A plurality of rest pads is coupled to the rear panel. Each rest pad is selectively removable and placed within the vehicle for user comfort. A front panel is coupled to the rear panel and selectively covers the rear front side. A pair of headrest mount straps is coupled to the rear panel. Each headrest mount strap is coupled to the rear top side and configured to engage a pair of posts of a headrest of the vehicle. A stability strap is coupled to the rear panel and extends from the rear left side to the rear right side to engage a seat back of the vehicle.

    GPS-locating sports ball
    7.
    发明授权
    GPS-locating sports ball 有权

    公开(公告)号：US11040254B1

    公开(公告)日：2021-06-22

    申请号：US16687764

    申请日：2019-11-19

    申请人： Eric Hill

    发明人： Eric Hill

    IPC分类号： A63B43/00

    摘要： The GPS-locating sports ball comprises a ball, a locating circuit, and software. The locating circuit may determine one or more physical parameters of the ball. As a non-limiting example, the ball may be a golf ball, a tennis ball, a baseball, a softball, or a bowling ball. The locating circuit may communicate the one or more physical parameters to the software running on a smart device. The software may be operable to assist in locating a lost ball and in monitoring improvements in athletic performance based upon an analysis of the one or more physical parameters.

    Systems and methods for mass flow controller verification
    8.
    发明授权
    Systems and methods for mass flow controller verification 有权
    质量流量控制器验证的系统和方法

    公开(公告)号：US09169975B2

    公开(公告)日：2015-10-27

    申请号：US13597043

    申请日：2012-08-28

    申请人： Michael Christopher Sarin ,  Rafael Mendez ,  Gregory M. Bartlett ,  Eric Hill ,  Keith R. Lawson ,  Andy Rosser

    发明人： Michael Christopher Sarin ,  Rafael Mendez ,  Gregory M. Bartlett ,  Eric Hill ,  Keith R. Lawson ,  Andy Rosser

    IPC分类号： G01F25/00 ,  F17D1/00

    CPC分类号： F17D1/00 ,  G01F25/00 ,  Y02E60/34 ,  Y10T137/0324 ,  Y10T137/7722

    摘要： A method and system are disclosed for verifying the flow rate of gas through a mass flow controller, such as a mass flow controller used with a tool for semiconductor or solar cell fabrication. To verify the mass flow rate measured by the mass flow controller, gas passing through the mass flow controller is also passed through a mass flow meter. The measured flow rate through the mass flow controller is compared to the measured flow rate through the mass flow meter and any difference between the two measured flow rates is determined. Depending upon the magnitude of any difference, the flow of gas to the mass flow controller may be altered.

    摘要翻译： 公开了一种用于验证气体通过质量流量控制器的流量的方法和系统，例如与用于半导体或太阳能电池制造的工具一起使用的质量流量控制器。 为了验证由质量流量控制器测量的质量流量，通过质量流量控制器的气体也通过质量流量计。 将通过质量流量控制器的测量流量与通过质量流量计的测量流量进行比较，并确定两个测量流量之间的任何差异。 根据任何差异的大小，可以改变气体流向质量流量控制器的流量。

    RISERS INCLUDING A PLURALITY OF HIGH ASPECT RATIO ELECTRICAL CONDUITS AND SYSTEMS AND METHODS OF MANUFACTURE AND USE THEROF
    9.
    发明申请
    RISERS INCLUDING A PLURALITY OF HIGH ASPECT RATIO ELECTRICAL CONDUITS AND SYSTEMS AND METHODS OF MANUFACTURE AND USE THEROF 审中-公开
    包括多个高比例电气连接和系统的升高及其制造和使用方法

    公开(公告)号：US20130069680A1

    公开(公告)日：2013-03-21

    申请号：US13610076

    申请日：2012-09-11

    申请人： Koby L. Duckworth ,  Eric Hill ,  Mike Jolley ,  Kurt Schultz ,  Jody Curtis

    发明人： Koby L. Duckworth ,  Eric Hill ,  Mike Jolley ,  Kurt Schultz ,  Jody Curtis

    IPC分类号： G01R1/073 ,  H05K3/10 ,  H05K1/11

    CPC分类号： G01R1/07378 ,  G01R3/00 ,  H05K1/11 ,  H05K3/4046 ,  H05K2201/0379 ,  H05K2201/10378

    摘要： Risers including a plurality of high aspect ratio electrical conduits, as well as systems and methods of manufacture and/or use of the risers and/or the high aspect ratio electrical conduits. The systems and methods may include incorporation of the plurality of high aspect ratio electrical conduits within a substantially planar body that may include and/or be formed from a solid dielectric material. The plurality of electrical conduits may be configured to conduct a plurality of electric currents between a first surface of the body and a second, substantially opposed, surface of the body. The surfaces may include a plurality of contact pads configured to provide a robust and/or corrosion-resistant surface and/or to improve electrical contact between the riser and another device. The risers also may include a layered structure, wherein the layers are sequentially formed to increase a thickness of the riser and/or the aspect ratio of the electrical conduits.

    摘要翻译： 包括多个高纵横比电导管的立管以及制造和/或使用立管和/或高纵横比电导管的系统和方法。 系统和方法可以包括将多个高纵横比的电导管并入可包括和/或由固体电介质材料形成的基本平坦的体内。 多个电导管可以被配置为在主体的第一表面和主体的第二，基本相对的表面之间传导多个电流。 表面可以包括多个接触垫，其被配置为提供坚固的和/或耐腐蚀的表面和/或改善上升管和另一个装置之间的电接触。 立管还可以包括层状结构，其中顺序地形成这些层以增加提升管的厚度和/或电导管的纵横比。

    PROBE HEAD ASSEMBLIES, COMPONENTS THEREOF, TEST SYSTEMS INCLUDING THE SAME, AND METHODS OF OPERATING THE SAME
    10.
    发明申请
    PROBE HEAD ASSEMBLIES, COMPONENTS THEREOF, TEST SYSTEMS INCLUDING THE SAME, AND METHODS OF OPERATING THE SAME 有权
    探头组件及其组件，包括其的测试系统及其操作方法

    公开(公告)号：US20120286817A1

    公开(公告)日：2012-11-15

    申请号：US13463712

    申请日：2012-05-03

    申请人： Koby Duckworth ,  Eric Hill

    发明人： Koby Duckworth ,  Eric Hill

    IPC分类号： G01R1/067

    CPC分类号： G01R1/0735 ,  G01R1/06711 ,  G01R1/06738 ,  G01R1/07378 ,  G01R31/2889

    摘要： Probe head assemblies, components of probe head assemblies, test systems including the probe head assemblies and/or components thereof, and methods of operating the same. The probe head assemblies are configured to convey a plurality of test signals to and/or from a device under test and include a space transformer, a contacting assembly, and a riser that spatially separates the space transformer from the contacting assembly and conveys the plurality of test signals between the space transformer and the contacting assembly. The contacting assembly may include a frame that defines an aperture and has a coefficient of thermal expansion that is within a threshold difference of that of the device under test, a flexible dielectric body that is attached to the frame, maintained in tension by the frame, and extends across the aperture, and a plurality of conductive probes. The plurality of conductive probes may include a dual-faceted probe tip.

    摘要翻译： 探针头组件，探针头组件的组件，包括探针头组件和/或其部件的测试系统及其操作方法。 探针头组件被配置为将多个测试信号传送到和/或从被测设备，并且包括空间变换器，接触组件和立管，空间变换器与接触组件空间上分离并传送多个 在空间变压器和接触组件之间测试信号。 接触组件可以包括限定孔的框架，并且具有与被测器件的阈值差的阈值差的热膨胀系数，附接到框架的柔性电介质体，由框架保持张力， 并且延伸穿过该孔，以及多个导电探针。 多个导电探针可以包括双面探针尖端。