摘要:
The present invention relates to a process for preparing a compound of formula (I): which includes cyclodehydrating a compound of formula (II): in the presence of an acid activated clay or acid activated zeolite catalyst and in the presence of a suitable solvent
摘要:
The display panel includes data driven chip and at least two scanning driven chips. The second scanning signal input terminal of each of the scanning driven chip is connected to a first scanning signal output terminal of the data driven chip by corresponding transmission circuits. At least one transmission circuit includes a serially connected resistor so that sum of impedance of the transmission circuits are equal, or the difference of the impedance of the transmission circuit is less than a predetermined value. In addition, a flat-panel display device with uniform brightness and a driving method thereof are also provided.
摘要:
A method and apparatus for sharing viewing information is disclosed. In one embodiment, the method comprises receiving an designation of a second user from the first user; and transmitting the first user viewing information to the designated second user. The shared viewing information may comprise the identity of a currently viewed media program, a list of scheduled media program viewings, or the media program itself.
摘要:
Source signals, such as audio and/or video data, are encoded into multiple, consecutive frequency bands. These bands are referred to as coding layers. Rather than performing complex bit-slice operations, a disclosed technique enables an agile and simplified response to transmission channel throughput variations. Specifically, if it becomes necessary to restrict the rate of data transmission to avoid receiver buffer underflow resulting from transmission channel degradation, layers from the transmitted signal are omitted, beginning with the highest frequency bands. Efficient and agile bit rate scalability during data streaming through wired or wireless networks and during local playback is thus enabled.
摘要:
A voltage generating circuit for generating internal voltage for a packaged integrated circuit memory device, is controllable to provide incremental adjustments in the voltage for testing of the memory device. The voltage generating circuit permits internally generated voltages of the memory device, such as the substrate voltage Vbb, the DVC2 voltage, and the pumped voltage Vccp, to be controlled externally through the application of test signals via the conventional test function, in performing standard device tests such as the static refresh test, logic 1s and 0s margin testing, and the like for packaged memory devices. Also, programmable circuits including programmable logic devices, such as anti-fuses, are provided that are programmable to maintain the voltage at a magnitude to which it is adjusted.
摘要:
A synchronous semiconductor memory device has improved layout and circuitry so as to provide rapid operation. Data paths between sub-arrays and memory cells and corresponding DQ pads are equalized to provide approximately equal line delays, transmission losses, etc. Input clock circuitry converts a “asynchronous” external clock signal and external clock enable signal to an internal “synchronous” clock signal. Input command signals are not stored in input registers, but instead are latched so as to provide such input signals rapidly downstream. Multiple redundant compare circuitry is provided to improve delays inherent in selecting between external or internal addresses. Input/output pull up circuitry is enabled during both read and write operations, but shortened during write operations. Two or more voltage pump circuits are employed that permit sharing of power therebetween to compensate for increased power demands to row lines, data output lines, etc.
摘要:
An integrated circuit memory device has a plurality of nonvolatile programmable elements which are used to store a pass/fail status bit at selected milestones in a test sequence. At selected points in the test process an element may be programmed to indicate that the device has passed the tests associated with the selected point in the process. Prior to performing further tests on the device, the element is read to verify that it passed previous tests in the test process. If the appropriate elements are not programmed, the device is rejected. A rejected device may be retested according to the previous test steps. Laser fuses, electrically programmable fuses or antifuses are used to store test results. The use of electrically writeable nonvolatile memory elements allows for programming of the elements after the device has been packaged.
摘要:
A synchronous semiconductor memory device has improved layout and circuitry so as to provide rapid operation. Data paths between sub-arrays and memory cells and corresponding DQ pads are equalized to provide approximately equal line delays, transmission losses, etc. Input clock circuitry converts a “asynchronous” external clock signal and external clock enable signal to an internal “synchronous” clock signal. Input command signals are not stored in input registers, but instead are latched so as to provide such input signals rapidly downstream. Multiple redundant compare circuitry is provided to improve delays inherent in selecting between external or internal addresses. Input/output pull up circuitry is enabled during both read and write operations, but shortened during write operations. Two or more voltage pump circuits are employed that permit sharing of power therebetween to compensate for increased power demands to row lines, data output lines, etc.
摘要:
A voltage booting circuit for booting the switching signal applied to a column access passgate is employed to reduce the voltage drop across the passgate. Reduction of the voltage dropped across the passgate results in faster read and write times and improved noise margin. In one application the booted voltage is used only during a write operation, but not during a read. In another application, the booted voltage is used during both operations.
摘要:
A memory device requires a minimum of two input/output lines from an external testing device to be coupled thereto. A first DQ line from the memory device provides a direct data path from the array so that the external tester can read data from the array at the maximum speed of the memory device. Test mode circuitry for multiplexing and comparing multiple DQ lines during address compression mode is coupled to two or more DQ lines, including the first DQ line. The compression mode testing circuitry can include on-chip comparators that compare the data simultaneously written to, and read from, the memory device. The comparison circuitry outputs a data test flag indicating whether or not the data read from the memory device matches. The test flag is output through a multiplexer to a second DQ line. As a result, the speed of the device can be tested from the first DQ line, while the results of on-chip comparison can be sampled at the second DQ line.