Process for preparing a homogeneous cellulose solution using
N-methylmorpholine-N-oxide
    1.
    发明授权
    Process for preparing a homogeneous cellulose solution using N-methylmorpholine-N-oxide 有权
    使用N-甲基吗啉-N-氧化物制备均匀的纤维素溶液的方法

    公开(公告)号:US6153003A

    公开(公告)日:2000-11-28

    申请号:US147369

    申请日:1999-02-10

    CPC分类号: D01F2/00 C08B1/003

    摘要: A simple method of preparing a homogeneous cellulose solution is disclosed, which comprises the steps of (a) preparing fibrillar cellulose powder; (b) injecting a molten liquid tertiary amine oxide solvent into a twin screw extruder; (c) feeding the cellulose powder of step (a) into a section of the twin screw extruder where the molten liquid tertiary amine oxide solvent fed in step (b) produces a well swollen paste with the cellulose powder fed in step (c); (d) dissolving the well swollen cellulose paste in the following melting sections in the twin screw extruder; and (e) stabilizing the solution obtained in step (d) in a storage tank.

    摘要翻译: PCT No.PCT / KR97 / 00104 Sec。 371日期1999年2月10日 102(e)1999年2月10日PCT 1997年6月5日PCT公布。 公开号WO97 / 47790 日本1997年12月18日公开了一种制备均匀纤维素溶液的简单方法,其包括以下步骤:(a)制备纤维素纤维素粉末; (b)将熔融液态叔胺氧化物溶剂注入双螺杆挤出机中; (c)将步骤(a)的纤维素粉末进料到双螺杆挤出机的一部分,其中在步骤(b)中进料的熔融液体叔胺氧化物溶剂在步骤(c)中进料的纤维素粉末产生良好溶胀的糊状物; (d)在双螺杆挤出机中将溶胀好的纤维素糊溶解在以下熔融部分中; 和(e)将步骤(d)中获得的溶液稳定在储罐中。

    Probe card and manufacturing method

    公开(公告)号:US09671431B2

    公开(公告)日:2017-06-06

    申请号:US14003310

    申请日:2011-04-28

    申请人: Young Geun Park

    发明人: Young Geun Park

    IPC分类号: G01R1/073 G01R3/00

    摘要: There is provided a probe card in contact with pads formed on a plurality of semiconductor dies on a wafer to test the semiconductor dies. The probe card includes a printed circuit board on which a plurality of pads are formed; a block plate having a plurality of grooves and attached to the printed circuit board; a plurality of sub-probe units equipped with a plurality of probe tips in contact with the pads of the semiconductor dies and detachably coupled to the plurality of grooves; and a plurality of interposer/space transformer units interposed between the sub-probe units and the printed circuit board and configured to electrically connect the probe tips to the pads of the printed circuit board and transform a pitch of the pads formed on the printed circuit to a pitch of the plurality of probe tips.

    Transfer device of handler for testing semiconductor device
    3.
    发明授权
    Transfer device of handler for testing semiconductor device 失效
    用于半导体器件测试的处理器的传送装置

    公开(公告)号:US07464807B2

    公开(公告)日:2008-12-16

    申请号:US11200014

    申请日:2005-08-10

    IPC分类号: G01R31/28 B65G37/00

    CPC分类号: G01R31/2893

    摘要: A transfer device of a handler for testing semiconductor devices is provided in which a pitch between each of a plurality of picker heads may be adjusted without replacing a cam plate. The transfer device may include a base part, a plurality of picker heads movably mounted on the base part, and a cam plate movably mounted on the base part and having a plurality of inclined cam grooves formed therein. Each picker head is connected to a corresponding cam groove by a connection part extending therebetween, with an end of each connection part movably coupled to its respective cam groove. A driving unit reciprocates the cam plate so that, as the ends of the connection parts move within the cam grooves, a position of the picker heads may be varied.

    摘要翻译: 提供了用于测试半导体器件的处理器的传送装置,其中可以调整多个拾取器头中的每一个之间的间距而不更换凸轮板。 传送装置可以包括基部,可移动地安装在基部上的多个拾取头,以及可移动地安装在基部上并具有形成在其中的多个倾斜凸轮槽的凸轮板。 每个拾取头通过其间延伸的连接部分连接到相应的凸轮槽,每个连接部分的端部可移动地联接到其相应的凸轮槽。 驱动单元使凸轮板往复运动,使得当连接部件的端部在凸轮槽内移动时,可以改变拾取头的位置。

    METHOD FOR FABRICATING PROBE FOR USE IN SCANNING PROBE MICROSCOPE
    4.
    发明申请
    METHOD FOR FABRICATING PROBE FOR USE IN SCANNING PROBE MICROSCOPE 有权
    用于扫描探针显微镜中使用的探针的方法

    公开(公告)号:US20080272087A1

    公开(公告)日:2008-11-06

    申请号:US11753248

    申请日:2007-05-24

    IPC分类号: B44C1/22 C25F3/02

    CPC分类号: G01Q60/38

    摘要: A method of fabricating a probe tip for use in a scanning probe microscope, includes the steps of: forming a triangular prism provided with a passivation film by patterning a {111} general silicon wafer, the passivation film being deposited on two sidewalls of the triangular prism; etching the silicon wafer to make the triangular prism into a probe tip of a triangular pyramid shape; and removing the passivation film.

    摘要翻译: 一种制造用于扫描探针显微镜的探针头的方法包括以下步骤:通过图案化{111}通常的硅晶片来形成设置有钝化膜的三角棱镜,该钝化膜沉积在三角形的两个侧壁上 棱镜 蚀刻硅晶片,使三角形棱镜成三角锥形的探针尖端; 并去除钝化膜。

    Battery module
    5.
    发明授权
    Battery module 有权
    电池模块

    公开(公告)号:US08940421B2

    公开(公告)日:2015-01-27

    申请号:US13427269

    申请日:2012-03-22

    IPC分类号: H01M2/12 H01M2/20 H01M2/10

    摘要: A battery module includes battery cells arranged side-by-side in a stacked configuration, the battery cells having positive and negative cell terminals. Buss bars are electrically connected to corresponding cell terminals to electrically connect adjacent battery cells. A battery cover coupled to the battery cells. A module controller is held by the battery cover and is electrically connected to the buss bars to monitor a voltage of the corresponding buss bar.

    摘要翻译: 电池模块包括堆叠配置并排布置的电池单元,电池单元具有正和负的单元端子。 母线电连接到相应的电池端子以电连接相邻的电池单元。 耦合到电池单元的电池盖。 模块控制器由电池盖保持并且电连接到总线条以监视相应的总线的电压。

    THREE CONNECTORS MUTUALLY CONDUCTIVE AND DETACHABLY CONNECTED TO EACH OTHER
    6.
    发明申请
    THREE CONNECTORS MUTUALLY CONDUCTIVE AND DETACHABLY CONNECTED TO EACH OTHER 有权
    三个连接器连接到每个其他连接器

    公开(公告)号:US20120083160A1

    公开(公告)日:2012-04-05

    申请号:US12962952

    申请日:2010-12-08

    IPC分类号: H01R13/46

    摘要: The present invention relates to a combination connector for a vehicle that facilitates a connector assembling process in an in-line assembly line by integrating a connector which is a coupling part for wires extending to various electrical parts. Specifically, several connectors are coupled to one connector so as to be electrically connected to it, thereby concentrating the connector assembling processes in an in-line assembly line at one place and enhancing production yield and/or production rate.

    摘要翻译: 本发明涉及一种用于车辆的组合连接器,其通过集成作为延伸到各种电气部件的电线的联接部分的连接器来促进在线组装线中的连接器组装过程。 具体地说,几个连接器被耦合到一个连接器以便与其电连接,从而将连接器组装过程集中在一个位置上的在线组装线,并且提高了产量和/或生产率。

    Handler for testing semiconductor devices
    7.
    发明申请
    Handler for testing semiconductor devices 失效
    处理器用于测试半导体器件

    公开(公告)号:US20060214655A1

    公开(公告)日:2006-09-28

    申请号:US11196266

    申请日:2005-08-04

    IPC分类号: G01R31/28

    CPC分类号: G01R31/2893 G01R31/2867

    摘要: A handler for testing semiconductor devices is disclosed which is capable of simplifying the process carried out in an exchanging station, namely, the process of loading/unloading semiconductor devices in/from test trays, and greatly increasing the number of simultaneously testable semiconductor devices. The handler includes a loading station, an unloading station, test trays, an exchanging station comprising a horizontal moving unit for horizontally moving a selected one of the test trays by a predetermined pitch at a working place, a test station in which at least one test board having a plurality of test sockets to be electrically connected with semiconductor devices is mounted, the test station performing a test while connecting the semiconductor devices in one of the test trays, which is fed from the exchanging station to the test station, to the test sockets, device transfer units for transfer the semiconductor devices between the loading station and the exchanging station and between the exchanging station and the unloading station, respectively, and a tray transfer unit for transfer the test trays between the exchanging station and the test station.

    摘要翻译: 公开了一种用于测试半导体器件的处理器,其能够简化在交换台中执行的处理,即,在测试托盘中加载/卸载半导体器件的过程,并且大大增加了同时可测试的半导体器件的数量。 处理机包括装载站,卸载站,测试盘,交换站,其包括水平移动单元,用于在工作场所水平移动所选择的一个测试托盘预定间距;测试站,其中至少一个测试 安装具有与半导体器件电连接的多个测试插座的板,测试台在将从交换台馈送到测试站的测试托盘之一连接半导体器件到测试站时进行测试 插座,用于在加载站和交换站之间以及交换站和卸载站之间分别传送半导体器件的设备传送单元和用于在更换站和测试站之间传送测试盘的托盘传送单元。

    Method for fabricating probe for use in scanning probe microscope
    8.
    发明授权
    Method for fabricating probe for use in scanning probe microscope 有权
    探针用于扫描探针显微镜的方法

    公开(公告)号:US07767101B2

    公开(公告)日:2010-08-03

    申请号:US11753248

    申请日:2007-05-24

    IPC分类号: C25F3/00

    CPC分类号: G01Q60/38

    摘要: A method of fabricating a probe tip for use in a scanning probe microscope, includes the steps of: forming a triangular prism provided with a passivation film by patterning a {111} general silicon wafer, the passivation film being deposited on two sidewalls of the triangular prism; etching the silicon wafer to make the triangular prism into a probe tip of a triangular pyramid shape; and removing the passivation film.

    摘要翻译: 一种制造用于扫描探针显微镜的探针头的方法包括以下步骤:通过图案化{111}通常的硅晶片来形成设置有钝化膜的三角棱镜,该钝化膜沉积在三角形的两个侧壁上 棱镜 蚀刻硅晶片,使三角形棱镜成三角锥形的探针尖端; 并去除钝化膜。

    Tray transferring apparatus with gripper mechanism
    9.
    发明授权
    Tray transferring apparatus with gripper mechanism 失效
    托盘机构托盘传送装置

    公开(公告)号:US07562923B2

    公开(公告)日:2009-07-21

    申请号:US10773325

    申请日:2004-02-09

    IPC分类号: B25J15/08

    摘要: A tray transferring apparatus for transferring a handling tray on which semiconductor devices are mounted prevents the semiconductor devices from being scattered or separated from the handling tray. The tray transferring apparatus includes a fixing means installed on a main frame for supporting a fixed tray, a correcting means installed on the main frame for correcting the position of the fixed tray, a gripping means installed on the main frame for gripping a handling tray, and at least one sensor for sensing gripper plates and the handling tray. A fixed tray is held by the fixing means, and right/left inclination of the fixed tray is corrected by the correcting means. An upper portion of a handling tray holding semiconductors is covered by the bottom of the fixed tray and is gripped by the gripping means.

    摘要翻译: 用于传送其上安装有半导体器件的处理盘的托盘传送装置防止半导体器件与处理盘分散或分离。 托盘传送装置包括安装在用于支撑固定托盘的主框架上的固定装置,安装在主框架上用于校正固定托盘的位置的校正装置,安装在主框架上用于夹紧处理托盘的夹持装置, 以及至少一个传感器,用于检测夹板和处理盘。 固定托盘由固定装置固定,固定托盘的右/左倾斜由校正装置校正。 保持半导体的操作盘的上部被固定托盘的底部覆盖并被夹持装置夹持。

    Handler for testing semiconductor devices
    10.
    发明授权
    Handler for testing semiconductor devices 失效
    处理器用于测试半导体器件

    公开(公告)号:US07408338B2

    公开(公告)日:2008-08-05

    申请号:US11713683

    申请日:2007-03-05

    IPC分类号: G01R31/28

    CPC分类号: G01R31/2893 G01R31/2867

    摘要: A handler for testing semiconductor devices is disclosed which is capable of simplifying the process carried out in an exchanging station, namely, the process of loading/unloading semiconductor devices in/from test trays, and greatly increasing the number of simultaneously testable semiconductor devices. The handler includes a loading station, an unloading station, test trays, an exchanging station comprising a horizontal moving unit for horizontally moving a selected one of the test trays by a predetermined pitch at a working place, a test station in which at least one test board having a plurality of test sockets to be electrically connected with semiconductor devices is mounted, the test station performing a test while connecting the semiconductor devices in one of the test trays, which is fed from the exchanging station to the test station, to the test sockets, device transfer units for transfer the semiconductor devices between the loading station and the exchanging station and between the exchanging station and the unloading station, respectively, and a tray transfer unit for transfer the test trays between the exchanging station and the test station.

    摘要翻译: 公开了一种用于测试半导体器件的处理器,其能够简化在交换台中执行的处理,即,在测试托盘中加载/卸载半导体器件的过程,并且大大增加了同时可测试的半导体器件的数量。 处理机包括装载站,卸载站,测试盘,交换站,其包括水平移动单元,用于在工作场所水平移动所选择的一个测试托盘预定间距;测试站,其中至少一个测试 安装具有与半导体器件电连接的多个测试插座的板,测试台在将从交换台馈送到测试站的测试托盘之一连接半导体器件到测试站时进行测试 插座,用于在加载站和交换站之间以及交换站和卸载站之间分别传送半导体器件的设备传送单元和用于在更换站和测试站之间传送测试盘的托盘传送单元。