摘要:
A residual gas control apparatus for internal combustion engines of the type including a main combustion chamber connected through a torch passage to an auxiliary combustion chamber having a spark plug, the residual gas control including a partial partition dividing the auxiliary combustion chamber into a first zone exposed to the spark plug and a second zone exposed to the torch passage, there being openings connecting the two zones, the partition and openings serving to control the percentages of residual gas in the two zones so as to produce optimum ignition and reduce NOx generation, and also to minimize turbulence in the vicinity of the spark plug.
摘要:
Reduction of NO.sub.x emissions from a four-cycle stratified charge internal combustion piston engine is accomplished by (a) spark ignition of a rich mixture in a first chamber containing residual exhaust gas, followed by (b) torch ignition of rich mixture in a second chamber under turbulent conditions, causing (c) torch ignition of a stratified charge in a lean mixture in the main combustion chamber. The result is a reduction in peak temperature in the combustion process, with consequent reduction in NO.sub.x emissions in the engine exhaust gases. Exhaust gas is not recirculated. Said first chamber, which contains residual gas from the previous combustion cycle, contains the spark gap between spark plug electrodes and the spark gap is located near a restricted connection between the first and second chambers and remote from a closed end of the first chamber. Means are provided for changing the volume of said first chamber while the engine is operating, in accordance with variations in load on the engine.
摘要:
A probe device including a circuit board for inspection having a great number of inspection electrodes, a probe card having a circuit board for connection having a great number of terminal electrodes and a contact member, an anisotropically conductive connector arranged between the circuit board for inspection and the circuit board for connection and electrically connecting the respective inspection electrodes to the respective terminal electrodes, and a parallelism adjusting mechanism for adjusting a parallelism of the circuit board for inspection and the circuit board for connection to the wafer. The parallelism adjusting mechanism includes a location-varying mechanism, which relatively displaces the circuit board for inspection or the circuit board for connection in the thickness-wise direction of the anisotropically conductive connector. A wafer inspection apparatus can include the probe device.
摘要:
A die for molding a disk substrate capable of forming fine recessed and projected pits and grooves up to the outer periphery of the disk substrate by preventing low heat conductive elements from peeling off and burrs from occurring on the outer periphery thereof. The die includes a first base die, a second base die disposed oppositely to the first base die, a first low heat conductive element fixed to the first base die, a stamper fixed onto the first low heat conductive element, a second low heat conductive element fixed onto the second base die, and a ring-like regulating member fitted to and in slidable contact with either of the first and second low heat conductive elements. The die is characterized in that the end part of the ring-shaped regulating member is positioned within the range of the outer peripheral side face of the low heat conductive element in slidable contact therewith.
摘要:
A probe device including a circuit board for inspection having a great number of inspection electrodes, a probe card having a circuit board for connection having a great number of terminal electrodes and a contact member, an anisotropically conductive connector arranged between the circuit board for inspection and the circuit board for connection and electrically connecting the respective inspection electrodes to the respective terminal electrodes, and a parallelism adjusting mechanism for adjusting a parallelism of the circuit board for inspection and the circuit board for connection to the wafer. The parallelism adjusting mechanism includes a location-varying mechanism, which relatively displaces the circuit board for inspection or the circuit board for connection in the thickness-wise direction of the anisotropically conductive connector. A wafer inspection apparatus can include the probe device.
摘要:
Disclosed herein are an anisotropically conductive connector, by which good conductivity is retained over a long period of time even when it is used in electrical inspection of a plurality of integrated circuits formed on a wafer repeatedly over a great number of times, and thus high durability and long service life are achieved, and applications thereof. The anisotropically conductive connector of the invention comprises elastic anisotropically conductive films, in each of which a plurality of conductive parts for connection containing conductive particles and extending in a thickness-wise direction of the film have been formed. The conductive particles contained in the conductive parts for connection in the anisotropically conductive connector are obtained by laminating surfaces of core particles exhibiting magnetism with a coating layer formed of a high-conductive metal, and the coating layer is a coating layer having a high hardness.
摘要:
An optical information recording medium is manufactured by bonding a first substrate having a first central bore and a second substrate having a second central bore to each other with radiation cure resin. The radiation cure resin is coated on the first substrate. The first and second substrates are brought into close contact with each other so as to form the first and second substrates integrally with the radiation cure resin. A neighborhood of the first and second central bores is radiated. A whole of at least one of opposite outer faces of the integral first and second substrates is irradiated with radiation so as to wholly cure the radiation cure resin.
摘要:
An optical disk is constructed such that a thin film including a reflective layer is formed on a substrate, or on a thermoplastic resin layer on the substrate. A stamper having an asperity pattern corresponding to information signals is directly pressed against the thin film to transfer the asperity pattern on the thin film. Heat-pressing the stamper against the thin film makes it possible to further accurately transfer the asperity of the stamper to the reflective layer with less pressing force, in the case where the reflective layer is formed on the thermoplastic resin layer.
摘要:
A liquid-crystal panel comprises a pair of transparent glass substrates each being provided with an electrode. Between the glass substrates are disposed spacers for defining a space and a mixture of droplets of a liquid crystal having a mean diameter of 3.0 &mgr;m or less and of a photo-curing polymer. The edge portions of the glass substrates are sealed with a seal polymer. In curing the photo-curing polymer during the process of manufacturing the liquid-crystal panel, the dose of an ultraviolet ray is set to 500 mJ/cm2 or more so as to reduce the diameters of the droplets of the liquid crystal, thereby preventing light leakage in the state without a voltage applied and improving the contrast. If the spacers are colored, the effect of preventing light leakage is increased. If the spacers are subjected to a surface treatment for rejecting the liquid crystal or composed of a polymer material of the same type as that of the photo-curing polymer, variations in diameter of the droplets of the liquid crystal can be prevented. With the structure, it becomes possible to provide a liquid-crystal panel in which light leakage in the black mode is reduced and which presents uniform and high-contrast display of images.
摘要:
A mixed material of liquid crystals and resin is dropped on at least one substrate in an amount greater than the amount needed to cover a display area for the LCD panel. The substrate is adhered to another substrate, and excess material is removed to the outside of a display area. The phase-separation of the liquid crystals and resin is carried out by irradiating light while pressure is added to at least one substrate, so that a liquid crystal display panel applied to a liquid crystal display device or a light shutter can be manufactured without applying a complex vacuum device.