Cellular/Wi-Fi combination devices
    2.
    发明申请
    Cellular/Wi-Fi combination devices 审中-公开
    蜂窝/ Wi-Fi组合设备

    公开(公告)号:US20060217102A1

    公开(公告)日:2006-09-28

    申请号:US11085977

    申请日:2005-03-22

    IPC分类号: H04B1/28

    CPC分类号: H01L27/016

    摘要: The specification describes an integrated passive device (IPD) designed to allow implementation of cellular RF and Wi-Fi RF in a single hand held device. To address the problem of RF interference a thin film RF high rejection bandpass filter is formed in an IPD implementation. The IPD implementation preferably uses silicon as the substrate material. This allows the thin film RF high rejection bandpass filter to be made using silicon processing technology, and thus produce low cost filters that still meet stringent performance requirements demanded due to the co-existing RF units. In preferred embodiments of the invention, wafer level processing using silicon substrates adds to the cost effective manufacture of the highly functional IPDs.

    摘要翻译: 该规范描述了一种集成无源设备(IPD),设计用于在单个手持设备中实现蜂窝RF和Wi-Fi RF。 为了解决RF干扰的问题,在IPD实现中形成了薄膜RF高阻抗带通滤波器。 IPD实施优选使用硅作为基底材料。 这允许使用硅处理技术制造薄膜RF高阻抗带通滤波器,并因此产生仍然满足由于共存的RF单元要求的严格性能要求的低成本滤波器。 在本发明的优选实施例中,使用硅衬底的晶片级处理增加了高性能IPD的成本有效的制造。

    Testing integrated circuits
    6.
    发明申请
    Testing integrated circuits 失效
    测试集成电路

    公开(公告)号:US20050088194A1

    公开(公告)日:2005-04-28

    申请号:US10997629

    申请日:2004-11-24

    IPC分类号: G01R1/073 G01R31/02

    CPC分类号: G01R1/0735

    摘要: The specification describes a flexible membrane test apparatus and test method for high-speed IC chips. The method and apparatus rely on locating the reference components of the test circuit very close to the contact pads of the IC chip under test. This is achieved in one embodiment by locating those components adjacent to the flexible membrane. In another embodiment, the reference components may be attached to the membrane itself, so the length of the runners connecting the contact points of the tester and the critical reference components is optimally reduced. In yet a further embodiment, the entire test circuit, in the form of an IC test chip, is located on the membrane.

    摘要翻译: 该说明书描述了用于高速IC芯片的柔性膜测试装置和测试方法。 该方法和装置依赖于将测试电路的参考部件定位得非常靠近被测IC芯片的接触焊盘。 这在一个实施例中通过将这些部件定位在与柔性膜相邻的位置来实现。 在另一个实施例中,参考部件可以附接到膜本身,因此连接测试器的接触点和关键参考部件的流道的长度被最佳地减小。 在又一个实施例中,以IC测试芯片的形式的整个测试电路位于膜上。

    High frequency integrated circuits
    7.
    发明申请
    High frequency integrated circuits 审中-公开
    高频集成电路

    公开(公告)号:US20060197182A1

    公开(公告)日:2006-09-07

    申请号:US11411307

    申请日:2006-04-26

    IPC分类号: H01L29/00

    摘要: The specification describes a silicon-on-silicon interconnection arrangement to implement high performance RF impedance matching using off-chip passive components. The RF sections of the system are dis-integrated into separate RF functional chips, and the functional chips are flip-chip mounted on a high resistivity silicon intermediate interconnect substrate (SIIS). The passive devices for the impedance matching networks are built into the high resistivity SIIS using thin-film technology.

    摘要翻译: 该规范描述了硅上硅互连装置,以使用片外无源部件实现高性能RF阻抗匹配。 系统的RF部分被分离成单独的RF功能芯片,并且将功能芯片倒装芯片安装在高电阻率硅中间互连基板(SIIS)上。 阻抗匹配网络的无源器件使用薄膜技术构建在高电阻率SIIS中。