摘要:
An electronic component analyzing apparatus is provided with a fixing part configured to hold a substrate to which an electronic component is soldered; a gripper configured to grip the electronic component; a transmission part coupled to the gripper, and configured to transmit an external force to the gripper as a force acting in a direction away from the substrate; and a support part configured to pivotally support the transmission part.
摘要:
An electronic component analyzing apparatus is provided with a fixing part configured to hold a substrate to which an electronic component is soldered; a gripper configured to grip the electronic component; a transmission part coupled to the gripper, and configured to transmit an external force to the gripper as a force acting in a direction away from the substrate; and a support part configured to pivotally support the transmission part.
摘要:
A printed circuit board provided with board electrodes, wherein each board electrode is provided with a board electrode base, for carrying by soldering a bottom electrode arranged at a bottom of an electronic device inside from outer edges of the electronic device, arranged inside from the outer edges of the electronic device and a projection projecting out from the board electrode base, narrower in width than the board electrode base, and connected to an interconnect of the printed circuit board.
摘要:
A printed circuit board provided with board electrodes, wherein each board electrode is provided with a board electrode base, for carrying by soldering a bottom electrode arranged at a bottom of an electronic device inside from outer edges of the electronic device, arranged inside from the outer edges of the electronic device and a projection projecting out from the board electrode base, narrower in width than the board electrode base, and connected to an interconnect of the printed circuit board.
摘要:
The present invention relates to an analysis apparatus 1 comprising a resistive body 2 for giving a travel resistance to a sample, and power sources 33, 54 for giving power to cause the sample to pass through the resistive body 2. The power sources 33, 54 include a pressurizing mechanism 33 arranged at an upstream side of the resistive body 2 and a pressure-reduction mechanism 54 arranged at a downstream side of the resistive body. The pressurizing mechanism 33 and the pressure-reduction mechanism 54 are each a tube pump, for example. The resistive body 2 is provided with a plurality of minute fluid channels, for example.
摘要:
The present invention relates to a method of adjusting a flow rate sensor 52 for measuring a travel time of a sample passing through a resistive body. The flow rate sensor 52 includes a straight tube 56, and plural photo sensors 52A to 52E for detecting interfaces 82A, 82B between a gas 80 and a liquid 81 traveling in the straight tube 56. Respective positions of the plural photo sensors 52A to 52E are adjusted by detecting the interfaces 82A, 82B by using such photo sensors 52A to 52E.
摘要:
The present invention relates to a method of adjusting a flow rate sensor 52 for measuring a travel time of a sample passing through a resistive body. The flow rate sensor 52 includes a straight tube 56, and plural photo sensors 52A to 52E for detecting interfaces 82A, 82B between a gas 80 and a liquid 81 traveling in the straight tube 56. Respective positions of the plural photo sensors 52A to 52E are adjusted by detecting the interfaces 82A, 82B by using such photo sensors 52A to 52E.
摘要:
The present invention relates to a flow rate sensor 52 which causes a gas 80 included in a liquid 81 to travel in a piping 56, and which measures a flow speed of a sample by detecting the gas 80. The flow rate sensor 52 is configured to maintain a contact area of the gas with respect to the piping 56 at constant or at substantially constant.
摘要:
The present invention relates to a flow rate sensor 52 which causes a gas 80 included in a liquid 81 to travel in a piping 56, and which measures a flow speed of a sample by detecting the gas 80. The flow rate sensor 52 is configured to maintain a contact area of the gas with respect to the piping 56 at constant or at substantially constant.
摘要:
A method of mounting a semiconductor chip part on a substrate, which is capable of realizing high efficiency and high reliability of the mounting works. A leading end of a conductive wire is contact-bonded onto each pad of a semiconductor chip part, followed by tearing of the wire, to form a two-step bump having an upper step portion and a lower step portion larger in volume than the upper step portion. Only the upper step portions of the bumps are then brought in press-contact with a single flattening tool member having a flat surface in such a manner that heights of all of the bumps are made nearly equal to each other. A conductive paste is stuck on the bumps, and the substrate is coated with an adhesive. Thus, the semiconductor chip part is heated and pressurized onto the substrate by a mounting tool in such a state in which the pads are aligned with the corresponding lands of the substrate, to plastically deform the whole of the upper step portions and the lower step portions of the bumps.