公开(公告)号：US20230021276A1

公开(公告)日：2023-01-19

申请号：US17940227

申请日：2022-09-08

Applicant: Lyten, Inc.

Inventor： Michael STOWELL ,  Carlos MONTALVO ,  Jacques NICOLE

IPC: G01M17/02 ,  B60C19/00 ,  B60C23/06 ,  G01B15/06 ,  G01B7/24 ,  B60C23/04

Abstract: A disclosed vehicle component may include at least one split-ring resonator, which may be embedded within a material. The split ring resonator may be formed from a three-dimensional (3D) monolithic carbonaceous growth and may detect an electromagnetic ping emitted from a user device. The split ring resonator may generate an electromagnetic return signal in response to the electromagnetic ping. The electromagnetic return signal may indicate a state of the material in a position proximate to a respective split ring resonator. In some aspects, the split-ring resonator may resonate at a first frequency in response to the electromagnetic ping when the material is in a first state, and may resonate at a second frequency in response to the electromagnetic ping when the material is in a second state. A resonant frequency of the 3D monolithic carbonaceous growth may be based on physical characteristics of the material.

公开(公告)号：US11481894B1

公开(公告)日：2022-10-25

申请号：US17584275

申请日：2022-01-25

Applicant: China University of Petroleum-Beijing

Inventor： Linlin Wang ,  Zhilei Luo ,  Kaikai Jia ,  Yanchang Deng

IPC: G06K9/00 ,  G06T7/00 ,  G06T7/70 ,  G06V10/74 ,  G06V10/75 ,  G01M11/08 ,  G01B11/16 ,  G01B15/06

Abstract: A method, apparatus and system for calculating stress parameters is provided. The method comprises establishing a first image pyramid according to an image of a sample before deformation, and establishing a second image pyramid corresponding to the first image pyramid according to an image of the sample after deformation; starting from a top level in the first image pyramid, iteratively calculating displacement information on each level in the first image pyramid relative to a corresponding level in the second image pyramid based on a center point of each sub-region at each level in the first image pyramid and other positions in the sub-region; calculating strain information on the sample according to displacement information on a bottom level of the first image pyramid; and calculating stress parameters of the sample based on the strain information.

公开(公告)号：US10801972B2

公开(公告)日：2020-10-13

申请号：US16294343

申请日：2019-03-06

Applicant: GE Sensing & Inspection Technologies GmbH

Inventor： Michael Wuestenbecker

IPC: G01K9/00 ,  G01B15/06 ,  G01N23/046 ,  G01T1/29

Abstract: Systems, methods, and devices for determining relative and absolute positions and orientations of a detector and an inspection part of a CT system. In some cases positions/orientations of the detector and the inspection part can be defined, at least in part, by tilt angles relative to reference axes and/or planes defined by various combinations of the reference axes. In some embodiments, sensors coupled to the detector and to a stage assembly having the inspection part coupled thereto can be used to determine the tilt angles of the inspection part and the detector, respectively. Data from the sensors characterizing tilt angles of the detector and the inspection part can be used to adjust projectional radiographs of the inspection part to correct for the mechanical wobble of the stage. By using tilt data to adjust projectional radiographs, the quality of tomographic images and 3-dimensional reconstructions of the inspection part can be improved.

公开(公告)号：US10739281B2

公开(公告)日：2020-08-11

申请号：US15318962

申请日：2015-06-01

Applicant: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE ,  ECOLE NORMALE SUPERIEURE DE CACHAN

Inventor： François Hild ,  Hugo Leclerc ,  Stéphane Roux

IPC: G01N23/046 ,  G01B15/06 ,  G01N3/08

Abstract: A tomography scanner includes at least one first emission source (GX1), one first matrix detector (D1), and a computer (C) arranged to produce an initial tomography of an object (E) based on radiographs arising from the first matrix detector, taken from various angles. The tomography scanner further includes a second emission source (GX2) and a second matrix detector (D2) arranged so that, when the object is subjected to a loading that is known at a given instant in time, the computer determines the changes in the object subjected to said loading based only on the information from the first radiograph of the object under loading arising from the first matrix detector, from the second radiograph of the object under loading arising from the second matrix detector and the initial tomograph, the first radiograph and the second radiograph being taken simultaneously at the same given instant in time.

公开(公告)号：US10295339B2

公开(公告)日：2019-05-21

申请号：US15215756

申请日：2016-07-21

Applicant: Hitachi High-Technologies Corporation

Inventor： Kazuhisa Hasumi ,  Masami Ikota

IPC: G06K9/00 ,  G01B15/06 ,  G01B15/04 ,  H01J37/26 ,  H01L21/66

Abstract: A pattern measurement method and measurement apparatus are provided that appropriately evaluate the deformation of a pattern occurring due to a micro loading effect. In order to achieve the above-mentioned object, there are provided pattern measurement method and apparatus that measure a dimension of a pattern formed on a sample. In the pattern measurement method and apparatus, distances between a reference pattern and a plurality of adjacent patterns adjacent to the reference pattern or inner diameters of the reference pattern in a plurality of directions are measured, and the measurement results of the plurality of distances between the reference pattern and the adjacent patterns or the measurement results of the inner diameters of the reference pattern in the plurality of directions are classified according to distances between the reference pattern and the adjacent patterns or directions of the patterns adjacent to the reference pattern.

公开(公告)号：US09826954B2

公开(公告)日：2017-11-28

申请号：US14614258

申请日：2015-02-04

Applicant: Oren E. Petel

Inventor： Oren E. Petel

IPC: A61B5/107 ,  A61B6/12 ,  A61B6/00 ,  A61B5/11 ,  A42B3/06 ,  G01B15/06 ,  G01N23/04 ,  G09B23/30

CPC classification number: A61B6/584 ,  A42B3/06 ,  A61B5/1127 ,  A61B5/1128 ,  A61B6/50 ,  A61B6/501 ,  A61B2562/164 ,  A61B2576/026 ,  G01B15/06 ,  G01N23/04 ,  G09B23/30

Abstract: A diagnostic gage (12) that can be implemented into a tissue-simulating headform (17) or other anthropomorphic surrogate test device (11) as a means of determining the internal strain within the test surrogate. One embodiment of the gage consists of a matrix or substrate embedded with x-ray contrast agents (14) and a series of holes within the substrate (15) that provide contrasting markers in an x-ray image and a means of closely coupling the gage to the test specimen. The relative motion of these contrasting markers can be monitored using x-ray fluoroscopy equipment (e.g., source (10) and detector (13)). This gage provides a means of determining the internal strain within a headform surrogate model for the purpose of evaluating the performance of helmets in terms of reducing the occurrence of concussion among other biomechanical injuries from trauma.

公开(公告)号：US09656453B2

公开(公告)日：2017-05-23

申请号：US15173718

申请日：2016-06-06

Applicant: The Boeing Company

Inventor： Gary Ernest Georgeson ,  Richard H. Bossi

IPC: B32B41/00 ,  B23P6/00 ,  G01B15/06 ,  B32B33/00 ,  B32B43/00 ,  G01B11/16 ,  G01L1/24 ,  G01L5/00 ,  B29C73/10 ,  G01M5/00 ,  G01K13/00 ,  B64F5/40 ,  B29C35/08

CPC classification number: B32B41/00 ,  B23P6/00 ,  B29C73/10 ,  B29C2035/0827 ,  B32B33/00 ,  B32B43/00 ,  B32B2307/422 ,  B32B2556/00 ,  B32B2605/18 ,  B64F5/40 ,  G01B11/16 ,  G01B15/06 ,  G01K13/00 ,  G01L1/24 ,  G01L5/00 ,  G01M5/0091 ,  Y10T428/28

Abstract: A composite structure is processed using heat and pressure. A chromatic film is placed in proximity to the composite structure and is used to monitor at least one of the temperature of the heat and the pressure during processing.

公开(公告)号：US09453727B1

公开(公告)日：2016-09-27

申请号：US14816152

申请日：2015-08-03

Applicant: Siemens Energy, Inc.

Inventor： Gerald J. Bruck ,  Ahmed Kamel ,  Dhafer Jouini ,  Daniel J. Ryan

IPC: G01F23/00 ,  G01B15/06 ,  G01N23/02

CPC classification number: G01B15/06 ,  G01B7/16 ,  G01B21/32

Abstract: A method, including: detecting in a nondestructive manner a marker (10, 12, 50, 70, 76, 78) that is fully submerged in a substrate (14) to obtain spatial information about the marker; detecting in a nondestructive manner the marker after a period of time to obtain a change in the spatial information; and using the change in the spatial information to determine a change in a dimension (30) of the substrate. The method may be used to measure creep in a gas turbine engine component.

Abstract translation: 一种方法，包括：以非破坏性方式检测完全浸没在基底（14）中以获得关于所述标记的空间信息的标记（10,12,50,70,76,78） 在一段时间后以非破坏性方式检测标记以获得空间信息的变化; 以及使用空间信息中的变化来确定衬底的尺寸（30）的变化。 该方法可用于测量燃气涡轮发动机部件中的蠕变。

公开(公告)号：US08853805B2

公开(公告)日：2014-10-07

申请号：US13169987

申请日：2011-06-27

Applicant: Jayhoon Chung ,  Catherine Beth Vartuli ,  Guoda Lian

Inventor： Jayhoon Chung ,  Catherine Beth Vartuli ,  Guoda Lian

IPC: G01L1/00 ,  G01P15/08 ,  H01L27/14 ,  H01L21/66 ,  G01B15/06 ,  G01B7/16

CPC classification number: G01B7/16 ,  G01B15/06 ,  H01L22/12 ,  H01L22/34

Abstract: A test structure for measuring strain in the channel of transistors. A method of correlating transistor performance with channel strain.

Abstract translation: 用于测量晶体管通道中的应变的测试结构。 一种使晶体管性能与通道应变相关的方法。

公开(公告)号：US08712009B2

公开(公告)日：2014-04-29

申请号：US12864406

申请日：2009-01-20

Applicant: Johannes Albertus Zandhuis

Inventor： Johannes Albertus Zandhuis

IPC: G01B15/06

CPC classification number: G01N29/223 ,  G01B15/025

Abstract: A method of determining integrity of a can seam including disposing the can seam between an X-ray source and an X-ray detector, exposing an overlap region of the can seam to radiation from the source, and determining an indication of integrity of the overlap region from a measure of variation in radiation intensity readings taken by the detector over a series of circumferential intervals of the can seam.

Abstract translation: 一种确定罐缝的完整性的方法，包括在X射线源和X射线检测器之间设置罐缝，将罐缝的重叠区域暴露于来自源的辐射，以及确定重叠的完整性的指示 区域来自于在罐缝的一系列圆周间隔上由检测器采集的辐射强度读数的变化的度量。