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1.发明授权公开(公告)号：US11635450B2
公开(公告)日：2023-04-25
申请号：US17361683
申请日：2021-06-29
申请人： Quantum Silicon Inc. , National Research Council of Canada , The University of British Columbia
发明人： Robert Wolkow , Mohammad Rashidi , Wyatt Vine , Thomas Dienel , Lucian Livadaru , Taleana Huff , Jacob Retallick , Konrad Walus , Jason Pitters , Roshan Achal
摘要： A method for the patterning and control of single electrons on a surface is provided that includes implementing scanning tunneling microscopy hydrogen lithography with a scanning probe microscope to form charge structures with one or more confined charges; performing a series of field-free atomic force microscopy measurements on the charge structures with different tip heights, where interaction between the tip and the confined charge are elucidated; and adjusting tip heights to controllably position charges within the structures to write a given charge state. The present disclose also provides a Gibb's distribution machine formed with the method for the patterning and control of single electrons on a surface. A multi bit true random number generator and neural network learning hardware formed with the above described method are also provided.
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公开(公告)号：US20190219608A1
公开(公告)日：2019-07-18
申请号：US16302153
申请日：2017-05-18
发明人： Alexander Mihaylovich ALEKSEEV , Aleksey Dmitrievich VOLKOV , Dmitry Yurjevich SOKOLOV , Anton Evgenievich EFIMOV
CPC分类号： G01Q10/04 , G01Q30/025 , G01Q30/10 , G01Q30/20
摘要： The invention relates to the field of probe measurements of objects after micro- and nano-sectioning. The essence of the invention consists in that in a scanning probe nanotomograph having an optical analysis module and comprising a base, on which a piezo-scanner unit, a probe unit and a punching unit are mounted, a sixth actuator is introduced, which is installed on said base, on which an optical analysis module is fastened, which comprises a lens and an analyser, optically connected to each other; moreover, the sixth actuator facilitates displacement of the optical analysis module along the third axis Z. The invention aims at expanding functional capabilities by means of using the optical analysis module. The technical result of the invention consists in enabling the optical observation and study of objects while same are being sectioned, which expands the functional capabilities of the apparatus.
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公开(公告)号：US09476816B2
公开(公告)日：2016-10-25
申请号：US14358065
申请日：2012-11-14
申请人： Hysitron, Inc.
发明人： Roger William Schmitz , Yunje Oh
CPC分类号： G01N3/40 , G01N3/42 , G01N2203/0226 , G01N2203/0282 , G01Q30/02 , G01Q30/10 , G01Q60/366 , H05B3/03
摘要： A heating assembly configured for use in mechanical testing at a scale of microns or less. The heating assembly includes a probe tip assembly configured for coupling with a transducer of the mechanical testing system. The probe tip assembly includes a probe tip heater system having a heating element, a probe tip coupled with the probe tip heater system, and a heater socket assembly. The heater socket assembly, in one example, includes a yoke and a heater interface that form a socket within the heater socket assembly. The probe tip heater system, coupled with the probe tip, is slidably received and clamped within the socket.
摘要翻译： 一种加热组件，其配置用于以微米或更小的尺度进行机械测试。 加热组件包括构造成与机械测试系统的换能器耦合的探针末端组件。 探针头组件包括具有加热元件的探针尖端加热器系统，与探针末端加热器系统耦合的探针末端和加热器插座组件。 在一个示例中，加热器插座组件包括在加热器插座组件内形成插座的磁轭和加热器接口。 与探针头相连的探头尖端加热器系统可滑动地接收并夹紧在插座内。
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4.发明授权公开(公告)号：US09097632B2
公开(公告)日：2015-08-04
申请号：US13778720
申请日：2013-02-27
发明人： Reinhard Lihl , Rainer Wogritsch , Heinz Plank
IPC分类号： F25D25/00 , F25B19/00 , F25D23/00 , F24F3/16 , G01N1/42 , B29C45/00 , G01Q30/10 , G02B7/00 , G21K7/00 , B29K83/00
CPC分类号： G01N1/42 , B29C45/0053 , B29C2045/0075 , B29K2083/005 , G01Q30/10 , G02B7/007 , G21K7/00
摘要： In a device (1) for rapid pressure-freezing an aqueous sample (3), such as a biological specimen, a pressurized cooling medium can be fed into a high-pressure chamber (11) into which a sample holder (30) containing a sample (3) is inserted and which is sealed with a pressure-tight seal, to the location of the sample holder (30) held therein. The high-pressure chamber (11) comprises a viewing window structure (2) with a pressure-tight window (20), through which light can be directed from the outside onto the sample (3) located in the sample holder (30). The window (20) can comprise a transparent window element made of a high-pressure-resistant material, wherein the window element (20) is held by a pressure- and temperature-resistant window bearing provided in the high-pressure chamber.
摘要翻译： 在用于快速冷冻含水样品（3）（例如生物样品）的装置（1）中，加压冷却介质可以被供给到高压室（11）中，其中含有 将样品（3）插入并且用耐压密封件密封到保持在其中的样品保持器（30）的位置。 高压室（11）包括具有耐压窗（20）的观察窗结构（2），光可从外部引导到位于样品架（30）中的样品（3）上。 窗口（20）可以包括由耐高压材料制成的透明窗口元件，其中窗口元件（20）由设置在高压室中的耐压耐温窗口轴承保持。
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公开(公告)号：US20150074859A1
公开(公告)日：2015-03-12
申请号：US14520021
申请日：2014-10-21
申请人： Bruker Nano, Inc.
发明人： Anthonius G. Ruiter , Henry Mittel
IPC分类号： G01Q30/10
摘要： A scanning probe microscope, such as an atomic force microscope, and method including z-stage and a bridge structure. A scanner containing a probe is mounted to the z-stage, which is movable in the z-axis to raise and lower the probe. The method reduces thermal drift of the z-stage and the bridge using a combination of heating elements thermally coupled to the z-stage and the bridge, ambient temperature sensors, and a controller to actively control the heating elements to maintain the bridge and the z-stage at an elevated temperature. Ideally, the temperatures in the system are selected so as to reduce drift between the probe and the sample during AFM scanning, wherein the drift is preferably maintained at less than about 1 nm for an ambient temperature change of about 1° C.
摘要翻译： 扫描探针显微镜，例如原子力显微镜，以及包括z级和桥结构的方法。 包含探头的扫描器安装在z阶段，z阶可在z轴上移动以升高和降低探针。 该方法通过热耦合到z级和桥接器，环境温度传感器和控制器的加热元件的组合来减少z级和桥的热漂移，以主动地控制加热元件以维持桥和z 在高温下。 理想地，选择系统中的温度，以便减少在AFM扫描期间探针和样品之间的漂移，其中漂移优选保持在小于约1nm，环境温度变化约为1℃。
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公开(公告)号：US20050190439A1
公开(公告)日：2005-09-01
申请号：US11118320
申请日：2005-05-02
IPC分类号： G01N25/16 , G01N21/41 , G01N21/59 , G01N37/00 , G01Q30/10 , G02B6/12 , G02B6/13 , G02B21/00 , G02B21/02 , G01B9/00 , G02B21/06
CPC分类号： G02B21/0008 , G02B6/13 , G02B21/02 , G02B2006/12102
摘要： A small and portable microscope for ultramicroanalysis having an excellent spatial resolution and a fixed position analyzing ability in which at least a part of an excitation light source (3), a part of a probe light source (4) and a part of a thermal lens microscope optical system are arranged integrally in a device body comprising an analyzing cell (1) and substrates (2A), (2B) supporting the analyzing cell (1).
摘要翻译： 一种用于超微量分析的小型便携式显微镜，具有优异的空间分辨率和固定位置分析能力，其中至少一部分激发光源（3），探针光源（4）的一部分和热透镜的一部分 显微镜光学系统整体地布置在包括分析单元（1）和支撑分析单元（1）的基板（2A），（2B））的设备主体中。
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公开(公告)号：US20050189490A1
公开(公告)日：2005-09-01
申请号：US11054504
申请日：2005-02-09
申请人： Kazunori Ando , Amiko Nihei
发明人： Kazunori Ando , Amiko Nihei
摘要： The present invention provides a scanning probe microscopy which can measure and keep the shape of a sample surface and the physical properties of the sample at high resolution even when an evaporable component is evaporated from a substance to be heated when the sample is heated, and can measure variations in physical properties at every heated temperature without causing thermal history on the sample. The scanning probe microscopy includes a cantilever having a probe at the distal end thereof; a heating unit for heating the sample; a sample moving unit for moving the sample; and a shielding unit for shielding between the cantilever and the sample, and when heating the sample, the shielding unit is interposed between the cantilever and the sample, and when measuring the sample, the shielding unit is not interposed between the cantilever and the sample.
摘要翻译： 本发明提供一种扫描探针显微镜，其可以在样品被加热时从被加热物质蒸发出可蒸发成分时，以高分辨率测量和保持样品表面的形状和样品的物理性能，并且可以 在每个加热温度下测量物理性能的变化，而不会对样品造成热历史。 扫描探针显微镜包括在其远端具有探针的悬臂; 用于加热样品的加热单元; 用于移动样品的样品移动单元; 以及用于屏蔽悬臂与样品之间的屏蔽单元，当加热样品时，屏蔽单元介于悬臂与样品之间，测量样品时，屏蔽单元不会夹在悬臂与样品之间。
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8.发明授权Non-contact passive temperature measuring system and method of operation using micro-mechanical sensors 失效非接触式无源温度测量系统及使用微机械传感器的操作方法
公开(公告)号：US6050722A
公开(公告)日：2000-04-18
申请号：US47358
申请日：1998-03-25
IPC分类号： G01J5/20 , G01J5/40 , G01J5/44 , G01J5/60 , G01Q20/04 , G01Q30/04 , G01Q30/10 , G01J5/00 , G01B5/00 , G01N29/12
摘要： A non-contact infrared thermometer measures target temperatures remotely without requiring the ratio of the target size to the target distance to the thermometer. A collection means collects and focusses target IR radiation on an IR detector. The detector measures thermal energy of the target over a spectrum using micromechanical sensors. A processor means calculates the collected thermal energy in at least two different spectral regions using a first algorithm in program form and further calculates the ratio of the thermal energy in the at least two different spectral regions to obtain the target temperature independent of the target size, distance to the target and emissivity using a second algorithm in program form.
摘要翻译： 非接触式红外线温度计远程测量目标温度，而不需要目标尺寸与目标温度计距离的比例。 收集装置收集并集中在IR检测器上的目标IR辐射。 检测器使用微机械传感器测量目标在光谱上的热能。 处理器装置使用程序形式的第一算法在至少两个不同的光谱区域中计算所收集的热能，并且进一步计算至少两个不同光谱区域中的热能的比率以获得独立于目标大小的目标温度， 使用程序形式的第二个算法与目标的距离和发射率。
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公开(公告)号：US5585722A
公开(公告)日：1996-12-17
申请号：US317737
申请日：1994-10-04
CPC分类号： G01Q60/30 , B82Y35/00 , G01Q60/04 , G01Q60/08 , G01Q60/14 , G01R33/56 , Y10S977/838 , Y10S977/849 , Y10S977/863 , Y10S977/865 , Y10S977/96
摘要： An apparatus for measuring physical properties of micro area which has an object to measure physical properties from a micro area on an atomic scale on the surface of a test sample such as electron spin, nuclear magnetic moment, and nuclear quadrupole moment in high sensitivity, allows the probe 2 of the atomic force microscope to approach the surface of the test sample 1, applies a magnetic field to the test sample 1 by the magnetic field generation coil 27 and the magnetic paths 22 to 26 and furthermore a high frequency electromagnetic field to the test sample 1 by the coils 16 and 17 respectively, and detects a signal from atoms existing on the surface of the test sample 1 which are resonant with the high frequency electromagnetic field by the probe 2.
摘要翻译： 用于测量微区物理性质的装置，其具有以高灵敏度测量诸如电子自旋，核磁矩和核四极矩的测试样品表面上的原子尺度上的微区域的物理特性，允许 原子力显微镜的探针2接近测试样品1的表面，通过磁场产生线圈27和磁路22至26向测试样品1施加磁场，此外还将高频电磁场施加到 分别由线圈16和17测试样品1，并且通过探针2检测来自存在于测试样品1的表面上的原子与高频电磁场共振的信号。
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公开(公告)号：US5537372A
公开(公告)日：1996-07-16
申请号：US158043
申请日：1993-11-24
申请人： Thomas R. Albrecht , Harry J. Mamin , Daniel Rugar
发明人： Thomas R. Albrecht , Harry J. Mamin , Daniel Rugar
CPC分类号： B82Y10/00 , G11B11/007 , G11B11/18 , G11B9/14 , G11B9/1409 , G11B2005/0021 , Y10S977/947
摘要： A high density data storage system includes a rotatable storage medium mounted to rotate about a drive axis, the storage medium having formed thereon a surface topography defining machine readable information. The storage system further includes a high resolution contact sensor having a cantilever arm and a stylus mounted at one end of the cantilever arm. The stylus is positionable to engage the storage medium and follow the surface topography when the storage medium is rotated. A detector system provides an output signal representing cantilever deflection caused by changes in the surface topography of the storage medium.
摘要翻译： 高密度数据存储系统包括安装成围绕驱动轴线旋转的可旋转存储介质，其上形成有定义机器可读信息的表面形貌的存储介质。 存储系统还包括高分辨率接触传感器，其具有悬臂和安装在悬臂的一端的触笔。 当存储介质旋转时，触针可定位成接合存储介质并遵循表面形貌。 检测器系统提供表示由存储介质的表面形貌的变化引起的悬臂偏转的输出信号。
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