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    Ear thermometer and measuring apparatus used with it
    42.
    发明公开
    Ear thermometer and measuring apparatus used with it 有权
    耳温度计和用来测量装置

    公开(公告)号：EP2520915A3

    公开(公告)日：2013-01-23

    申请号：EP12178552.1

    申请日：2008-06-12

    Applicant: Bio Echo Net Inc

    Inventor： Tanaka, Hideaki

    IPC: G01J5/02 ,  G01J5/04 ,  G01J5/08 ,  H05K1/18 ,  G01J5/14 ,  G01J5/00

    CPC classification number: G01J5/04 ,  G01J3/0202 ,  G01J3/0243 ,  G01J5/0011 ,  G01J5/02 ,  G01J5/0205 ,  G01J5/025 ,  G01J5/028 ,  G01J5/048 ,  G01J5/049 ,  G01J5/08 ,  G01J5/085 ,  G01J5/14 ,  G01J2005/068 ,  H05K1/189 ,  H05K2201/09063 ,  H05K2201/10151 ,  H05K2201/10606

    Abstract: A measuring apparatus for an ear thermometer comprising: a common voltage line; a built-in battery serving as a power source; a connector to receive a connector of the probe, having a common voltage terminal connected to the common voltage line; a flash-type microcontroller to control a temperature sensor of the probe, receive a resistance value output signal corresponding to a measured temperature from the temperature sensor, convert the signal into a digital temperature value, and output the digital temperature value, the microcontroller having a test port, a program write port, and a common voltage port connected to the common voltage line, establishing a flash mode when a HIGH voltage higher than a first predetermined voltage is applied to the test port, to enable a program to be written through the write port, and establishing a run mode when a LOW voltage lower than the first predetermined voltage is applied to the test port; a voltage regulator having an input side connected to the common voltage line, to provide a constant reference voltage; and a mode switching circuit connected to the common voltage line, to apply the HIGH voltage to the test port of the microcontroller when a common voltage is higher than a second predetermined voltage, apply the LOW voltage to the test port of the microcontroller when the common voltage is lower than the second predetermined voltage, and bypass a leakage current passing from the common voltage line to the mode switching circuit toward an output of the voltage regulator so as to combine them together, the connector having the common voltage terminal, a battery power source terminal connected to the built-in battery, a program write terminal connected to the write port of the microcontroller, and a sensor connection terminal to receive the resistance value output signal corresponding to a measured temperature from the temperature sensor of the probe.

    Terahertz wave detection device, terahertz wavelength filter, imaging device, and measurement device
    43.
    发明公开
    Terahertz wave detection device, terahertz wavelength filter, imaging device, and measurement device 审中-公开
    太赫兹波检测设备太赫兹波滤波器，成像装置和测量装置

    公开(公告)号：EP2503310A3

    公开(公告)日：2012-10-31

    申请号：EP12160578.6

    申请日：2012-03-21

    Applicant: Seiko Epson Corporation

    Inventor： Tomioka, Hiroto

    IPC: G01J3/42 ,  G01J5/04 ,  G01J5/08 ,  G01J3/02 ,  H01P1/20

    CPC classification number: G01J5/085 ,  G01J3/0243 ,  G01J3/42 ,  G01J5/046 ,  G01J5/0831 ,  G01J5/0862 ,  H01P1/2005

    Abstract: A terahertz wave detection device includes a wavelength filter transmitting terahertz waves having a predetermined wavelength, and a detection portion detecting the terahertz waves having the predetermined wavelength that have passed through the wavelength filter by converting the terahertz waves into heat, wherein the wavelength filter includes a metal layer having a plurality of holes communicating with an incident surface onto which the terahertz waves are incident and an emission surface from which the terahertz waves having the predetermined wavelength are emitted, and a dielectric portion filling in the plurality of holes and made of a dielectric, wherein the plurality of holes are formed with a predetermined pitch along a direction that is perpendicular to a normal line of the incident surface.

    METHOD FOR MANUFACTURING SPECTROMETER
    46.
    发明公开
    METHOD FOR MANUFACTURING SPECTROMETER 审中-公开
    VERFAHREN ZUR HERSTELLUNG EINES SPEKTROMETERS

    公开(公告)号：EP2287579A1

    公开(公告)日：2011-02-23

    申请号：EP09746534.8

    申请日：2009-05-08

    Applicant: Hamamatsu Photonics K.K.

    Inventor： SHIBAYAMA Katsumi

    IPC: G01J3/18 ,  G02B7/00

    CPC classification number: G02B5/1861 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/024 ,  G01J3/0243 ,  G01J3/0259 ,  G01J3/0291 ,  G01J3/18 ,  Y10T29/4998

    Abstract: First, a box 5 molded from a resin is prepared such as to have a rectangular parallelepiped outer form with a pair of grooves on the bottom face and a semispherical recess 9. Subsequently, a photocurable resin agent 27 is applied to a bottom area 12 of the recess 10 in the box 5. Then, while a light transmitting mold 28 having a bottom face formed with a plurality of grating grooves arranged in a row along a predetermined direction is pressed against the applied resin agent 27, the resin agent 27 is cured by irradiation with light, so as to provide the area 12 in the recess 10 with the grating 29 formed with a plurality of grating grooves. Next, Al, Au, or the like is vapor-deposited so as to cover the grating 29, thereby forming a reflecting film 15. Then, a photodetector 4 is accommodated in a package 2. This can easily manufacture a highly reliable spectrometer.

    Abstract translation: 首先，制备由树脂模制的盒5，以使其具有在底面上具有一对凹槽的长方体外形和半球形凹部9.随后，将光固化树脂剂27施加到 然后，将具有沿预定方向排列成一排的多个格栅槽的底面的透光模具28按压在所施加的树脂剂27上的同时，将树脂剂27固化 通过用光照射，以使凹部10中的区域12具有形成有多个光栅槽的光栅29。 接下来，将Al，Au等蒸镀以覆盖光栅29，从而形成反射膜15.然后，光检测器4容纳在封装2中。这可以容易地制造高可靠性的光谱仪。

    SPECTROSCOPIC MODULE
    47.
    发明公开
    SPECTROSCOPIC MODULE 审中-公开
    光谱模块

    公开(公告)号：EP2154498A1

    公开(公告)日：2010-02-17

    申请号：EP08765174.1

    申请日：2008-06-05

    Applicant: Hamamatsu Photonics K.K.

    Inventor： SHIBAYAMA, Katsumi ,  YOKINO, Takafumi ,  SUZUKI, Tomofumi ,  TEICHMANN, Helmut ,  HILLER, Dietmar ,  STARKER, Ulrich

    IPC: G01J3/02

    CPC classification number: G01J3/04 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0243 ,  G01J3/0259 ,  G01J3/0262 ,  G01J3/0291 ,  G01J3/18 ,  G01J3/2803

    Abstract: In the spectroscopy module 1, a light absorbing layer 6 having a light-passing hole 6a through which light L1 advancing into a spectroscopic portion 3 passes and a light-passing hole 6b through which light L2 advancing into a light detecting portion 4a of a light detecting element 4 passes is integrally formed by patterning. Therefore, it is possible to prevent deviation of the relative positional relationship between the light-passing hole 6a and the light-passing hole 6b. Further, since the occurrence of stray light is suppressed by the light absorbing layer 6 and the stray light is absorbed, the light detecting portion 4a of the light detecting element 4 can be suppressed from being made incident. Therefore, according to the spectroscopy module 1, it is possible to improve the reliability.

    Abstract translation: 在光谱学模块1中，光吸收层6具有光进入分光部分3的光L1通过的光通过孔6a和光进入光的光检测部分4a的光通过孔6b 检测元件4通过通过构图一体地形成。 因此，可以防止光通过孔6a和光通过孔6b之间的相对位置关系的偏差。 此外，由于杂光的发生被光吸收层6抑制，并且杂散光被吸收，因此可以抑制光检测元件4的光检测部分4a入射。 因此，根据分光模块1，可以提高可靠性。

    Farblängsfehler verringerndes Optiksystem, insbesondere für Mikroskop
    50.
    发明公开
    Farblängsfehler verringerndes Optiksystem, insbesondere für Mikroskop 有权
    纵向色差-缩小光学系统，特别适用于显微镜

    公开(公告)号：EP1653268A3

    公开(公告)日：2006-10-18

    申请号：EP05019365.5

    申请日：2005-09-06

    Applicant: CARL ZEISS JENA GmbH

    Inventor： Winterot, Johannes

    IPC: G02B21/06

    CPC classification number: G02B17/0884 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0243 ,  G02B17/08 ,  G02B17/0852 ,  G02B17/0856 ,  G02B21/002 ,  G02B21/082 ,  G02B27/30

    Abstract: Es wird bereitgestellt ein Optiksystem, insbesondere Mikroskop, mit einer Optikeinheit (17) und einem Kollimator (1), der in einem Strahlengang des Optiksystems der Optikeinheit (17) vor- oder nachgeordnet ist, wobei die Optikeinheit (17) einem dem Strahlengang zugeführten Strahlenbündel einen vorbestimmten Farblängsfehler einprägt und das Strahlenbündel auf den Kollimator (1) als divergierendes oder paralleles Strahlenbündel trifft und von diesem in ein paralleles oder konvergierendes Strahlenbündel umgewandelt wird, wobei der Kollimator (1) zumindest eine Linse (L) sowie einen gekrümmten Spiegel (4) aufweist, der den Strahlengang so faltet, daß das zugeführte Strahlenbündel die Linse (4) zweimal durchläuft.

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