Clock Alignment Scheme for Data Macros of DDR PHY

    公开(公告)号:US20180006656A1

    公开(公告)日:2018-01-04

    申请号:US15707205

    申请日:2017-09-18

    申请人: Invecas, Inc.

    摘要: A master-slave delay locked loop system comprises a master delay locked loop (“MDLL”) for generating at least one bias voltage and at least one slave delay locked loop (“SDLL”). The at least one SDLL is coupled to the MDLL, where the at least one SDLL comprises an analog to digital converter for converting the at least one bias voltage to at least one digital signal, an adder/subtractor block for adjusting the at least one digital signal based on at least one control signal, a digital to analog converter for converting the at least one adjusted digital signal to at least one analog signal, a voltage to current converter for converting the at least one analog signal to at least one bias current, delay elements for generating phase delayed signals based on the at least one bias current, and a phase detector and control logic for determining any phase difference between the phase delayed signals and for generating the at least one control signal to align the phase delayed signals.

    TCAM field enable logic
    4.
    发明授权

    公开(公告)号:US09613700B1

    公开(公告)日:2017-04-04

    申请号:US15183591

    申请日:2016-06-15

    申请人: Invecas, Inc.

    摘要: A content addressable memory (“CAM”) field enabling logic comprises fields and field enable logics. The fields each have local match lines and a corresponding field enable control for enabling the respective field. The field enable logics are serially connected. Each of the fields is coupled to a corresponding one of the field enable logics via the respective local match lines. The corresponding field enable control for each of the fields is coupled to the corresponding one of the field enable logic and to any ones of the field enable logics that come after the corresponding one of the field enable logic along the serially-connected field enable logics.

    Sense amplifier having a timing circuit for a presearch and a main search
    5.
    发明授权
    Sense amplifier having a timing circuit for a presearch and a main search 有权
    具有用于预搜索和主搜索的定时电路的感测放大器

    公开(公告)号:US09564183B2

    公开(公告)日:2017-02-07

    申请号:US14934050

    申请日:2015-11-05

    申请人: Invecas, Inc.

    IPC分类号: G11C15/04 G11C7/06 G11C7/08

    CPC分类号: G11C7/067 G11C7/08 G11C15/04

    摘要: A line sense amplifier comprises: a presearch block, a main search block, and a timing circuit. The presearch block is coupled to a presearch line for sensing the presearch line. The main search block is coupled to a main line for sensing the main line. The timing circuit operates the presearch block and the main search block for charging and sensing of the presearch line and the main line. The timing circuit initiates the main search block to determine a match condition for the main line based on whether a match condition is determined for the presearch line.

    摘要翻译: 线检测放大器包括:预搜索块,主搜索块和定时电路。 预调查块与预检线相连接,用于感应预调线。 主搜索块耦合到用于感测主线的主线。 定时电路操作预搜索块和主搜索块,用于对预调线和主线进行充电和感测。 定时电路基于是否为预调查线确定匹配条件,启动主搜索块以确定主线的匹配条件。

    Memory Built-In Self Test System
    6.
    发明申请
    Memory Built-In Self Test System 有权
    内存自检系统

    公开(公告)号:US20160224450A1

    公开(公告)日:2016-08-04

    申请号:US15012707

    申请日:2016-02-01

    申请人: Invecas, Inc.

    IPC分类号: G06F11/27

    摘要: A memory built-in self test (“BIST”) system comprises: a controller; a single port memory engine coupled to one or more single port memories; and a non-single port memory engine coupled to one or more non-single port memories. The controller receives operation codes (“op-codes”) for testing a plurality of memory types. An output of the controller is coupled to inputs of the single port memory engine and the non-single port memory engine. The controller generates test instructions based on the received op-codes. The single port memory engine and the non-single port memory engine interpret the test instructions to test the one or more single port memories and the one or more non-single port memories.

    摘要翻译: 内存自检(“BIST”)系统包括:控制器; 耦合到一个或多个单个端口存储器的单个端口存储器引擎; 以及耦合到一个或多个非单一端口存储器的非单端口存储器引擎。 控制器接收用于测试多种存储器类型的操作代码(“操作代码”)。 控制器的输出耦合到单端口存储器引擎和非单端口存储器引擎的输入。 控制器根据接收的操作码产生测试指令。 单端口存储器引擎和非单端口存储器引擎解释测试指令以测试一个或多个单端口存储器和一个或多个非单端口存储器。

    PWM demodulation
    7.
    发明授权

    公开(公告)号:US10484218B2

    公开(公告)日:2019-11-19

    申请号:US15904139

    申请日:2018-02-23

    申请人: Invecas, Inc.

    摘要: A receiver for demodulating a pulse width modulated (“PWM”) signal, comprises: a voltage level shifter for shifting the PWM signal to predefined transistor voltage levels; a half-rate PWM decoder for receiving the shifted PWM signal; and a 2-bit-to-N-bit deserializer. The half-rate PWM decoder comprises a first decoder core, a second decoder core, a controller, and a sampler and retiming circuit. The first decoder core and the second decoder core are configured to decode alternating periods of the shifted PWM signal. The controller is coupled to the first decoder core, the second decoder core, the sampler and retiming circuit. The retiming circuit is configured to receive clock signals from the controller and to output half-rate even data from the first decoder core and half-rate odd data from the second decoder core. Outputs of the retiming circuit and an output of the controller are coupled to inputs of the deserializer.

    Digital Voltmeter
    9.
    发明申请
    Digital Voltmeter 审中-公开

    公开(公告)号:US20190072589A1

    公开(公告)日:2019-03-07

    申请号:US15698289

    申请日:2017-09-07

    申请人: Invecas, Inc.

    摘要: A digital voltmeter, where a number of clock pulses for a first ramp voltage to reach an input voltage is determined. Next, a number of clock pulses for a second ramp voltage to reach the input voltage is determined. One of the first and the second ramp voltages having a least number of clock pulses to reach the input voltage is determined. A determination is made for a number of clock pulses for the determined one of the first and the second ramp voltages to reach a reference voltage. A digital code is generated for the input voltage based on the determined number of clock pulses for reaching the reference voltage and the determined least number of clock pulses for reaching the input voltage.